JPS5788354A - X-ray analysing apparatus - Google Patents

X-ray analysing apparatus

Info

Publication number
JPS5788354A
JPS5788354A JP55164464A JP16446480A JPS5788354A JP S5788354 A JPS5788354 A JP S5788354A JP 55164464 A JP55164464 A JP 55164464A JP 16446480 A JP16446480 A JP 16446480A JP S5788354 A JPS5788354 A JP S5788354A
Authority
JP
Japan
Prior art keywords
sample
rays
detector
ray
spectral
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP55164464A
Other languages
English (en)
Japanese (ja)
Other versions
JPH0136061B2 (enrdf_load_stackoverflow
Inventor
Teruji Hirai
Gen Date
Fukuo Zenitani
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Shimadzu Corp
Shimazu Seisakusho KK
Original Assignee
Shimadzu Corp
Shimazu Seisakusho KK
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Shimadzu Corp, Shimazu Seisakusho KK filed Critical Shimadzu Corp
Priority to JP55164464A priority Critical patent/JPS5788354A/ja
Publication of JPS5788354A publication Critical patent/JPS5788354A/ja
Publication of JPH0136061B2 publication Critical patent/JPH0136061B2/ja
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/20—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
    • G01N23/207—Diffractometry using detectors, e.g. using a probe in a central position and one or more displaceable detectors in circumferential positions
    • G01N23/2076—Diffractometry using detectors, e.g. using a probe in a central position and one or more displaceable detectors in circumferential positions for spectrometry, i.e. using an analysing crystal, e.g. for measuring X-ray fluorescence spectrum of a sample with wavelength-dispersion, i.e. WDXFS
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/22—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material
    • G01N23/223—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material by irradiating the sample with X-rays or gamma-rays and by measuring X-ray fluorescence

Landscapes

  • Chemical & Material Sciences (AREA)
  • Physics & Mathematics (AREA)
  • General Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Dispersion Chemistry (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
JP55164464A 1980-11-21 1980-11-21 X-ray analysing apparatus Granted JPS5788354A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP55164464A JPS5788354A (en) 1980-11-21 1980-11-21 X-ray analysing apparatus

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP55164464A JPS5788354A (en) 1980-11-21 1980-11-21 X-ray analysing apparatus

Publications (2)

Publication Number Publication Date
JPS5788354A true JPS5788354A (en) 1982-06-02
JPH0136061B2 JPH0136061B2 (enrdf_load_stackoverflow) 1989-07-28

Family

ID=15793666

Family Applications (1)

Application Number Title Priority Date Filing Date
JP55164464A Granted JPS5788354A (en) 1980-11-21 1980-11-21 X-ray analysing apparatus

Country Status (1)

Country Link
JP (1) JPS5788354A (enrdf_load_stackoverflow)

Cited By (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS63139299A (ja) * 1986-12-02 1988-06-11 科学技術庁無機材質研究所長 一次元走査ｘ線回折顕微鏡
JPS63139298A (ja) * 1986-12-01 1988-06-11 科学技術庁無機材質研究所長 モノクロメ−タ付簡易型一次元走査ｘ線回折顕微鏡
JPS63139300A (ja) * 1986-12-02 1988-06-11 科学技術庁無機材質研究所長 一次元位置検出器付走査ｘ線回折顕微鏡
JPS63139238A (ja) * 1986-12-01 1988-06-11 Natl Inst For Res In Inorg Mater 簡易型一次元走査ｘ線回折顕微鏡
JPH05264479A (ja) * 1992-01-27 1993-10-12 Philips Gloeilampenfab:Nv Ｘ線分析装置
WO2018211664A1 (ja) * 2017-05-18 2018-11-22 株式会社島津製作所 Ｘ線分光分析装置
WO2019230376A1 (ja) * 2018-05-31 2019-12-05 キヤノン株式会社 識別装置

Cited By (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS63139298A (ja) * 1986-12-01 1988-06-11 科学技術庁無機材質研究所長 モノクロメ−タ付簡易型一次元走査ｘ線回折顕微鏡
JPS63139238A (ja) * 1986-12-01 1988-06-11 Natl Inst For Res In Inorg Mater 簡易型一次元走査ｘ線回折顕微鏡
JPS63139299A (ja) * 1986-12-02 1988-06-11 科学技術庁無機材質研究所長 一次元走査ｘ線回折顕微鏡
JPS63139300A (ja) * 1986-12-02 1988-06-11 科学技術庁無機材質研究所長 一次元位置検出器付走査ｘ線回折顕微鏡
JPH05264479A (ja) * 1992-01-27 1993-10-12 Philips Gloeilampenfab:Nv Ｘ線分析装置
WO2018211664A1 (ja) * 2017-05-18 2018-11-22 株式会社島津製作所 Ｘ線分光分析装置
WO2019230376A1 (ja) * 2018-05-31 2019-12-05 キヤノン株式会社 識別装置
JP2019211252A (ja) * 2018-05-31 2019-12-12 キヤノン株式会社 識別装置

Also Published As

Publication number Publication date
JPH0136061B2 (enrdf_load_stackoverflow) 1989-07-28

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