JPS5754330A - Formation of silicon oxidized film - Google Patents
Formation of silicon oxidized filmInfo
- Publication number
- JPS5754330A JPS5754330A JP55130936A JP13093680A JPS5754330A JP S5754330 A JPS5754330 A JP S5754330A JP 55130936 A JP55130936 A JP 55130936A JP 13093680 A JP13093680 A JP 13093680A JP S5754330 A JPS5754330 A JP S5754330A
- Authority
- JP
- Japan
- Prior art keywords
- film
- electrode wiring
- cvd
- sio2
- formation
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/02104—Forming layers
- H01L21/02107—Forming insulating materials on a substrate
Abstract
PURPOSE:To reduce electrode wiring capacitance by forming a CVD-SiO2 film on a polycrystalline thin Si film formed on the surface of a foundation SiO2 film and thereby enabling the formation of a thick CVD-SiO2 film and the confirmation of the point of completion of etching of this film by the polycrystalline Si. CONSTITUTION:When the polycrystalline thin Si film 13 is formed on the foundation SiO2 film 12 on the surface of an Si substrate 11, the thick CVD-SiO2 film 14 can be formed thereon. Next, a region to be an electrode wiring part being masked, the CVD-SiO2 film 14 is etched down to the surface of the polycrystalline thin Si film 13. The point of completion of this etching is confirmed by the repellency shown by the polycrystalline thin Si film 13. An Al electrode wiring 15 is formed on the film 14. By this constitution, low-capacitance electrode wiring can be composed and thereby IC of high speed and high performance can be obtained.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP55130936A JPS5754330A (en) | 1980-09-19 | 1980-09-19 | Formation of silicon oxidized film |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP55130936A JPS5754330A (en) | 1980-09-19 | 1980-09-19 | Formation of silicon oxidized film |
Publications (2)
Publication Number | Publication Date |
---|---|
JPS5754330A true JPS5754330A (en) | 1982-03-31 |
JPS6230691B2 JPS6230691B2 (en) | 1987-07-03 |
Family
ID=15046152
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP55130936A Granted JPS5754330A (en) | 1980-09-19 | 1980-09-19 | Formation of silicon oxidized film |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS5754330A (en) |
Citations (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS502866A (en) * | 1973-05-10 | 1975-01-13 | ||
JPS5013156A (en) * | 1973-06-06 | 1975-02-12 |
-
1980
- 1980-09-19 JP JP55130936A patent/JPS5754330A/en active Granted
Patent Citations (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS502866A (en) * | 1973-05-10 | 1975-01-13 | ||
JPS5013156A (en) * | 1973-06-06 | 1975-02-12 |
Also Published As
Publication number | Publication date |
---|---|
JPS6230691B2 (en) | 1987-07-03 |
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