JPS58204455A - 移動試料観察装置 - Google Patents
移動試料観察装置Info
- Publication number
- JPS58204455A JPS58204455A JP57086263A JP8626382A JPS58204455A JP S58204455 A JPS58204455 A JP S58204455A JP 57086263 A JP57086263 A JP 57086263A JP 8626382 A JP8626382 A JP 8626382A JP S58204455 A JPS58204455 A JP S58204455A
- Authority
- JP
- Japan
- Prior art keywords
- scanning
- horizontal
- sample
- supplied
- deflection
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/26—Electron or ion microscopes; Electron or ion diffraction tubes
- H01J37/28—Electron or ion microscopes; Electron or ion diffraction tubes with scanning beams
Landscapes
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Analysing Materials By The Use Of Radiation (AREA)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP57086263A JPS58204455A (ja) | 1982-05-20 | 1982-05-20 | 移動試料観察装置 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP57086263A JPS58204455A (ja) | 1982-05-20 | 1982-05-20 | 移動試料観察装置 |
Publications (2)
Publication Number | Publication Date |
---|---|
JPS58204455A true JPS58204455A (ja) | 1983-11-29 |
JPS6337941B2 JPS6337941B2 (enrdf_load_stackoverflow) | 1988-07-27 |
Family
ID=13881926
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP57086263A Granted JPS58204455A (ja) | 1982-05-20 | 1982-05-20 | 移動試料観察装置 |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS58204455A (enrdf_load_stackoverflow) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
WO2002073653A1 (fr) * | 2001-03-09 | 2002-09-19 | Seiko Instruments Inc. | Systeme a faisceau ionique focalise et procede d'usinage faisant appel audit systeme |
-
1982
- 1982-05-20 JP JP57086263A patent/JPS58204455A/ja active Granted
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
WO2002073653A1 (fr) * | 2001-03-09 | 2002-09-19 | Seiko Instruments Inc. | Systeme a faisceau ionique focalise et procede d'usinage faisant appel audit systeme |
Also Published As
Publication number | Publication date |
---|---|
JPS6337941B2 (enrdf_load_stackoverflow) | 1988-07-27 |