JPS5753941A - Semiconductor device - Google Patents

Semiconductor device

Info

Publication number
JPS5753941A
JPS5753941A JP12961580A JP12961580A JPS5753941A JP S5753941 A JPS5753941 A JP S5753941A JP 12961580 A JP12961580 A JP 12961580A JP 12961580 A JP12961580 A JP 12961580A JP S5753941 A JPS5753941 A JP S5753941A
Authority
JP
Japan
Prior art keywords
film
resist film
protecting
junction
series rubber
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP12961580A
Other languages
Japanese (ja)
Inventor
Shuzo Ito
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
SHINNIPPON DENKI KK
NEC Home Electronics Ltd
New Nippon Electric Co Ltd
Original Assignee
SHINNIPPON DENKI KK
NEC Home Electronics Ltd
New Nippon Electric Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by SHINNIPPON DENKI KK, NEC Home Electronics Ltd, New Nippon Electric Co Ltd filed Critical SHINNIPPON DENKI KK
Priority to JP12961580A priority Critical patent/JPS5753941A/en
Publication of JPS5753941A publication Critical patent/JPS5753941A/en
Pending legal-status Critical Current

Links

Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/02Manufacture or treatment of semiconductor devices or of parts thereof
    • H01L21/04Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
    • H01L21/18Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies comprising elements of Group IV of the Periodic Table or AIIIBV compounds with or without impurities, e.g. doping materials
    • H01L21/30Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26
    • H01L21/31Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26 to form insulating layers thereon, e.g. for masking or by using photolithographic techniques; After treatment of these layers; Selection of materials for these layers

Landscapes

  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • General Physics & Mathematics (AREA)
  • Manufacturing & Machinery (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Power Engineering (AREA)
  • Formation Of Insulating Films (AREA)

Abstract

PURPOSE:To simplify processes by coating and protecting the end part of a PN junction by an insulating film containing cyclized polybutadiene series rubber which is used as a photoresist, and eliminating the formation of a stabilizing film. CONSTITUTION:For example, in the manufacture processes of an NPN transistor, a resist film 17 comprising cyclized polybutadiene series rubber is applied and formed on the upper surface of a substrate 1 whose desired diffusion process has been finished and on which oxide films 7 and 8 are formed. Then a pattern is formed by exposing and developing a resist film 17 and baked at 180-200 deg.C. Thereafter the oxide film 7 is etched, and holes 18 and 19 are provided. Then electrodes 21 and 22 are formed on the upper surface and an electrode 23 is formed on the bottom surface sequentially, and an element structure is obtained. Since the resist film 17 is not removed and used as a stabilizing film for protecting the junction together with the oxide film 7, the process can be simplified.
JP12961580A 1980-09-17 1980-09-17 Semiconductor device Pending JPS5753941A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP12961580A JPS5753941A (en) 1980-09-17 1980-09-17 Semiconductor device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP12961580A JPS5753941A (en) 1980-09-17 1980-09-17 Semiconductor device

Publications (1)

Publication Number Publication Date
JPS5753941A true JPS5753941A (en) 1982-03-31

Family

ID=15013838

Family Applications (1)

Application Number Title Priority Date Filing Date
JP12961580A Pending JPS5753941A (en) 1980-09-17 1980-09-17 Semiconductor device

Country Status (1)

Country Link
JP (1) JPS5753941A (en)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5975648A (en) * 1982-10-23 1984-04-28 Nippon Precision Saakitsutsu Kk Semiconductor device and manufacture thereof
US5242786A (en) * 1991-02-19 1993-09-07 Konica Corporation Silver halide photographic light-sensitive material

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5661130A (en) * 1979-10-25 1981-05-26 Fuji Electric Co Ltd Semiconductor device

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5661130A (en) * 1979-10-25 1981-05-26 Fuji Electric Co Ltd Semiconductor device

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5975648A (en) * 1982-10-23 1984-04-28 Nippon Precision Saakitsutsu Kk Semiconductor device and manufacture thereof
US5242786A (en) * 1991-02-19 1993-09-07 Konica Corporation Silver halide photographic light-sensitive material

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