JPS58127324A - Preparing device for drawing data of electron beam exposure device - Google Patents

Preparing device for drawing data of electron beam exposure device

Info

Publication number
JPS58127324A
JPS58127324A JP966882A JP966882A JPS58127324A JP S58127324 A JPS58127324 A JP S58127324A JP 966882 A JP966882 A JP 966882A JP 966882 A JP966882 A JP 966882A JP S58127324 A JPS58127324 A JP S58127324A
Authority
JP
Japan
Prior art keywords
data
arithmetic processing
electron beam
beam exposure
section
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP966882A
Other languages
Japanese (ja)
Inventor
Susumu Watanabe
進 渡辺
Akira Noma
野間 昭
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Toshiba Corp
Original Assignee
Toshiba Corp
Tokyo Shibaura Electric Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Toshiba Corp, Tokyo Shibaura Electric Co Ltd filed Critical Toshiba Corp
Priority to JP966882A priority Critical patent/JPS58127324A/en
Publication of JPS58127324A publication Critical patent/JPS58127324A/en
Pending legal-status Critical Current

Links

Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J37/00Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
    • H01J37/30Electron-beam or ion-beam tubes for localised treatment of objects
    • H01J37/302Controlling tubes by external information, e.g. programme control
    • H01J37/3023Programme control

Landscapes

  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Electron Beam Exposure (AREA)

Abstract

PURPOSE:To shorten a time required for data conversion by dividing a drawing pattern into a plurality of partitions, by performing a data conversion processing for each partition in parallel, and by specifying the position whereat each partition is arranged. CONSTITUTION:Data on drawing patterns are inputted in an operation processing unit 4 from a drawing pattern data input apparatus 1, while a partitioning information and an arrangement position informtation are inputted in the operation processing unit 4 from a partitioning specifying apparatus 2. A controller 47 delivers these data and informations to operation processing devices 41-45 independently for each partition. The operation processing devices 41-45 perform data conversion processings in parallel, and the converted data are stored temporarily a storage device 46 for working and then delivered to a converted data output apparatus 3 through the controller 47. In the output apparatus 3, the converted data are stored in storages 31 and 32, or a drawing pattern is prepared by an electron beam exposure unit 33. As for a memory array MA, the number of converted pattern data decreases to 1/30, since partitioning is repeated in 30 times. As for a sense amplifier SA, said number is reduced to 1/5, since partitioning 5 is repeated in 5 times.

Description

【発明の詳細な説明】 発明の技術分野 本発明は電子ビーム露光装置のための描画デ−夕を作成
する電子ビーム露光装置の描画データ作成装置に関する
DETAILED DESCRIPTION OF THE INVENTION Technical Field of the Invention The present invention relates to a lithography data creation apparatus for an electron beam exposure apparatus that creates lithography data for the electron beam exposure apparatus.

発明の技術的背景とその問題点 電子ビーム露光装置で必要とする描画データを作成する
処理において、特に集積回路用の描画データの場合には
、集積回路の集積度が近年−ますます増加している。た
とえば100万図形もの描画データを作成する場合があ
る。このような大賞データを電子ビーム露光装置が所望
とする形式の描画データに変換するための処理には、膨
大な処理時間を要し、数時間になってしまう。
Technical background of the invention and its problems In the process of creating drawing data required by electron beam exposure equipment, especially in the case of drawing data for integrated circuits, the degree of integration of integrated circuits has increased rapidly in recent years. There is. For example, drawing data for one million figures may be created. Processing to convert such grand prize data into drawing data in a format desired by the electron beam exposure apparatus requires an enormous amount of processing time, lasting several hours.

一方、描画データが用意された後の電子ビーム露光装置
における描画時間は年々高速化され、最近では数分乃至
数10分と速°〈なっている。
On the other hand, the writing time in an electron beam exposure apparatus after writing data is prepared has been increasing year by year, and has recently been reduced to several minutes to several tens of minutes.

