JPS59114868A - 半導体装置の製造方法 - Google Patents
半導体装置の製造方法Info
- Publication number
- JPS59114868A JPS59114868A JP57224160A JP22416082A JPS59114868A JP S59114868 A JPS59114868 A JP S59114868A JP 57224160 A JP57224160 A JP 57224160A JP 22416082 A JP22416082 A JP 22416082A JP S59114868 A JPS59114868 A JP S59114868A
- Authority
- JP
- Japan
- Prior art keywords
- impurity
- alloy film
- film
- semiconductor device
- doping
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Classifications
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
- H10D84/00—Integrated devices formed in or on semiconductor substrates that comprise only semiconducting layers, e.g. on Si wafers or on GaAs-on-Si wafers
- H10D84/01—Manufacture or treatment
- H10D84/0123—Integrating together multiple components covered by H10D12/00 or H10D30/00, e.g. integrating multiple IGBTs
- H10D84/0126—Integrating together multiple components covered by H10D12/00 or H10D30/00, e.g. integrating multiple IGBTs the components including insulated gates, e.g. IGFETs
- H10D84/0165—Integrating together multiple components covered by H10D12/00 or H10D30/00, e.g. integrating multiple IGBTs the components including insulated gates, e.g. IGFETs the components including complementary IGFETs, e.g. CMOS devices
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
- H10D84/00—Integrated devices formed in or on semiconductor substrates that comprise only semiconducting layers, e.g. on Si wafers or on GaAs-on-Si wafers
- H10D84/01—Manufacture or treatment
- H10D84/02—Manufacture or treatment characterised by using material-based technologies
- H10D84/03—Manufacture or treatment characterised by using material-based technologies using Group IV technology, e.g. silicon technology or silicon-carbide [SiC] technology
- H10D84/038—Manufacture or treatment characterised by using material-based technologies using Group IV technology, e.g. silicon technology or silicon-carbide [SiC] technology using silicon technology, e.g. SiGe
Landscapes
- Electrodes Of Semiconductors (AREA)
- Metal-Oxide And Bipolar Metal-Oxide Semiconductor Integrated Circuits (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP57224160A JPS59114868A (ja) | 1982-12-21 | 1982-12-21 | 半導体装置の製造方法 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP57224160A JPS59114868A (ja) | 1982-12-21 | 1982-12-21 | 半導体装置の製造方法 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS59114868A true JPS59114868A (ja) | 1984-07-03 |
| JPH053146B2 JPH053146B2 (enExample) | 1993-01-14 |
Family
ID=16809466
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP57224160A Granted JPS59114868A (ja) | 1982-12-21 | 1982-12-21 | 半導体装置の製造方法 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS59114868A (enExample) |
Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH0442930A (ja) * | 1990-06-06 | 1992-02-13 | Matsushita Electric Ind Co Ltd | 半導体装置の製造方法 |
| WO2002073700A1 (fr) * | 2001-03-02 | 2002-09-19 | National Institute For Materials Science | Grille et structure cmos et structure mos |
| US7098120B2 (en) | 2003-10-30 | 2006-08-29 | Kabushiki Kaisha Toshiba | Method of manufacturing semiconductor devices |
-
1982
- 1982-12-21 JP JP57224160A patent/JPS59114868A/ja active Granted
Cited By (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH0442930A (ja) * | 1990-06-06 | 1992-02-13 | Matsushita Electric Ind Co Ltd | 半導体装置の製造方法 |
| WO2002073700A1 (fr) * | 2001-03-02 | 2002-09-19 | National Institute For Materials Science | Grille et structure cmos et structure mos |
| US7091569B2 (en) | 2001-03-02 | 2006-08-15 | National Institute For Materials Science | Gate and CMOS structure and MOS structure |
| US7098120B2 (en) | 2003-10-30 | 2006-08-29 | Kabushiki Kaisha Toshiba | Method of manufacturing semiconductor devices |
Also Published As
| Publication number | Publication date |
|---|---|
| JPH053146B2 (enExample) | 1993-01-14 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| JPS61501948A (ja) | Cmos集積回路技法 | |
| JPS60254766A (ja) | ゲート電極およびcmos集積回路の製造方法 | |
| JPS62131561A (ja) | 高密度集積回路の製造方法 | |
| JPS5923557A (ja) | 相補形金属↓−酸化膜↓−半導体(cmos)トランジスタの製造方法 | |
| US5278096A (en) | Transistor fabrication method | |
| JPS60220975A (ja) | GaAs電界効果トランジスタ及びその製造方法 | |
| JPS60213052A (ja) | 高密度集積mosfet回路の製造方法 | |
| US20060035426A1 (en) | Method and apparatus for polysilicon resistor formation | |
| JPH0734477B2 (ja) | 半導体装置の製造方法 | |
| JPH0951040A (ja) | 半導体装置の製造方法 | |
| JPH04170067A (ja) | Cmosトランジスタの製造方法 | |
| JPS59114868A (ja) | 半導体装置の製造方法 | |
| JP2817518B2 (ja) | 半導体装置およびその製造方法 | |
| JPH0342868A (ja) | C―mos薄膜トランジスタ装置とその製造方法 | |
| JPH0897422A (ja) | Mos型半導体装置の製造方法及びmos型半導体装置 | |
| JPH0423428B2 (enExample) | ||
| JP2838315B2 (ja) | 半導体装置及びその製造方法 | |
| JPS60253217A (ja) | 半導体装置の製造方法 | |
| JPS63122156A (ja) | 半導体集積回路の製造方法 | |
| JPS59148367A (ja) | 半導体装置の製造方法 | |
| JPS61248476A (ja) | 半導体装置の製造方法 | |
| JPS60226174A (ja) | 金属硅化物の形成方法 | |
| JPS59108354A (ja) | 半導体装置の製造方法 | |
| JPS5988868A (ja) | 半導体装置の製造方法 | |
| JPH0697424A (ja) | 半導体素子の製造方法 |