DE69624685T2 - Einrichtung zur roentgenstrahlenuntersuchung - Google Patents

Einrichtung zur roentgenstrahlenuntersuchung

Info

Publication number
DE69624685T2
DE69624685T2 DE69624685T DE69624685T DE69624685T2 DE 69624685 T2 DE69624685 T2 DE 69624685T2 DE 69624685 T DE69624685 T DE 69624685T DE 69624685 T DE69624685 T DE 69624685T DE 69624685 T2 DE69624685 T2 DE 69624685T2
Authority
DE
Germany
Prior art keywords
examination device
ray examination
ray
examination
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
DE69624685T
Other languages
English (en)
Other versions
DE69624685D1 (de
Inventor
Peter Beevor
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
UK Secretary of State for Defence
Original Assignee
UK Secretary of State for Defence
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by UK Secretary of State for Defence filed Critical UK Secretary of State for Defence
Publication of DE69624685D1 publication Critical patent/DE69624685D1/de
Application granted granted Critical
Publication of DE69624685T2 publication Critical patent/DE69624685T2/de
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01V—GEOPHYSICS; GRAVITATIONAL MEASUREMENTS; DETECTING MASSES OR OBJECTS; TAGS
    • G01V5/00—Prospecting or detecting by the use of ionising radiation, e.g. of natural or induced radioactivity
    • G01V5/20—Detecting prohibited goods, e.g. weapons, explosives, hazardous substances, contraband or smuggled objects
    • G01V5/22—Active interrogation, i.e. by irradiating objects or goods using external radiation sources, e.g. using gamma rays or cosmic rays
    • G01V5/222—Active interrogation, i.e. by irradiating objects or goods using external radiation sources, e.g. using gamma rays or cosmic rays measuring scattered radiation
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/20—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
    • G01N23/201—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials by measuring small-angle scattering
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/20—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
    • G01N23/207—Diffractometry using detectors, e.g. using a probe in a central position and one or more displaceable detectors in circumferential positions

Landscapes

  • Physics & Mathematics (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Chemical & Material Sciences (AREA)
  • Biochemistry (AREA)
  • Analytical Chemistry (AREA)
  • Health & Medical Sciences (AREA)
  • General Health & Medical Sciences (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • High Energy & Nuclear Physics (AREA)
  • General Life Sciences & Earth Sciences (AREA)
  • Geophysics (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
DE69624685T 1995-02-08 1996-01-30 Einrichtung zur roentgenstrahlenuntersuchung Expired - Fee Related DE69624685T2 (de)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
GB9502460A GB2297835A (en) 1995-02-08 1995-02-08 Three dimensional detection of contraband using x rays
PCT/GB1996/000195 WO1996024863A1 (en) 1995-02-08 1996-01-30 X-ray inspection system

Publications (2)

Publication Number Publication Date
DE69624685D1 DE69624685D1 (de) 2002-12-12
DE69624685T2 true DE69624685T2 (de) 2003-07-03

Family

ID=10769279

Family Applications (1)

Application Number Title Priority Date Filing Date
DE69624685T Expired - Fee Related DE69624685T2 (de) 1995-02-08 1996-01-30 Einrichtung zur roentgenstrahlenuntersuchung

Country Status (8)

Country Link
US (1) US6122344A (de)
EP (1) EP0808468B1 (de)
JP (1) JPH10513265A (de)
CN (1) CN1099033C (de)
CA (1) CA2212514A1 (de)
DE (1) DE69624685T2 (de)
GB (1) GB2297835A (de)
WO (1) WO1996024863A1 (de)

