JPH0245823B2 - - Google Patents

Info

Publication number
JPH0245823B2
JPH0245823B2 JP57127184A JP12718482A JPH0245823B2 JP H0245823 B2 JPH0245823 B2 JP H0245823B2 JP 57127184 A JP57127184 A JP 57127184A JP 12718482 A JP12718482 A JP 12718482A JP H0245823 B2 JPH0245823 B2 JP H0245823B2
Authority
JP
Japan
Prior art keywords
defect
flaw detection
probe
ultrasonic
channel
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
JP57127184A
Other languages
English (en)
Japanese (ja)
Other versions
JPS5917154A (ja
Inventor
Akio Suzuki
Hiroshi Kajikawa
Tadashi Nishihara
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Kobe Steel Ltd
Original Assignee
Kobe Steel Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Kobe Steel Ltd filed Critical Kobe Steel Ltd
Priority to JP57127184A priority Critical patent/JPS5917154A/ja
Priority to US06/514,864 priority patent/US4524622A/en
Priority to DE8383304211T priority patent/DE3373709D1/de
Priority to EP83304211A priority patent/EP0102176B1/en
Publication of JPS5917154A publication Critical patent/JPS5917154A/ja
Publication of JPH0245823B2 publication Critical patent/JPH0245823B2/ja
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N29/00—Investigating or analysing materials by the use of ultrasonic, sonic or infrasonic waves; Visualisation of the interior of objects by transmitting ultrasonic or sonic waves through the object
    • G01N29/04—Analysing solids
    • G01N29/06—Visualisation of the interior, e.g. acoustic microscopy
    • G01N29/0609—Display arrangements, e.g. colour displays
    • G01N29/0618—Display arrangements, e.g. colour displays synchronised with scanning, e.g. in real-time
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N29/00—Investigating or analysing materials by the use of ultrasonic, sonic or infrasonic waves; Visualisation of the interior of objects by transmitting ultrasonic or sonic waves through the object
    • G01N29/04—Analysing solids
    • G01N29/11—Analysing solids by measuring attenuation of acoustic waves
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N29/00—Investigating or analysing materials by the use of ultrasonic, sonic or infrasonic waves; Visualisation of the interior of objects by transmitting ultrasonic or sonic waves through the object
    • G01N29/22—Details, e.g. general constructional or apparatus details
    • G01N29/225—Supports, positioning or alignment in moving situation
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N29/00—Investigating or analysing materials by the use of ultrasonic, sonic or infrasonic waves; Visualisation of the interior of objects by transmitting ultrasonic or sonic waves through the object
    • G01N29/22—Details, e.g. general constructional or apparatus details
    • G01N29/26—Arrangements for orientation or scanning by relative movement of the head and the sensor
    • G01N29/265—Arrangements for orientation or scanning by relative movement of the head and the sensor by moving the sensor relative to a stationary material
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N29/00—Investigating or analysing materials by the use of ultrasonic, sonic or infrasonic waves; Visualisation of the interior of objects by transmitting ultrasonic or sonic waves through the object
    • G01N29/36—Detecting the response signal, e.g. electronic circuits specially adapted therefor
    • G01N29/38—Detecting the response signal, e.g. electronic circuits specially adapted therefor by time filtering, e.g. using time gates
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N29/00—Investigating or analysing materials by the use of ultrasonic, sonic or infrasonic waves; Visualisation of the interior of objects by transmitting ultrasonic or sonic waves through the object
    • G01N29/44—Processing the detected response signal, e.g. electronic circuits specially adapted therefor
    • G01N29/4445—Classification of defects
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2291/00—Indexing codes associated with group G01N29/00
    • G01N2291/04—Wave modes and trajectories
    • G01N2291/044—Internal reflections (echoes), e.g. on walls or defects

Landscapes

  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Acoustics & Sound (AREA)
  • Engineering & Computer Science (AREA)
  • Signal Processing (AREA)
  • Investigating Or Analyzing Materials By The Use Of Ultrasonic Waves (AREA)
JP57127184A 1982-07-20 1982-07-20 超音波法による欠陥の検出方法 Granted JPS5917154A (ja)

Priority Applications (4)

Application Number Priority Date Filing Date Title
JP57127184A JPS5917154A (ja) 1982-07-20 1982-07-20 超音波法による欠陥の検出方法
US06/514,864 US4524622A (en) 1982-07-20 1983-07-18 Method and apparatus of ultrasonic flaw detection
DE8383304211T DE3373709D1 (en) 1982-07-20 1983-07-20 Method and apparatus for ultrasonic flaw detection
EP83304211A EP0102176B1 (en) 1982-07-20 1983-07-20 Method and apparatus for ultrasonic flaw detection

