JPS5917257A - 固定シユ−ト装置 - Google Patents

固定シユ−ト装置

Info

Publication number
JPS5917257A
JPS5917257A JP57126115A JP12611582A JPS5917257A JP S5917257 A JPS5917257 A JP S5917257A JP 57126115 A JP57126115 A JP 57126115A JP 12611582 A JP12611582 A JP 12611582A JP S5917257 A JPS5917257 A JP S5917257A
Authority
JP
Japan
Prior art keywords
chute
semiconductor devices
semiconductor device
air cylinder
row
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP57126115A
Other languages
English (en)
Japanese (ja)
Other versions
JPS6229902B2 (enrdf_load_stackoverflow
Inventor
Shigeki Takeo
竹尾　重樹
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Toshiba Corp
Original Assignee
Toshiba Corp
Tokyo Shibaura Electric Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Toshiba Corp, Tokyo Shibaura Electric Co Ltd filed Critical Toshiba Corp
Priority to JP57126115A priority Critical patent/JPS5917257A/ja
Publication of JPS5917257A publication Critical patent/JPS5917257A/ja
Publication of JPS6229902B2 publication Critical patent/JPS6229902B2/ja
Granted legal-status Critical Current

Links

Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L22/00—Testing or measuring during manufacture or treatment; Reliability measurements, i.e. testing of parts without further processing to modify the parts as such; Structural arrangements therefor

Landscapes

  • Engineering & Computer Science (AREA)
  • Manufacturing & Machinery (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Power Engineering (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)
  • Chutes (AREA)
JP57126115A 1982-07-20 1982-07-20 固定シユ−ト装置 Granted JPS5917257A (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP57126115A JPS5917257A (ja) 1982-07-20 1982-07-20 固定シユ−ト装置

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP57126115A JPS5917257A (ja) 1982-07-20 1982-07-20 固定シユ−ト装置

Publications (2)

Publication Number Publication Date
JPS5917257A true JPS5917257A (ja) 1984-01-28
JPS6229902B2 JPS6229902B2 (enrdf_load_stackoverflow) 1987-06-29

Family

ID=14927002

Family Applications (1)

Application Number Title Priority Date Filing Date
JP57126115A Granted JPS5917257A (ja) 1982-07-20 1982-07-20 固定シユ−ト装置

Country Status (1)

Country Link
JP (1) JPS5917257A (enrdf_load_stackoverflow)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS619898U (ja) * 1984-06-25 1986-01-21 富士通株式会社 半導体装置の傾斜落下式自動送り装置

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS619898U (ja) * 1984-06-25 1986-01-21 富士通株式会社 半導体装置の傾斜落下式自動送り装置

Also Published As

Publication number Publication date
JPS6229902B2 (enrdf_load_stackoverflow) 1987-06-29

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