このため、電子ビーム露光装置のための描画データ作成
が集積回路製造工程におけるメトルネックになシつつあ
る。
For this reason, the creation of lithography data for electron beam exposure equipment is becoming a stumbling block in the integrated circuit manufacturing process.

発明の目的 本発明は上記した事情に鑑みてなされたもので、電子ビ
ーム露光装置に供給するための描画データを作成するの
に必要なデータ変換時間を著しく短縮して大幅な能率向
上を図り得る電子ビーム露光装置のための描画データ作
成装置を提供することを目的とする。
Purpose of the Invention The present invention has been made in view of the above-mentioned circumstances, and can significantly improve efficiency by significantly shortening the data conversion time required to create drawing data to be supplied to an electron beam exposure device. An object of the present invention is to provide a drawing data creation device for an electron beam exposure device.

発明の概要 本発明の描画データ作成装置は、演舞処理装置を複数の
演算処理機器によυ構成し、描画ツヤターンを複数の区
画に分け、各区画毎のパターンデータのデータ変換処理
を独立して並列に処理して処理時間を減少させておシ、
さらに各区画の配置位置を指定すると共に同一データと
なる複数の区画については1区画だけデータ変換して変
換データを複数の区画で使用することを可能としておシ
、処理すべき・fターンデータ数を飛躍的に減少させる
ことを特徴としてお夛、これによって処理時間の高速化
を実現できる。
Summary of the Invention The drawing data creation device of the present invention comprises a dance processing device configured with a plurality of arithmetic processing devices, divides a drawn gloss turn into a plurality of sections, and performs data conversion processing of pattern data for each section independently. Reduce processing time by processing in parallel,
Furthermore, in addition to specifying the placement position of each section, for multiple sections with the same data, it is possible to convert only one section and use the converted data in multiple sections, and the number of f-turn data to be processed. This feature dramatically reduces the processing time, thereby realizing faster processing times.

発明の実施例 以下、図面を参照して本発明の一実施例を詳細に説明す
る。
Embodiment of the Invention Hereinafter, an embodiment of the present invention will be described in detail with reference to the drawings.

第1図は本発明の一実施例に係る電子ビーム露光装置の
描画データ作成装置を示している。
FIG. 1 shows a drawing data creation device for an electron beam exposure apparatus according to an embodiment of the present invention.

図において、1は描画ノfターンデータを入力するため
の例えば磁気テープ等のオンラインストレージ11や磁
気ディスク等のオフラインストレージ1!を有する描画
ツヤター77″−タ入力機器、2は電子ビーム露光装置
の描画データ作成を高速に処理するために描画パターン
の区画分割方法を指定すると共に、所望とする描画デー
タを得るために分割された各区画をどのように配置する
かという配置位置情報とを指定するための例えばグラフ
ィック端末装置21やカード読取装置21等を有する区
画分割指定機器、3は後述する演算処理装置4からの変
換結果データを一旦記録しておき電子ビーム露光装置3
3の描画データ作成装置へ上記記録したデータ変換結果
を供給するための例えば磁気ディスク等のオンラインス
トレージ3!や磁気テープ等のオフラインストレージ3
1を含む変換結果データ出力機器である。また、上記電
子ビーム露光装置33は前記演算処理装置4からの変換
結果データに基づいて直接所望の・リーンを描画するよ
うに用いられる場合もある。そして、演算処理装置4は
、入力されるiJ?ターンデータに対して必要なデータ
変換を行なうためのものであシ、複数の演算処理器41
〜4sおよび作業用記憶機器4・のほか、これらの演算
処理器41〜411%作業用記憶機器4・と前記描画パ
ターンデータ入力機器1、区画分割指定機器2、変換結
果データ出力機器3との間でデータの入出力を制御する
コントローラ4丁を含んでいる。
In the figure, reference numeral 1 indicates an online storage 11 such as a magnetic tape or an offline storage 1 such as a magnetic disk for inputting drawing data. The drawing glosser 77'' data input device 2 specifies a drawing pattern division method for high-speed processing of drawing data creation for an electron beam exposure device, and also specifies a drawing pattern division method to obtain desired drawing data. 3 is a conversion result from an arithmetic processing device 4, which will be described later. Once the data is recorded, the electron beam exposure device 3
Online storage 3, such as a magnetic disk, for supplying the recorded data conversion results to the drawing data creation device 3! Offline storage such as magnetic tape etc.3
This is a conversion result data output device including 1. Further, the electron beam exposure device 33 may be used to directly write a desired lean pattern based on the conversion result data from the arithmetic processing device 4. Then, the arithmetic processing unit 4 receives the input iJ? It is for performing necessary data conversion on turn data, and includes a plurality of arithmetic processors 41.
4s and the working storage device 4, these arithmetic processing units 41 to 411% working storage device 4, the drawing pattern data input device 1, the partitioning designation device 2, and the conversion result data output device 3. It includes four controllers that control data input and output between the two.

