JPS57500399A - - Google Patents

Info

Publication number
JPS57500399A
JPS57500399A JP56501391A JP50139181A JPS57500399A JP S57500399 A JPS57500399 A JP S57500399A JP 56501391 A JP56501391 A JP 56501391A JP 50139181 A JP50139181 A JP 50139181A JP S57500399 A JPS57500399 A JP S57500399A
Authority
JP
Japan
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP56501391A
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Publication of JPS57500399A publication Critical patent/JPS57500399A/ja
Pending legal-status Critical Current

Links

Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/02Manufacture or treatment of semiconductor devices or of parts thereof
    • H01L21/04Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
    • H01L21/18Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies comprising elements of Group IV of the Periodic Table or AIIIBV compounds with or without impurities, e.g. doping materials
    • H01L21/30Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26
    • H01L21/302Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26 to change their surface-physical characteristics or shape, e.g. etching, polishing, cutting
    • H01L21/306Chemical or electrical treatment, e.g. electrolytic etching
    • H01L21/3065Plasma etching; Reactive-ion etching
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/02Manufacture or treatment of semiconductor devices or of parts thereof
    • H01L21/04Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
    • H01L21/18Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies comprising elements of Group IV of the Periodic Table or AIIIBV compounds with or without impurities, e.g. doping materials
    • H01L21/30Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26
    • H01L21/31Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26 to form insulating layers thereon, e.g. for masking or by using photolithographic techniques; After treatment of these layers; Selection of materials for these layers
    • H01L21/3205Deposition of non-insulating-, e.g. conductive- or resistive-, layers on insulating layers; After-treatment of these layers
    • H01L21/321After treatment
    • H01L21/3213Physical or chemical etching of the layers, e.g. to produce a patterned layer from a pre-deposited extensive layer
    • H01L21/32133Physical or chemical etching of the layers, e.g. to produce a patterned layer from a pre-deposited extensive layer by chemical means only
    • H01L21/32135Physical or chemical etching of the layers, e.g. to produce a patterned layer from a pre-deposited extensive layer by chemical means only by vapour etching only
    • H01L21/32136Physical or chemical etching of the layers, e.g. to produce a patterned layer from a pre-deposited extensive layer by chemical means only by vapour etching only using plasmas
    • H01L21/32137Physical or chemical etching of the layers, e.g. to produce a patterned layer from a pre-deposited extensive layer by chemical means only by vapour etching only using plasmas of silicon-containing layers

Landscapes

  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • Computer Hardware Design (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • General Physics & Mathematics (AREA)
  • Manufacturing & Machinery (AREA)
  • Plasma & Fusion (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Power Engineering (AREA)
  • Chemical & Material Sciences (AREA)
  • Chemical Kinetics & Catalysis (AREA)
  • General Chemical & Material Sciences (AREA)
  • Drying Of Semiconductors (AREA)
  • ing And Chemical Polishing (AREA)
JP56501391A 1980-04-07 1981-03-20 Pending JPS57500399A (ja)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US06/138,083 US4310380A (en) 1980-04-07 1980-04-07 Plasma etching of silicon

Related Child Applications (1)

Application Number Title Priority Date Filing Date
JP2102777A Division JPH0642470B2 (ja) 1980-04-07 1990-04-18 微細構造デバイスにおけるSiエッチング残留物除去方法

Publications (1)

Publication Number Publication Date
JPS57500399A true JPS57500399A (ja) 1982-03-04

Family

ID=22480348

Family Applications (2)

Application Number Title Priority Date Filing Date
JP56501391A Pending JPS57500399A (ja) 1980-04-07 1981-03-20
JP2102777A Expired - Lifetime JPH0642470B2 (ja) 1980-04-07 1990-04-18 微細構造デバイスにおけるSiエッチング残留物除去方法

Family Applications After (1)

Application Number Title Priority Date Filing Date
JP2102777A Expired - Lifetime JPH0642470B2 (ja) 1980-04-07 1990-04-18 微細構造デバイスにおけるSiエッチング残留物除去方法

