JPS59145546A - 半導体装置の検査装置 - Google Patents

半導体装置の検査装置

Info

Publication number
JPS59145546A
JPS59145546A JP58020048A JP2004883A JPS59145546A JP S59145546 A JPS59145546 A JP S59145546A JP 58020048 A JP58020048 A JP 58020048A JP 2004883 A JP2004883 A JP 2004883A JP S59145546 A JPS59145546 A JP S59145546A
Authority
JP
Japan
Prior art keywords
socket
semiconductor device
pin
inspection
package structure
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP58020048A
Other languages
English (en)
Japanese (ja)
Other versions
JPH0226387B2 (enrdf_load_html_response
Inventor
Katsuhiko Tsuura
克彦 津浦
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Panasonic Holdings Corp
Original Assignee
Matsushita Electronics Corp
Matsushita Electric Industrial Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Matsushita Electronics Corp, Matsushita Electric Industrial Co Ltd filed Critical Matsushita Electronics Corp
Priority to JP58020048A priority Critical patent/JPS59145546A/ja
Publication of JPS59145546A publication Critical patent/JPS59145546A/ja
Publication of JPH0226387B2 publication Critical patent/JPH0226387B2/ja
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/04—Housings; Supporting members; Arrangements of terminals
    • G01R1/0408—Test fixtures or contact fields; Connectors or connecting adaptors; Test clips; Test sockets
    • G01R1/0433—Sockets for IC's or transistors

Landscapes

  • Engineering & Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)
  • Measuring Leads Or Probes (AREA)
JP58020048A 1983-02-09 1983-02-09 半導体装置の検査装置 Granted JPS59145546A (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP58020048A JPS59145546A (ja) 1983-02-09 1983-02-09 半導体装置の検査装置

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP58020048A JPS59145546A (ja) 1983-02-09 1983-02-09 半導体装置の検査装置

Publications (2)

Publication Number Publication Date
JPS59145546A true JPS59145546A (ja) 1984-08-21
JPH0226387B2 JPH0226387B2 (enrdf_load_html_response) 1990-06-08

Family

ID=12016172

Family Applications (1)

Application Number Title Priority Date Filing Date
JP58020048A Granted JPS59145546A (ja) 1983-02-09 1983-02-09 半導体装置の検査装置

Country Status (1)

Country Link
JP (1) JPS59145546A (enrdf_load_html_response)

Also Published As

Publication number Publication date
JPH0226387B2 (enrdf_load_html_response) 1990-06-08

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