第2図は上記装置においてメモリ集積回路の描画データ
を得るためにデータ変換する場合の区画分割の一例を示
しておシ、この例を参考にして上記装置の動作を説明す
る。この例では、2個のメモリアレイMAとセンスアン
fsムとアドレス回路ACとを含む描画パターン全体が
第2図(b)に示すように24種類の区画に分割されて
データ変換が打衣われている。即ち、先ず描画・9タ一
ンデータ入力機器1から描画・母ターンデータを演算処
理装置4に入力させると共に、上記描画データの区画分
割情報とその配置位置情報とを区画分割指定機器2から
演算処理装置4に入力させる。演算処理装置4のコント
ローラ47は、これらの描画・9ターンデータと区画分
割方法指定情報とを受けとりて各区画別Kfi立して描
画パターンデータを演算処理機器41〜4sに送出する
。演算処理機器41〜4sa、これら各区画別の描画パ
ターンデータを独立して並列にデータ変換処理を行なう
。この変換されたデータは、配置位置情報に基づいて各
区画別に作業用記憶機器4・に一時記憶され、必要に応
じてコントローラ47を通じて変換結果データ出力機器
3に送出される。この時、コントローラ47は前記指定
機器2から受けとっていえ各区画が描画ノ母ターンのど
O位置に配置するかを指定する配置位置情報に基いて送
出制御を行なうものであシ、これKよりて所望とする描
画データを出力する。出力機器3で杜、これらの変換デ
ータをストレージ’1eJ1に記憶したり、あるいは変
換結果データ(描画データ)に基づき直接に電子ビーム
露光装置31で所望の描画Iリーンを作成する。
FIG. 2 shows an example of partitioning when data is converted to obtain drawing data for a memory integrated circuit in the above apparatus, and the operation of the above apparatus will be explained with reference to this example. In this example, the entire drawing pattern including two memory arrays MA, sense amplifier fsm, and address circuit AC is divided into 24 types of sections as shown in FIG. 2(b), and data conversion is performed. There is. That is, first, the drawing/mother turn data is inputted from the drawing/9-turn data input device 1 to the arithmetic processing device 4, and the section division information of the drawing data and its arrangement position information are subjected to arithmetic processing from the section division specifying device 2. input into the device 4. The controller 47 of the arithmetic processing device 4 receives these drawing/nine-turn data and section division method designation information, sets Kfi for each section, and sends the drawing pattern data to the arithmetic processing devices 41 to 4s. The arithmetic processing devices 41 to 4sa perform data conversion processing on the drawing pattern data for each section independently and in parallel. The converted data is temporarily stored in the working storage device 4 for each section based on the arrangement position information, and is sent to the conversion result data output device 3 via the controller 47 as necessary. At this time, the controller 47 performs sending control based on the placement position information received from the specified device 2 and specifying where each section is placed in the drawing mother turn. Output the desired drawing data. The output device 3 stores these converted data in the storage '1eJ1, or directly creates a desired drawing pattern using the electron beam exposure device 31 based on the conversion result data (drawing data).

