JPS58155369A - ピン回路試験方法 - Google Patents

ピン回路試験方法

Info

Publication number
JPS58155369A
JPS58155369A JP57037950A JP3795082A JPS58155369A JP S58155369 A JPS58155369 A JP S58155369A JP 57037950 A JP57037950 A JP 57037950A JP 3795082 A JP3795082 A JP 3795082A JP S58155369 A JPS58155369 A JP S58155369A
Authority
JP
Japan
Prior art keywords
bins
pins
test
bin
pin
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP57037950A
Other languages
English (en)
Japanese (ja)
Other versions
JPH0316624B2 (enrdf_load_stackoverflow
Inventor
Shinichi Kaneko
真一 金子
Tomoaki Matsuno
倫明 松野
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Hitachi Ltd
AKUTO GIKEN KK
Original Assignee
Hitachi Ltd
AKUTO GIKEN KK
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hitachi Ltd, AKUTO GIKEN KK filed Critical Hitachi Ltd
Priority to JP57037950A priority Critical patent/JPS58155369A/ja
Publication of JPS58155369A publication Critical patent/JPS58155369A/ja
Publication of JPH0316624B2 publication Critical patent/JPH0316624B2/ja
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/50—Testing of electric apparatus, lines, cables or components for short-circuits, continuity, leakage current or incorrect line connections
    • G01R31/58—Testing of lines, cables or conductors
    • G01R31/60—Identification of wires in a multicore cable

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)
JP57037950A 1982-03-12 1982-03-12 ピン回路試験方法 Granted JPS58155369A (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP57037950A JPS58155369A (ja) 1982-03-12 1982-03-12 ピン回路試験方法

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP57037950A JPS58155369A (ja) 1982-03-12 1982-03-12 ピン回路試験方法

Publications (2)

Publication Number Publication Date
JPS58155369A true JPS58155369A (ja) 1983-09-16
JPH0316624B2 JPH0316624B2 (enrdf_load_stackoverflow) 1991-03-06

Family

ID=12511821

Family Applications (1)

Application Number Title Priority Date Filing Date
JP57037950A Granted JPS58155369A (ja) 1982-03-12 1982-03-12 ピン回路試験方法

Country Status (1)

Country Link
JP (1) JPS58155369A (enrdf_load_stackoverflow)

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5634068A (en) * 1979-06-28 1981-04-06 Tekno Term Systems Ab Method of defrosting heat pump

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5634068A (en) * 1979-06-28 1981-04-06 Tekno Term Systems Ab Method of defrosting heat pump

Also Published As

Publication number Publication date
JPH0316624B2 (enrdf_load_stackoverflow) 1991-03-06

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