JPS59132376A - パターン読出し試験装置 - Google Patents

パターン読出し試験装置

Info

Publication number
JPS59132376A
JPS59132376A JP58005361A JP536183A JPS59132376A JP S59132376 A JPS59132376 A JP S59132376A JP 58005361 A JP58005361 A JP 58005361A JP 536183 A JP536183 A JP 536183A JP S59132376 A JPS59132376 A JP S59132376A
Authority
JP
Japan
Prior art keywords
address
test
memory
order information
pattern
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP58005361A
Other languages
English (en)
Japanese (ja)
Other versions
JPH0575985B2 (enrdf_load_stackoverflow
Inventor
Shuji Kikuchi
修司 菊地
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Hitachi Ltd
Original Assignee
Hitachi Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hitachi Ltd filed Critical Hitachi Ltd
Priority to JP58005361A priority Critical patent/JPS59132376A/ja
Publication of JPS59132376A publication Critical patent/JPS59132376A/ja
Publication of JPH0575985B2 publication Critical patent/JPH0575985B2/ja
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00—Error detection; Error correction; Monitoring
    • G06F11/22—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing
    • G06F11/26—Functional testing
    • G06F11/263—Generation of test inputs, e.g. test vectors, patterns or sequences ; with adaptation of the tested hardware for testability with external testers

Landscapes

  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Theoretical Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Quality & Reliability (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Tests Of Electronic Circuits (AREA)
JP58005361A 1983-01-18 1983-01-18 パターン読出し試験装置 Granted JPS59132376A (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP58005361A JPS59132376A (ja) 1983-01-18 1983-01-18 パターン読出し試験装置

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP58005361A JPS59132376A (ja) 1983-01-18 1983-01-18 パターン読出し試験装置

Publications (2)

Publication Number Publication Date
JPS59132376A true JPS59132376A (ja) 1984-07-30
JPH0575985B2 JPH0575985B2 (enrdf_load_stackoverflow) 1993-10-21

Family

ID=11609030

Family Applications (1)

Application Number Title Priority Date Filing Date
JP58005361A Granted JPS59132376A (ja) 1983-01-18 1983-01-18 パターン読出し試験装置

Country Status (1)

Country Link
JP (1) JPS59132376A (enrdf_load_stackoverflow)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS61274280A (ja) * 1985-05-30 1986-12-04 Hitachi Electronics Eng Co Ltd パタ−ン発生装置
JPH0599985A (ja) * 1991-10-08 1993-04-23 Mitsubishi Electric Corp 半導体試験装置のテストパターン発生装置

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5552967A (en) * 1978-10-13 1980-04-17 Advantest Corp Pattern signal generator

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5552967A (en) * 1978-10-13 1980-04-17 Advantest Corp Pattern signal generator

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS61274280A (ja) * 1985-05-30 1986-12-04 Hitachi Electronics Eng Co Ltd パタ−ン発生装置
JPH0599985A (ja) * 1991-10-08 1993-04-23 Mitsubishi Electric Corp 半導体試験装置のテストパターン発生装置

Also Published As

Publication number Publication date
JPH0575985B2 (enrdf_load_stackoverflow) 1993-10-21

Similar Documents

Publication Publication Date Title
JPS5914840B2 (ja) 半導体メモリ試験用パタ−ン発生装置
JPS5943786B2 (ja) 記憶装置のアクセス方式
US4759021A (en) Test pattern generator
JPS59132376A (ja) パターン読出し試験装置
US6996755B2 (en) Squence control circuit
EP0142562B1 (en) Pipeline system for microprogram control unit
JPS61201172A (ja) メモリ読出制御装置
JP2961754B2 (ja) 情報処理装置の並列処理装置
KR100249217B1 (ko) 메모리 병렬 제어장치
JPS592584Y2 (ja) マイクロプログラム拡張テスト装置
JPS63301338A (ja) 制御メモリ付記憶装置
JPH0477825A (ja) 制御装置
JPH10116263A (ja) マイクロコンピュータとそのデータ読み出し試験方法
JPS62293452A (ja) メモリｉｃ診断回路
JPH0762698B2 (ja) パタ−ン発生器
JPS62259145A (ja) アルゴリズミツク・パタ−ン発生装置
JPH04251331A (ja) 情報処理装置
JPH04109500A (ja) 半導体集積回路のメモリ試験回路
JPH0862303A (ja) 高速パターン発生器
JPH06138180A (ja) 論理回路ユニット試験機
JPH07280893A (ja) 半導体メモリ試験装置
JPH05209938A (ja) 半導体試験装置のパターン発生器
JPH05264673A (ja) 半導体集積回路装置における内蔵ｒａｍの試験方法
JPS6140574A (ja) 試験条件設定装置
JP2003177936A (ja) ディジタル・インタフェース試験装置