tた、メモリアレイMAとセンスアンプ8ムについては
それぞれ区画3と5のデータの繰シ返しであル、前記演
算処理装置4では配置位置情報に基いて上記のような複
数区画で同一〇/中ターンデータに対しては一区画分(
−回)だけデータ変換する。従りて、メモリアレイMA
については区画3が30回繰シ返しているので、変換す
る・ヤターンデータ数社%。に減少し、センスアンプ8
Aについては区画5が5回縁シ返しているので、変換す
るノナターンデータ数はイに減少する。このような同一
データの区画処lI祉コント■−ラ4テにて制御してい
る。従って、区画分割の方法唸できるだけ同一データと
なる区画が多く発生するように設定することが好ましい
Furthermore, for the memory array MA and the sense amplifier 8, the data of sections 3 and 5 are repeated, and the arithmetic processing unit 4 repeats the same data in multiple sections as described above based on the arrangement position information. /One section for medium turn data (
- times). Therefore, memory array MA
As for section 3, it is repeated 30 times, so convert it to Yaturn data several companies%. Sense amplifier 8
Regarding A, since the edge of section 5 is turned around five times, the number of nonaturn data to be converted is reduced to A. The division processing of such identical data is controlled by a four-way controller. Therefore, it is preferable to set the partitioning method so that as many partitions as possible having the same data are generated.

上述しえよつな電子ビーム露光装置の描画r−タ作成装
置において、描画データを作成すゐ丸めに必要なデータ
変換の所要時間の概算式は次の通9である。但し、演算
処理装置4が複数の演算処理機器を保持するために高速
化される機能の概算については、単純に実装される演算
処理機器の機器数分の1になるものとしている。
In the above-mentioned lithography rotor creation device for an electron beam exposure apparatus, the approximate formula for the time required for data conversion necessary for rounding to create lithography data is as follows. However, it is assumed that the functions that are increased in speed because the arithmetic processing unit 4 holds a plurality of arithmetic processing devices are simply 1/1 in the number of the arithmetic processing devices that are implemented.

変換所要時間の概算式は次式で示される。The approximate formula for the conversion time is shown by the following formula.

私 ここで、Tは従来の電子ビーム露光装置の描画データ作
成所要時間 7Fは本発明の電子ビーム露光装置の描画
データ作成所要時間、1紘繰シ返し利用される分割区画
によって減少する全体描画ノ4ターン数に対する変換す
るΔターン数の割合、Mは演算処理装置に実装される演
算処理機器の機器数である。
Here, T is the time required to create lithography data for the conventional electron beam exposure system, 7F is the time required for the creation of lithography data for the electron beam exposure system of the present invention, and the overall lithography time that is reduced by the divided sections that are used repeatedly for one time. The ratio of the number of Δ turns to be converted to the number of four turns, M is the number of processing devices installed in the processing device.

したがって、第2図に示し九メモリ集積回路の・fター
ンデータを本装置を用いてデータ変換する場合の変換所
要時間は前式(1)より17士−LxT となる。
Therefore, when converting the .f-turn data of the nine memory integrated circuits shown in FIG. 2 using this apparatus, the conversion time is 17-LxT from the above equation (1).

00 但し、演算処理機器数舅をrleJ、減少する変換ノリ
ーン数の割合にとしてメモリアレイMムがイ。で、セン
スアンプ8ムが%であるが平均してイ◎としている。す
なわち、本装置にて第2図のメモリ集積回路のノリーン
データをデータ変換すれば、変換所要時間は従来のオ◎
0に短縮できる。
00 However, if the number of arithmetic processing devices is rleJ, and the ratio of the number of conversion nodes to decrease, then the memory array M is equal to. So, although the sense amplifier is 8%, it is rated as ◎ on average. In other words, if this device converts the Noreen data of the memory integrated circuit shown in Figure 2, the time required for conversion will be shorter than that of the conventional system.
It can be shortened to 0.

