JPS5917154A - 超音波法による欠陥の検出方法 - Google Patents

超音波法による欠陥の検出方法

Info

Publication number
JPS5917154A
JPS5917154A JP57127184A JP12718482A JPS5917154A JP S5917154 A JPS5917154 A JP S5917154A JP 57127184 A JP57127184 A JP 57127184A JP 12718482 A JP12718482 A JP 12718482A JP S5917154 A JPS5917154 A JP S5917154A
Authority
JP
Japan
Prior art keywords
flaw detection
defect
probe
channel
pattern
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP57127184A
Other languages
English (en)
Japanese (ja)
Other versions
JPH0245823B2 (enrdf_load_stackoverflow
Inventor
Akio Suzuki
紀生 鈴木
Hiroshi Kajikawa
梶川　弘
Tadashi Nishihara
西原　忠
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Kobe Steel Ltd
Original Assignee
Kobe Steel Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Kobe Steel Ltd filed Critical Kobe Steel Ltd
Priority to JP57127184A priority Critical patent/JPS5917154A/ja
Priority to US06/514,864 priority patent/US4524622A/en
Priority to DE8383304211T priority patent/DE3373709D1/de
Priority to EP83304211A priority patent/EP0102176B1/en
Publication of JPS5917154A publication Critical patent/JPS5917154A/ja
Publication of JPH0245823B2 publication Critical patent/JPH0245823B2/ja
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N29/00—Investigating or analysing materials by the use of ultrasonic, sonic or infrasonic waves; Visualisation of the interior of objects by transmitting ultrasonic or sonic waves through the object
    • G01N29/04—Analysing solids
    • G01N29/06—Visualisation of the interior, e.g. acoustic microscopy
    • G01N29/0609—Display arrangements, e.g. colour displays
    • G01N29/0618—Display arrangements, e.g. colour displays synchronised with scanning, e.g. in real-time
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N29/00—Investigating or analysing materials by the use of ultrasonic, sonic or infrasonic waves; Visualisation of the interior of objects by transmitting ultrasonic or sonic waves through the object
    • G01N29/04—Analysing solids
    • G01N29/11—Analysing solids by measuring attenuation of acoustic waves
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N29/00—Investigating or analysing materials by the use of ultrasonic, sonic or infrasonic waves; Visualisation of the interior of objects by transmitting ultrasonic or sonic waves through the object
    • G01N29/22—Details, e.g. general constructional or apparatus details
    • G01N29/225—Supports, positioning or alignment in moving situation
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N29/00—Investigating or analysing materials by the use of ultrasonic, sonic or infrasonic waves; Visualisation of the interior of objects by transmitting ultrasonic or sonic waves through the object
    • G01N29/22—Details, e.g. general constructional or apparatus details
    • G01N29/26—Arrangements for orientation or scanning by relative movement of the head and the sensor
    • G01N29/265—Arrangements for orientation or scanning by relative movement of the head and the sensor by moving the sensor relative to a stationary material
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N29/00—Investigating or analysing materials by the use of ultrasonic, sonic or infrasonic waves; Visualisation of the interior of objects by transmitting ultrasonic or sonic waves through the object
    • G01N29/36—Detecting the response signal, e.g. electronic circuits specially adapted therefor
    • G01N29/38—Detecting the response signal, e.g. electronic circuits specially adapted therefor by time filtering, e.g. using time gates
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N29/00—Investigating or analysing materials by the use of ultrasonic, sonic or infrasonic waves; Visualisation of the interior of objects by transmitting ultrasonic or sonic waves through the object
    • G01N29/44—Processing the detected response signal, e.g. electronic circuits specially adapted therefor
    • G01N29/4445—Classification of defects
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2291/00—Indexing codes associated with group G01N29/00
    • G01N2291/04—Wave modes and trajectories
    • G01N2291/044—Internal reflections (echoes), e.g. on walls or defects

Landscapes

  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Acoustics & Sound (AREA)
  • Engineering & Computer Science (AREA)
  • Signal Processing (AREA)
  • Investigating Or Analyzing Materials By The Use Of Ultrasonic Waves (AREA)
JP57127184A 1982-07-20 1982-07-20 超音波法による欠陥の検出方法 Granted JPS5917154A (ja)

Priority Applications (4)

Application Number Priority Date Filing Date Title
JP57127184A JPS5917154A (ja) 1982-07-20 1982-07-20 超音波法による欠陥の検出方法
US06/514,864 US4524622A (en) 1982-07-20 1983-07-18 Method and apparatus of ultrasonic flaw detection
DE8383304211T DE3373709D1 (en) 1982-07-20 1983-07-20 Method and apparatus for ultrasonic flaw detection
EP83304211A EP0102176B1 (en) 1982-07-20 1983-07-20 Method and apparatus for ultrasonic flaw detection

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP57127184A JPS5917154A (ja) 1982-07-20 1982-07-20 超音波法による欠陥の検出方法

Publications (2)

Publication Number Publication Date
JPS5917154A true JPS5917154A (ja) 1984-01-28
JPH0245823B2 JPH0245823B2 (enrdf_load_stackoverflow) 1990-10-11

Family

ID=14953752

Family Applications (1)

Application Number Title Priority Date Filing Date
JP57127184A Granted JPS5917154A (ja) 1982-07-20 1982-07-20 超音波法による欠陥の検出方法

Country Status (1)

Country Link
JP (1) JPS5917154A (enrdf_load_stackoverflow)

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS61137060A (ja) * 1984-12-10 1986-06-24 Mitsubishi Heavy Ind Ltd タ−ビン部品の劣化検出方法
US7906021B2 (en) 2007-06-21 2011-03-15 Bunri Incorporation Contaminated fluid recovery apparatus
US8038895B2 (en) 2006-06-22 2011-10-18 Siltronic Ag Method and appartus for detection of mechanical defects in an ingot piece composed of semiconductor material
WO2018088288A1 (ja) * 2016-11-08 2018-05-17 株式会社日立製作所 超音波計測装置および方法

Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP4167841B2 (ja) * 2002-03-22 2008-10-22 恭二 本間 ニューラルネットワークを利用した知能化超音波探傷システム
DE102006032431B4 (de) * 2006-06-22 2011-12-01 Siltronic Ag Verfahren und Vorrichtung zur Detektion von mechanischen Defekten in einem aus Halbleitermaterial bestehenden Stabstück
JP5738034B2 (ja) * 2011-03-28 2015-06-17 三菱重工業株式会社 超音波探傷装置

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5058783U (enrdf_load_stackoverflow) * 1973-01-29 1975-05-31
JPS5190986U (enrdf_load_stackoverflow) * 1975-01-20 1976-07-21

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5058783U (enrdf_load_stackoverflow) * 1973-01-29 1975-05-31
JPS5190986U (enrdf_load_stackoverflow) * 1975-01-20 1976-07-21

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS61137060A (ja) * 1984-12-10 1986-06-24 Mitsubishi Heavy Ind Ltd タ−ビン部品の劣化検出方法
US8038895B2 (en) 2006-06-22 2011-10-18 Siltronic Ag Method and appartus for detection of mechanical defects in an ingot piece composed of semiconductor material
US7906021B2 (en) 2007-06-21 2011-03-15 Bunri Incorporation Contaminated fluid recovery apparatus
WO2018088288A1 (ja) * 2016-11-08 2018-05-17 株式会社日立製作所 超音波計測装置および方法

Also Published As

Publication number Publication date
JPH0245823B2 (enrdf_load_stackoverflow) 1990-10-11

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