JPS59201296A - Ecc付メモリの誤り訂正チエツク方式 - Google Patents
Ecc付メモリの誤り訂正チエツク方式Info
- Publication number
- JPS59201296A JPS59201296A JP58075277A JP7527783A JPS59201296A JP S59201296 A JPS59201296 A JP S59201296A JP 58075277 A JP58075277 A JP 58075277A JP 7527783 A JP7527783 A JP 7527783A JP S59201296 A JPS59201296 A JP S59201296A
- Authority
- JP
- Japan
- Prior art keywords
- data
- error
- memory
- ecc
- check
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Classifications
-
- G—PHYSICS
- G06—COMPUTING OR CALCULATING; COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F11/00—Error detection; Error correction; Monitoring
- G06F11/07—Responding to the occurrence of a fault, e.g. fault tolerance
- G06F11/08—Error detection or correction by redundancy in data representation, e.g. by using checking codes
- G06F11/10—Adding special bits or symbols to the coded information, e.g. parity check, casting out 9's or 11's
- G06F11/1076—Parity data used in redundant arrays of independent storages, e.g. in RAID systems
-
- G—PHYSICS
- G06—COMPUTING OR CALCULATING; COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F11/00—Error detection; Error correction; Monitoring
- G06F11/07—Responding to the occurrence of a fault, e.g. fault tolerance
- G06F11/08—Error detection or correction by redundancy in data representation, e.g. by using checking codes
- G06F11/10—Adding special bits or symbols to the coded information, e.g. parity check, casting out 9's or 11's
- G06F11/1008—Adding special bits or symbols to the coded information, e.g. parity check, casting out 9's or 11's in individual solid state devices
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
- G11C29/04—Detection or location of defective memory elements, e.g. cell constructio details, timing of test signals
Landscapes
- Engineering & Computer Science (AREA)
- Theoretical Computer Science (AREA)
- Quality & Reliability (AREA)
- Physics & Mathematics (AREA)
- General Engineering & Computer Science (AREA)
- General Physics & Mathematics (AREA)
- Tests Of Electronic Circuits (AREA)
- Techniques For Improving Reliability Of Storages (AREA)
- For Increasing The Reliability Of Semiconductor Memories (AREA)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP58075277A JPS59201296A (ja) | 1983-04-28 | 1983-04-28 | Ecc付メモリの誤り訂正チエツク方式 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP58075277A JPS59201296A (ja) | 1983-04-28 | 1983-04-28 | Ecc付メモリの誤り訂正チエツク方式 |
Publications (2)
Publication Number | Publication Date |
---|---|
JPS59201296A true JPS59201296A (ja) | 1984-11-14 |
JPS6240742B2 JPS6240742B2 (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html) | 1987-08-29 |
Family
ID=13571570
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP58075277A Granted JPS59201296A (ja) | 1983-04-28 | 1983-04-28 | Ecc付メモリの誤り訂正チエツク方式 |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS59201296A (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html) |
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS61139857A (ja) * | 1984-12-12 | 1986-06-27 | Fujitsu Ltd | メモリ回路の検査方式 |
JP2010003348A (ja) * | 2008-06-19 | 2010-01-07 | Toshiba Corp | 半導体記憶装置及び誤り訂正方法 |
Citations (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5427342A (en) * | 1977-08-02 | 1979-03-01 | Nippon Telegr & Teleph Corp <Ntt> | Mic-formed bridge t-type constant resistance circuit |
JPS5690500A (en) * | 1979-12-25 | 1981-07-22 | Toshiba Corp | Semiconductor memory device |
JPS57208699A (en) * | 1981-06-19 | 1982-12-21 | Fujitsu Ltd | Storage device |
-
1983
- 1983-04-28 JP JP58075277A patent/JPS59201296A/ja active Granted
Patent Citations (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5427342A (en) * | 1977-08-02 | 1979-03-01 | Nippon Telegr & Teleph Corp <Ntt> | Mic-formed bridge t-type constant resistance circuit |
JPS5690500A (en) * | 1979-12-25 | 1981-07-22 | Toshiba Corp | Semiconductor memory device |
JPS57208699A (en) * | 1981-06-19 | 1982-12-21 | Fujitsu Ltd | Storage device |
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS61139857A (ja) * | 1984-12-12 | 1986-06-27 | Fujitsu Ltd | メモリ回路の検査方式 |
JP2010003348A (ja) * | 2008-06-19 | 2010-01-07 | Toshiba Corp | 半導体記憶装置及び誤り訂正方法 |
Also Published As
Publication number | Publication date |
---|---|
JPS6240742B2 (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html) | 1987-08-29 |