つま)、上記電子ビーム露光装置の描画データ作成装置
によれば、データ変換すべき−り一ンデータ数を数分の
1から数10分の1に減らすことkよりて、描画データ
作成の所要時間が数分の1から数10分の1に短縮でき
るばかシでなく、さらに加えて分割され九各区画内に含
まれるノターンテータのデータ変換処理を各区画を独立
して並列に処理するととkよって、単純には演算461
1鋏置4に実装される演算処3!器の機器数分の1にデ
ータ変換処理が短縮される。
According to the lithography data creation device for the electron beam exposure apparatus described above, the time required to create lithography data can be reduced by reducing the number of linear data to be converted from a fraction to several tenths. In addition to being able to shorten the number from a fraction of a fraction to a tenth of a fraction, it is possible to further reduce the data conversion process for the notarnators contained in each division by processing each division independently and in parallel. , simply the operation 461
Arithmetic processing 3 implemented in 1 scissors holder 4! The data conversion process is reduced to one times the number of devices in the device.

発明の詳細 な説明したように本発明によれば、従来、数時間を要す
る電子ビーム露光装置の描画−一夕作成処理の所要時間
を着しく短縮でき、大幅な能率向上を図シ得る電子ビー
ム露光装置の描画データ作成装置を提供できる。
DETAILED DESCRIPTION OF THE INVENTION As described in detail, according to the present invention, the time required for the drawing process in an electron beam exposure apparatus, which conventionally required several hours, can be significantly shortened, and the efficiency can be significantly improved. A drawing data creation device for an exposure device can be provided.

【図面の簡単な説明】[Brief explanation of drawings]

第1図は本発明の一実施例に係る電子ビーム篇光装置の
描画データ作成装置の構成図、第2図(a) 、 (b
)は上記装置によってデータ変換されるメモリ集積回路
のパターン例とその区画分割例を示す図である。 1・・・描画/4タ一ンデータ入力機器、2・・・区画
分割指定機器、3・・・変換結果データ出力機器、4・
・・演算処理装置、41〜4$・・・演算処理機器、4
a・・・作業用記憶機器、47−・・コント四−ラ、3
s・・・電子ビーム露光装置。
FIG. 1 is a block diagram of a drawing data creation device for an electron beam processing device according to an embodiment of the present invention, and FIGS. 2(a) and (b)
) is a diagram showing an example of a pattern of a memory integrated circuit whose data is converted by the above device and an example of partitioning thereof. DESCRIPTION OF SYMBOLS 1...Drawing/4-tap data input device, 2...Partition division specification device, 3...Conversion result data output device, 4.
...Arithmetic processing unit, 41~4$...Arithmetic processing equipment, 4
a...Working memory device, 47-...Controller, 3
s...Electron beam exposure device.

Claims (1)

