JPS5856353A - アイソレ−シヨンの形成方法 - Google Patents
アイソレ−シヨンの形成方法Info
- Publication number
- JPS5856353A JPS5856353A JP56154608A JP15460881A JPS5856353A JP S5856353 A JPS5856353 A JP S5856353A JP 56154608 A JP56154608 A JP 56154608A JP 15460881 A JP15460881 A JP 15460881A JP S5856353 A JPS5856353 A JP S5856353A
- Authority
- JP
- Japan
- Prior art keywords
- photo
- resist film
- groove
- film
- sio2
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Classifications
-
- H10W10/0121—
-
- H10W10/13—
Landscapes
- Local Oxidation Of Silicon (AREA)
- Drying Of Semiconductors (AREA)
- Element Separation (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP56154608A JPS5856353A (ja) | 1981-09-29 | 1981-09-29 | アイソレ−シヨンの形成方法 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP56154608A JPS5856353A (ja) | 1981-09-29 | 1981-09-29 | アイソレ−シヨンの形成方法 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS5856353A true JPS5856353A (ja) | 1983-04-04 |
| JPH0358179B2 JPH0358179B2 (OSRAM) | 1991-09-04 |
Family
ID=15587895
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP56154608A Granted JPS5856353A (ja) | 1981-09-29 | 1981-09-29 | アイソレ−シヨンの形成方法 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS5856353A (OSRAM) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US5192706A (en) * | 1990-08-30 | 1993-03-09 | Texas Instruments Incorporated | Method for semiconductor isolation |
Citations (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS53108773A (en) * | 1977-03-04 | 1978-09-21 | Matsushita Electric Ind Co Ltd | Production of semiconductor device |
-
1981
- 1981-09-29 JP JP56154608A patent/JPS5856353A/ja active Granted
Patent Citations (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS53108773A (en) * | 1977-03-04 | 1978-09-21 | Matsushita Electric Ind Co Ltd | Production of semiconductor device |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US5192706A (en) * | 1990-08-30 | 1993-03-09 | Texas Instruments Incorporated | Method for semiconductor isolation |
Also Published As
| Publication number | Publication date |
|---|---|
| JPH0358179B2 (OSRAM) | 1991-09-04 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| JPS6340337A (ja) | 集積回路分離法 | |
| US4318759A (en) | Retro-etch process for integrated circuits | |
| JPH0427702B2 (OSRAM) | ||
| US4334348A (en) | Retro-etch process for forming gate electrodes of MOS integrated circuits | |
| JPS6355780B2 (OSRAM) | ||
| JPS5856353A (ja) | アイソレ−シヨンの形成方法 | |
| JPH05849B2 (OSRAM) | ||
| JPS59135743A (ja) | 半導体装置およびその製造方法 | |
| JP2000022153A (ja) | 半導体装置および半導体装置の製造方法 | |
| JPS59214238A (ja) | 分離領域の形成方法 | |
| JPH0562463B2 (OSRAM) | ||
| US6245643B1 (en) | Method of removing polysilicon residual in a LOCOS isolation process using an etching selectivity solution | |
| JPS62190847A (ja) | 半導体装置の製造方法 | |
| JPS6139735B2 (OSRAM) | ||
| JPS60161632A (ja) | 半導体装置及びその製造方法 | |
| JPH0249017B2 (OSRAM) | ||
| JPS6193642A (ja) | 半導体装置の製造方法 | |
| JPH0370386B2 (OSRAM) | ||
| JPS6322065B2 (OSRAM) | ||
| JPH0427703B2 (OSRAM) | ||
| JPS61176133A (ja) | 半導体装置の製造方法 | |
| JPS6065544A (ja) | 半導体装置の製造方法 | |
| JPS6222454A (ja) | 半導体装置の製造方法 | |
| JPS58207676A (ja) | 半導体装置の製造方法 | |
| JPS62132341A (ja) | 半導体装置の製造方法 |