JPS58182832A - GaAs基板のエツチング方法 - Google Patents

GaAs基板のエツチング方法

Info

Publication number
JPS58182832A
JPS58182832A JP6771382A JP6771382A JPS58182832A JP S58182832 A JPS58182832 A JP S58182832A JP 6771382 A JP6771382 A JP 6771382A JP 6771382 A JP6771382 A JP 6771382A JP S58182832 A JPS58182832 A JP S58182832A
Authority
JP
Japan
Prior art keywords
etching
tartaric acid
hydrogen peroxide
range
alpha
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP6771382A
Other languages
English (en)
Japanese (ja)
Other versions
JPH0415616B2 (enrdf_load_stackoverflow
Inventor
Kazuo Hayashi
一夫 林
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Mitsubishi Electric Corp
Original Assignee
Mitsubishi Electric Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Mitsubishi Electric Corp filed Critical Mitsubishi Electric Corp
Priority to JP6771382A priority Critical patent/JPS58182832A/ja
Publication of JPS58182832A publication Critical patent/JPS58182832A/ja
Publication of JPH0415616B2 publication Critical patent/JPH0415616B2/ja
Granted legal-status Critical Current

Links

Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/02Manufacture or treatment of semiconductor devices or of parts thereof
    • H01L21/04Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
    • H01L21/18Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies comprising elements of Group IV of the Periodic Table or AIIIBV compounds with or without impurities, e.g. doping materials
    • H01L21/30Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26
    • H01L21/302Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26 to change their surface-physical characteristics or shape, e.g. etching, polishing, cutting
    • H01L21/306Chemical or electrical treatment, e.g. electrolytic etching

Landscapes

  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • General Physics & Mathematics (AREA)
  • Manufacturing & Machinery (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Power Engineering (AREA)
  • Weting (AREA)
JP6771382A 1982-04-20 1982-04-20 GaAs基板のエツチング方法 Granted JPS58182832A (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP6771382A JPS58182832A (ja) 1982-04-20 1982-04-20 GaAs基板のエツチング方法

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP6771382A JPS58182832A (ja) 1982-04-20 1982-04-20 GaAs基板のエツチング方法

Publications (2)

Publication Number Publication Date
JPS58182832A true JPS58182832A (ja) 1983-10-25
JPH0415616B2 JPH0415616B2 (enrdf_load_stackoverflow) 1992-03-18

Family

ID=13352870

Family Applications (1)

Application Number Title Priority Date Filing Date
JP6771382A Granted JPS58182832A (ja) 1982-04-20 1982-04-20 GaAs基板のエツチング方法

Country Status (1)

Country Link
JP (1) JPS58182832A (enrdf_load_stackoverflow)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2006060207A (ja) * 2004-08-03 2006-03-02 Samsung Electronics Co Ltd エッチング溶液及びこれを利用した磁気記憶素子の形成方法

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5171236A (ja) * 1974-12-18 1976-06-19 Mitsubishi Electric Corp Etsuchingueki

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5171236A (ja) * 1974-12-18 1976-06-19 Mitsubishi Electric Corp Etsuchingueki

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2006060207A (ja) * 2004-08-03 2006-03-02 Samsung Electronics Co Ltd エッチング溶液及びこれを利用した磁気記憶素子の形成方法
US8092698B2 (en) 2004-08-03 2012-01-10 Samsung Electronics Co., Ltd. Methods of forming semiconductor devices formed by processes including the use of specific etchant solutions

Also Published As

Publication number Publication date
JPH0415616B2 (enrdf_load_stackoverflow) 1992-03-18

Similar Documents

Publication Publication Date Title
US4733283A (en) GaAs semiconductor device
US4479850A (en) Method for etching integrated semiconductor circuits containing double layers consisting of polysilicon and metal silicide
US6133157A (en) Dry etching method of a silicon thin film
JPS58182832A (ja) GaAs基板のエツチング方法
Mao et al. The Applications of Citric Acid/Hydrogen Peroxide Etching Solutions in the Processing of Pseudomorphic MODFETs
JP2773700B2 (ja) 化合物半導体装置およびその製造方法
JPS63289820A (ja) 半導体装置の製造方法
JPH02164042A (ja) 薄膜トランジスタの製造方法
JPS58147122A (ja) 化合物半導体装置の製造方法
JPH03241740A (ja) 半導体装置の製造方法
JP2000058560A (ja) 電界効果トランジスタおよびその製造方法
KR960019768A (ko) 트랜지스터 제조방법
JP2001023951A (ja) 半導体装置の製造方法
JPH0298946A (ja) 電界効果トランジスタの製造方法
JPS59213168A (ja) 縦型電界効果トランジスタの製造方法
JPH1154474A (ja) 化合物半導体のエッチング方法
JPH0243333B2 (enrdf_load_stackoverflow)
KR970003886B1 (ko) 실리콘박막의 건식에칭방법
JPS59220927A (ja) 半導体装置の製造方法
JP2000174259A (ja) 半導体素子の製造方法
JPH052742B2 (enrdf_load_stackoverflow)
JPH0426132A (ja) 半導体装置の製造方法
JPH05267240A (ja) タングステンシリサイド膜のドライエッチング方法
JPH0794437A (ja) 半導体装置の製法
JPH06216160A (ja) ヘテロ接合型電界効果トランジスタ及びその製法