【特許請求の範囲】 (1>  描画/4’ターンのデータを出力するデータ
入力機器と、前記描画・臂ターンを複数の区画に分割す
るための区画分割指定情報を出力する区画分割指定機器
と、この指定機器からの区画分割指定情報に基いて前記
データ入力機器からの描画・ぐターン入力を複数のパタ
ーンに区画し、各区画側に独立した演算処理機器によシ
所望のr−夕変換を行なって電子ビーム露光のために必
要な所望の描画データを得る演算処理手段とを具備する
ことを特徴とする電子ビーム露光装置の描画データ作成
装置。 (2)前記区画分割指定機器は、前記演算処理装置によ
シ分割してデータ変換された各区画を所望とする描画デ
ータ全体のどの位置に配置するかを指定する配置位置指
定情報を前記区画分割指定情報と共に前記演算処理手段
へ出力し、前記演算処理手段は上記配置位置指定情報に
基いて各区画の配置を定めて所望とする描画データを得
ることを特徴とする特許請求の範囲第1項記載の電子ビ
ーム露光装置の描1IiIf−タ作成装置。 (3)前記区画分割指定機器は、互いに同一データとな
る区画を複数個発生させるための指定を行なう区画分割
指定情報を出力し、かつ上記同一データとなる区画を所
望とする描画データ全体における複数の区画に配置する
ための配置位置指定情報を出力し、前記演算処理手段は
同一データとなる複数の区画については1区画のみのデ
ータ変換処理を行ない、この変換r−タを前記配置位置
指定情報に基いて複数の区画に用いることを特徴とする
特許請求の範囲第2項記載の電子ビーム露光装置の描画
弁−タ作成装置0
[Scope of Claims] (1> A data input device that outputs drawing/4' turn data; and a section division designation device that outputs section division specification information for dividing the drawing/arm turn into a plurality of sections. Based on the division designation information from this designated device, the drawing/turn input from the data input device is divided into a plurality of patterns, and the desired r-turn conversion is performed by an independent arithmetic processing device on each division side. A lithography data creation device for an electron beam exposure apparatus, characterized in that it comprises arithmetic processing means for obtaining desired lithography data necessary for electron beam exposure. Outputting placement position designation information specifying where in the entire desired drawing data each section divided and data-converted by the arithmetic processing device is to be placed, together with the section division specification information, to the arithmetic processing means. 1IiIf- of an electron beam exposure apparatus according to claim 1, wherein the arithmetic processing means determines the arrangement of each section based on the arrangement position designation information and obtains desired drawing data. (3) The partitioning specification device outputs partitioning specification information for specifying to generate a plurality of partitions having the same data, and draws the partitions having the same data as desired. The arithmetic processing means outputs placement position designation information for placing the data in a plurality of sections in the entire data, and the arithmetic processing means performs data conversion processing on only one section for the plurality of sections containing the same data, and converts this conversion r-ta into the A drawing pattern forming apparatus 0 for an electron beam exposure apparatus according to claim 2, characterized in that it is used for a plurality of sections based on arrangement position designation information.
JP966882A 1982-01-25 1982-01-25 Preparing device for drawing data of electron beam exposure device Pending JPS58127324A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP966882A JPS58127324A (en) 1982-01-25 1982-01-25 Preparing device for drawing data of electron beam exposure device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP966882A JPS58127324A (en) 1982-01-25 1982-01-25 Preparing device for drawing data of electron beam exposure device

Publications (1)

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JPS58127324A true JPS58127324A (en) 1983-07-29

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JP966882A Pending JPS58127324A (en) 1982-01-25 1982-01-25 Preparing device for drawing data of electron beam exposure device

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Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS637632A (en) * 1986-06-27 1988-01-13 Toshiba Mach Co Ltd Beam scanning drawing apparatus
US5008830A (en) * 1988-08-10 1991-04-16 Mitsubishi Denki Kabushiki Kaisha Method of preparing drawing data for charged beam exposure system
JPH04125916A (en) * 1990-09-17 1992-04-27 Fujitsu Ltd Data conversion processor
JP2017168848A (en) * 2009-05-20 2017-09-21 マッパー・リソグラフィー・アイピー・ビー.ブイ. Dual path scanning

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5511303A (en) * 1978-07-10 1980-01-26 Chiyou Lsi Gijutsu Kenkyu Kumiai Electron-beam exposure device

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5511303A (en) * 1978-07-10 1980-01-26 Chiyou Lsi Gijutsu Kenkyu Kumiai Electron-beam exposure device

Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS637632A (en) * 1986-06-27 1988-01-13 Toshiba Mach Co Ltd Beam scanning drawing apparatus
US5008830A (en) * 1988-08-10 1991-04-16 Mitsubishi Denki Kabushiki Kaisha Method of preparing drawing data for charged beam exposure system
JPH04125916A (en) * 1990-09-17 1992-04-27 Fujitsu Ltd Data conversion processor
JP2017168848A (en) * 2009-05-20 2017-09-21 マッパー・リソグラフィー・アイピー・ビー.ブイ. Dual path scanning
US10692696B2 (en) 2009-05-20 2020-06-23 Asml Netherlands B.V. Deflection scan speed adjustment during charged particle exposure

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