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP57127184A JPS5917154A (ja) 1982-07-20 1982-07-20 超音波法による欠陥の検出方法

Publications (2)

Publication Number Publication Date
JPS5917154A JPS5917154A (ja) 1984-01-28
JPH0245823B2 true JPH0245823B2 (enrdf_load_stackoverflow) 1990-10-11

Family

ID=14953752

Family Applications (1)

Application Number Title Priority Date Filing Date
JP57127184A Granted JPS5917154A (ja) 1982-07-20 1982-07-20 超音波法による欠陥の検出方法

Country Status (1)

Country Link
JP (1) JPS5917154A (enrdf_load_stackoverflow)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2003279550A (ja) * 2002-03-22 2003-10-02 Kyoji Honma ニューラルネットワークを利用した知能化超音波探傷システム
JP2010175560A (ja) * 2006-06-22 2010-08-12 Siltronic Ag 半導体材料から成るインゴットブロックの機械的欠陥を検出する方法および装置
JP2012202963A (ja) * 2011-03-28 2012-10-22 Mitsubishi Heavy Ind Ltd 超音波探傷装置

Families Citing this family (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0711509B2 (ja) * 1984-12-10 1995-02-08 三菱重工業株式会社 タービン部品の劣化検出装置
SG138524A1 (en) 2006-06-22 2008-01-28 Siltronic Ag Method and apparatus for detection of mechanical defects in an ingot piece composed of semiconductor material
JP5153223B2 (ja) 2007-06-21 2013-02-27 株式会社ブンリ ダーティー液処理装置
JP2020024090A (ja) * 2016-11-08 2020-02-13 株式会社日立製作所 超音波計測装置および方法

Family Cites Families (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
FR2298921A5 (fr) * 1973-01-29 1976-08-20 Commissariat Energie Atomique Procede de controle par ultrasons des soudures en forte epaisseur et dispositifs de mise en oeuvr
JPS5339594Y2 (enrdf_load_stackoverflow) * 1975-01-20 1978-09-26

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2003279550A (ja) * 2002-03-22 2003-10-02 Kyoji Honma ニューラルネットワークを利用した知能化超音波探傷システム
JP2010175560A (ja) * 2006-06-22 2010-08-12 Siltronic Ag 半導体材料から成るインゴットブロックの機械的欠陥を検出する方法および装置
JP2012202963A (ja) * 2011-03-28 2012-10-22 Mitsubishi Heavy Ind Ltd 超音波探傷装置

Also Published As

Publication number Publication date
JPS5917154A (ja) 1984-01-28

Similar Documents

Publication Publication Date Title
US4524622A (en) Method and apparatus of ultrasonic flaw detection
CN100507550C (zh) 用超声波探伤机翼的方法
KR102786046B1 (ko) 초음파 탐상 방법, 초음파 탐상 장치, 강재의 제조 설비 열, 강재의 제조 방법, 및 강재의 품질 보증 방법
US5804730A (en) Ultrasonic testing method
JP7450098B2 (ja) 超音波検査方法および超音波検査装置
JPH0245823B2 (enrdf_load_stackoverflow)
CN113557429B (zh) 超声波探伤方法、超声波探伤装置、钢材的制造设备、钢材的制造方法及钢材的品质管理方法
GB2280507A (en) SCAN - Method and apparatus for ultrasonic testing of tubular products.
CN107782789A (zh) 一种用于管道腐蚀检测的声定位c扫成像装置及方法
JP2019109107A (ja) 超音波探傷方法、超音波探傷装置、鋼材の製造設備列、鋼材の製造方法、及び鋼材の品質保証方法
JP2015094588A (ja) 被測定物素材の超音波探傷検査方法
JPH0394154A (ja) 超音波探傷方法およびその装置
JP4738243B2 (ja) 超音波探傷システム
US10739312B2 (en) Ultrasonic inspection apparatus for a spherical body
JPH0419558A (ja) 超音波探傷試験における画像処理方法
JPH09229909A (ja) 移動被検体の検査方法および検査装置
JPH01158348A (ja) 超音波探傷装置
SU1293630A1 (ru) Способ ультразвукового контрол изделий
JP2002122573A (ja) 丸材の欠陥検査方法および装置
JPH05203630A (ja) 角鋼用超音波探傷方法
JPH02154144A (ja) 超音波探傷画像処理装置
JPH09229910A (ja) 超音波斜角探傷方法
JPH0354456A (ja) 凹凸表面を持つ物体の内部欠陥測定方式
JPH02102450A (ja) 圧力容器等の探傷方法
JPS61134663A (ja) 超音波探傷装置