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DE10062214B4 (de) * 2000-12-13 2013-01-24 Smiths Heimann Gmbh Vorrichtungen zur Durchleuchtung von Objekten
WO2003021244A1 (en) * 2001-09-04 2003-03-13 Quality Control, Inc. X-ray fluorescence measuring system and methods for trace elements
EP1308716A1 (de) * 2001-10-03 2003-05-07 Avantium International B.V. Verfahren und Vorrichtung zur Durchführung einer Transmissions- Diffraktionsanalyse
US7072440B2 (en) * 2001-10-19 2006-07-04 Control Screening, Llc Tomographic scanning X-ray inspection system using transmitted and Compton scattered radiation
US6661867B2 (en) * 2001-10-19 2003-12-09 Control Screening, Llc Tomographic scanning X-ray inspection system using transmitted and compton scattered radiation
EP2447709B1 (de) 2002-01-28 2015-05-20 Smiths Heimann GmbH Röntgenstrahlprüfungssystem und -verfahren
WO2003065077A2 (en) * 2002-01-30 2003-08-07 Rutgers, The State University Combinatorial contraband detection using energy dispersive x-ray diffraction
US6711235B2 (en) 2002-05-31 2004-03-23 General Electric Cormpany X-ray inspection apparatus and method
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US6895079B2 (en) * 2002-08-20 2005-05-17 General Electric Company Multiple focal spot X-ray inspection system
US7092485B2 (en) * 2003-05-27 2006-08-15 Control Screening, Llc X-ray inspection system for detecting explosives and other contraband
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US7060981B2 (en) * 2003-09-05 2006-06-13 Facet Technology Corp. System for automated detection of embedded objects
US7453987B1 (en) 2004-03-04 2008-11-18 Science Applications International Corporation Method and system for high energy, low radiation power X-ray imaging of the contents of a target
DE102004014445B4 (de) * 2004-03-24 2006-05-18 Yxlon International Security Gmbh Sekundärkollimator für eine Röntgenstreuvorrichtung sowie Röntgenstreuvorrichtung
GB0411402D0 (en) * 2004-05-21 2004-06-23 Tissuomics Ltd Penetrating radiation measurements
CN101287984B (zh) * 2004-07-08 2012-10-31 护照系统公司 用于确定材料的平均原子序数和质量的方法和系统
US7224772B2 (en) * 2004-07-20 2007-05-29 University Of Florida Research Foundation, Inc. Radiography by selective detection of scatter field velocity components
DE102004035943B4 (de) * 2004-07-23 2007-11-08 GE Homeland Protection, Inc., , Newark Röntgencomputertomograph sowie Verfahren zur Untersuchung eines Prüfteils mit einem Röntgencomputertomographen
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DE102004050543A1 (de) 2004-10-16 2006-04-20 Bruker Axs Gmbh Analysegerät mit variabel ausgeleuchtetem Streifendetektor
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DE102005016656A1 (de) * 2005-01-26 2006-08-10 Smiths Heimann Gmbh Kollimator mit einstellbarer Brennweite
US7221732B1 (en) * 2005-04-04 2007-05-22 Martin Annis Method and apparatus for producing laminography images using a fixed x-ray source
US7248672B2 (en) * 2005-04-21 2007-07-24 Bruker Axs, Inc. Multiple-position x-ray tube for diffractometer
WO2006138529A2 (en) * 2005-06-14 2006-12-28 L-3 Communications Security And Detection Systems, Inc. Inspection system with material identification
US7499523B2 (en) * 2006-08-02 2009-03-03 General Electric Company Systems and methods for identifying a substance
US20080159477A1 (en) * 2006-12-29 2008-07-03 General Electric Company System and method for radiographic inspection without a-priori information of inspected object
US7492862B2 (en) * 2007-01-17 2009-02-17 Ge Homeland Protection, Inc. Computed tomography cargo inspection system and method
US8335404B2 (en) * 2007-07-20 2012-12-18 Vision Louis Winter Dynamically varying classified image display system
US8532259B2 (en) * 2008-04-17 2013-09-10 University Of Florida Research Foundation, Inc. Method and apparatus for computed imaging backscatter radiography
WO2010025539A1 (en) 2008-09-05 2010-03-11 Optosecurity Inc. Method and system for performing x-ray inspection of a liquid product at a security checkpoint
US20110172972A1 (en) * 2008-09-15 2011-07-14 Optosecurity Inc. Method and apparatus for asssessing properties of liquids by using x-rays
JP5557272B2 (ja) * 2009-06-03 2014-07-23 名古屋電機工業株式会社 放射線検査装置、放射線検査方法および放射線検査プログラム
WO2010145016A1 (en) 2009-06-15 2010-12-23 Optosecurity Inc. Method and apparatus for assessing the threat status of luggage
