JPS58218132A - 半導体ウエ−ハ特性検査処理方法 - Google Patents

半導体ウエ−ハ特性検査処理方法

Info

Publication number
JPS58218132A
JPS58218132A JP57086956A JP8695682A JPS58218132A JP S58218132 A JPS58218132 A JP S58218132A JP 57086956 A JP57086956 A JP 57086956A JP 8695682 A JP8695682 A JP 8695682A JP S58218132 A JPS58218132 A JP S58218132A
Authority
JP
Japan
Prior art keywords
memory
inspection
semiconductor
marking
recording medium
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP57086956A
Other languages
English (en)
Japanese (ja)
Other versions
JPH0312463B2 (OSRAM
Inventor
Masayasu Miyake
三宅 正保
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
NEC Home Electronics Ltd
NEC Corp
Original Assignee
NEC Home Electronics Ltd
Nippon Electric Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by NEC Home Electronics Ltd, Nippon Electric Co Ltd filed Critical NEC Home Electronics Ltd
Priority to JP57086956A priority Critical patent/JPS58218132A/ja
Publication of JPS58218132A publication Critical patent/JPS58218132A/ja
Publication of JPH0312463B2 publication Critical patent/JPH0312463B2/ja
Granted legal-status Critical Current

Links

Classifications

    • H10P74/00

Landscapes

  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
JP57086956A 1982-05-21 1982-05-21 半導体ウエ−ハ特性検査処理方法 Granted JPS58218132A (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP57086956A JPS58218132A (ja) 1982-05-21 1982-05-21 半導体ウエ−ハ特性検査処理方法

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP57086956A JPS58218132A (ja) 1982-05-21 1982-05-21 半導体ウエ−ハ特性検査処理方法

Publications (2)

Publication Number Publication Date
JPS58218132A true JPS58218132A (ja) 1983-12-19
JPH0312463B2 JPH0312463B2 (OSRAM) 1991-02-20

Family

ID=13901319

Family Applications (1)

Application Number Title Priority Date Filing Date
JP57086956A Granted JPS58218132A (ja) 1982-05-21 1982-05-21 半導体ウエ−ハ特性検査処理方法

Country Status (1)

Country Link
JP (1) JPS58218132A (OSRAM)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS60211956A (ja) * 1984-04-06 1985-10-24 Tokyo Seimitsu Co Ltd プロ−ビングマシン
JPS62293124A (ja) * 1986-06-12 1987-12-19 Matsushita Electric Ind Co Ltd プリント基板の検査装置

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS60211956A (ja) * 1984-04-06 1985-10-24 Tokyo Seimitsu Co Ltd プロ−ビングマシン
JPS62293124A (ja) * 1986-06-12 1987-12-19 Matsushita Electric Ind Co Ltd プリント基板の検査装置

Also Published As

Publication number Publication date
JPH0312463B2 (OSRAM) 1991-02-20

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