JPS58205987A - バブルメモリ装置の電源シ−ケンス検査方法 - Google Patents
バブルメモリ装置の電源シ−ケンス検査方法Info
- Publication number
- JPS58205987A JPS58205987A JP57090161A JP9016182A JPS58205987A JP S58205987 A JPS58205987 A JP S58205987A JP 57090161 A JP57090161 A JP 57090161A JP 9016182 A JP9016182 A JP 9016182A JP S58205987 A JPS58205987 A JP S58205987A
- Authority
- JP
- Japan
- Prior art keywords
- waveform
- power source
- electric power
- sequence
- turning
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 238000000034 method Methods 0.000 title description 7
- 238000012360 testing method Methods 0.000 claims description 15
- 238000007689 inspection Methods 0.000 abstract description 6
- 238000001514 detection method Methods 0.000 abstract 1
- BHMLFPOTZYRDKA-IRXDYDNUSA-N (2s)-2-[(s)-(2-iodophenoxy)-phenylmethyl]morpholine Chemical compound IC1=CC=CC=C1O[C@@H](C=1C=CC=CC=1)[C@H]1OCCNC1 BHMLFPOTZYRDKA-IRXDYDNUSA-N 0.000 description 1
- 238000007796 conventional method Methods 0.000 description 1
- 230000006378 damage Effects 0.000 description 1
- 238000010586 diagram Methods 0.000 description 1
- 238000004904 shortening Methods 0.000 description 1
Classifications
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C19/00—Digital stores in which the information is moved stepwise, e.g. shift registers
- G11C19/02—Digital stores in which the information is moved stepwise, e.g. shift registers using magnetic elements
- G11C19/08—Digital stores in which the information is moved stepwise, e.g. shift registers using magnetic elements using thin films in plane structure
- G11C19/0875—Organisation of a plurality of magnetic shift registers
Landscapes
- For Increasing The Reliability Of Semiconductor Memories (AREA)
- Power Sources (AREA)
- Techniques For Improving Reliability Of Storages (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP57090161A JPS58205987A (ja) | 1982-05-27 | 1982-05-27 | バブルメモリ装置の電源シ−ケンス検査方法 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP57090161A JPS58205987A (ja) | 1982-05-27 | 1982-05-27 | バブルメモリ装置の電源シ−ケンス検査方法 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS58205987A true JPS58205987A (ja) | 1983-12-01 |
| JPS6214917B2 JPS6214917B2 (enrdf_load_stackoverflow) | 1987-04-04 |
Family
ID=13990763
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP57090161A Granted JPS58205987A (ja) | 1982-05-27 | 1982-05-27 | バブルメモリ装置の電源シ−ケンス検査方法 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS58205987A (enrdf_load_stackoverflow) |
Families Citing this family (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS63143016U (enrdf_load_stackoverflow) * | 1987-03-11 | 1988-09-20 |
-
1982
- 1982-05-27 JP JP57090161A patent/JPS58205987A/ja active Granted
Also Published As
| Publication number | Publication date |
|---|---|
| JPS6214917B2 (enrdf_load_stackoverflow) | 1987-04-04 |
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