WO2011011894A1 (en) 2009-07-31 2011-02-03 Optosecurity Inc. Method and system for identifying a liquid product in luggage or other receptacle
US7983387B1 (en) * 2009-10-20 2011-07-19 The Boeing Company Method and system to predict detectability and identify foreign objects
US8058621B2 (en) * 2009-10-26 2011-11-15 General Electric Company Elemental composition detection system and method
US8314394B1 (en) 2009-11-04 2012-11-20 Science Applications International Corporation System and method for three-dimensional imaging using scattering from annihilation coincidence photons
US9486839B2 (en) 2011-01-07 2016-11-08 Huron Valley Steel Corporation Scrap metal sorting system
KR101303451B1 (ko) * 2011-06-10 2013-09-05 한국원자력연구원 복수에너지의 전자가속기 및 복수의 Ｘ－ｒａｙ 디텍터를 구비하는 화물 검색장치
US20130012812A1 (en) * 2011-07-06 2013-01-10 Varian Medical Systems, Inc. Functional and physical imaging by spectroscopic detection of photo absorption of photons and scattered photons from radioactive sources or diffracted x-ray systems
US10602991B2 (en) 2011-07-06 2020-03-31 Varian Medical Systems, Inc. Functional and physical imaging using radiation
US9091628B2 (en) 2012-12-21 2015-07-28 L-3 Communications Security And Detection Systems, Inc. 3D mapping with two orthogonal imaging views
US10261212B2 (en) * 2013-07-25 2019-04-16 Analogic Corporation Generation of diffraction signature of item within object
JP2015078950A (ja) * 2013-10-18 2015-04-23 キヤノン株式会社 Ｘ線検査装置
CN104897703B (zh) * 2014-03-04 2018-09-28 清华大学 检查设备、方法和系统
FR3023000B1 (fr) * 2014-06-30 2016-07-29 Commissariat Energie Atomique Procede et systeme d'analyse d'un objet par diffractometrie utilisant un spectre en diffusion et un spectre en transmission
FR3023001A1 (fr) * 2014-06-30 2016-01-01 Commissariat Energie Atomique Procede d'analyse d'un objet en deux temps utilisant un rayonnement en transmission puis un spectre en diffusion.
KR101930150B1 (ko) * 2015-04-20 2018-12-17 가부시키가이샤 죠부 X선 검사용의 데이터 처리 장치 및 데이터 처리 방법, 및, 그 장치를 탑재한 x선 검사 장치
US9841387B2 (en) * 2015-07-22 2017-12-12 Test Research, Inc. Inspection method and device
WO2017019554A1 (en) * 2015-07-24 2017-02-02 Photo Diagnostic Systems, Inc. Method and apparatus for performing multi-energy (including dual energy) computed tomography (ct) imaging
US9939393B2 (en) * 2015-09-28 2018-04-10 United Technologies Corporation Detection of crystallographic properties in aerospace components
US10352695B2 (en) * 2015-12-11 2019-07-16 Kla-Tencor Corporation X-ray scatterometry metrology for high aspect ratio structures
JP6621657B2 (ja) * 2015-12-21 2019-12-18 浜松ホトニクス株式会社 放射線検出装置、放射線検査システム、及び、放射線検出装置の調整方法
US10573030B2 (en) 2017-04-07 2020-02-25 Photo Diagnostic Systems, Inc. Method for artifact reduction using monoenergetic data in computed tomography
CN107219241B (zh) * 2017-05-05 2020-10-16 中国科学院上海光学精密机械研究所 原位时间分辨x射线吸收谱的测量装置和测量方法
EP3553507A1 (de) * 2018-04-13 2019-10-16 Malvern Panalytical B.V. Röntgenanalysevorrichtung
JP2019191169A (ja) * 2018-04-23 2019-10-31 ブルカー ジェイヴィ イスラエル リミテッドＢｒｕｋｅｒ Ｊｖ Ｉｓｒａｅｌ Ｌｔｄ． 小角ｘ線散乱測定用のｘ線源光学系
CN108508043A (zh) * 2018-06-06 2018-09-07 南京正驰科技发展有限公司 单源双视角安检机
KR20210028276A (ko) * 2018-07-31 2021-03-11 램 리써치 코포레이션 고 종횡비 구조체들의 패터닝된 어레이들 내의 틸팅 각도 결정
DE102019111567A1 (de) * 2019-05-03 2020-11-05 Wipotec Gmbh Verfahren und Vorrichtung zur Röntgeninspektion von Produkten, insbesondere von Lebensmitteln
GB2585673B (en) * 2019-07-10 2022-05-04 The Nottingham Trent Univ A sample inspection system
CN111175137A (zh) * 2019-10-19 2020-05-19 安徽磐彩装饰工程有限公司 一种多孔隔热材料压力测试装置
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CN111624605B (zh) * 2020-05-27 2022-07-15 哈尔滨工程大学 一种基于角度维回波特征的航海雷达目标检测方法
CN117902292A (zh) * 2024-01-15 2024-04-19 上海高晶检测科技股份有限公司 一种x射线检测装置

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Also Published As

Publication number Publication date
DE69624685D1 (de) 2002-12-12
CN1181133A (zh) 1998-05-06
EP0808468B1 (de) 2002-11-06
GB9502460D0 (en) 1995-03-29
WO1996024863A1 (en) 1996-08-15
US6122344A (en) 2000-09-19
CA2212514A1 (en) 1996-08-15
EP0808468A1 (de) 1997-11-26
GB2297835A (en) 1996-08-14
CN1099033C (zh) 2003-01-15
JPH10513265A (ja) 1998-12-15

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8364 No opposition during term of opposition
8339 Ceased/non-payment of the annual fee