Country Status (5)

Country Link
US (1) US4310380A (ja)
EP (1) EP0049272B1 (ja)
JP (2) JPS57500399A (ja)
CA (1) CA1160761A (ja)
WO (1) WO1981002947A1 (ja)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6468843B2 (en) 1994-11-25 2002-10-22 Semiconductor Energy Laboratory Co., Ltd. MIS semiconductor device having an LDD structure and a manufacturing method therefor

Families Citing this family (88)

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US4426246A (en) * 1982-07-26 1984-01-17 Bell Telephone Laboratories, Incorporated Plasma pretreatment with BCl3 to remove passivation formed by fluorine-etch
US4498953A (en) * 1983-07-27 1985-02-12 At&T Bell Laboratories Etching techniques
US4851295A (en) * 1984-03-16 1989-07-25 Genus, Inc. Low resistivity tungsten silicon composite film
US4629635A (en) * 1984-03-16 1986-12-16 Genus, Inc. Process for depositing a low resistivity tungsten silicon composite film on a substrate
US4778562A (en) * 1984-08-13 1988-10-18 General Motors Corporation Reactive ion etching of tin oxide films using neutral reactant gas containing hydrogen
US4544444A (en) * 1984-08-15 1985-10-01 General Motors Corporation Reactive ion etching of tin oxide films using silicon tetrachloride reactant gas
US4654112A (en) * 1984-09-26 1987-03-31 Texas Instruments Incorporated Oxide etch
US4615764A (en) * 1984-11-05 1986-10-07 Allied Corporation SF6/nitriding gas/oxidizer plasma etch system
US4582581A (en) * 1985-05-09 1986-04-15 Allied Corporation Boron trifluoride system for plasma etching of silicon dioxide
US4709655A (en) * 1985-12-03 1987-12-01 Varian Associates, Inc. Chemical vapor deposition apparatus
US4796562A (en) * 1985-12-03 1989-01-10 Varian Associates, Inc. Rapid thermal cvd apparatus
US6087267A (en) * 1986-03-04 2000-07-11 Motorola, Inc. Process for forming an integrated circuit
US5063168A (en) * 1986-07-02 1991-11-05 National Semiconductor Corporation Process for making bipolar transistor with polysilicon stringer base contact
JP2669460B2 (ja) * 1986-10-29 1997-10-27 株式会社日立製作所 エツチング方法
US4787957A (en) * 1987-09-25 1988-11-29 Air Products And Chemicals, Inc. Desmear and etchback using NF3 /O2 gas mixtures
GB2214870B (en) * 1988-02-20 1991-09-11 Stc Plc Plasma etching process
US4998979A (en) * 1988-06-06 1991-03-12 Canon Kabushiki Kaisha Method for washing deposition film-forming device
EP0414372A3 (en) * 1989-07-21 1991-04-24 Sony Corporation Dry etching methods
JP3140068B2 (ja) * 1991-01-31 2001-03-05 東京エレクトロン株式会社 クリーニング方法
US5304282A (en) * 1991-04-17 1994-04-19 Flamm Daniel L Processes depending on plasma discharges sustained in a helical resonator
US5223083A (en) * 1992-01-23 1993-06-29 Micron Technology, Inc. Process for etching a semiconductor device using an improved protective etching mask
US5753130A (en) 1992-05-15 1998-05-19 Micron Technology, Inc. Method for forming a substantially uniform array of sharp tips
US5302239A (en) * 1992-05-15 1994-04-12 Micron Technology, Inc. Method of making atomically sharp tips useful in scanning probe microscopes
US5302238A (en) * 1992-05-15 1994-04-12 Micron Technology, Inc. Plasma dry etch to produce atomically sharp asperities useful as cold cathodes
US5378648A (en) * 1992-07-15 1995-01-03 Micron Technology, Inc. Situ stringer removal during polysilicon capacitor cell plate delineation
JP2650178B2 (ja) * 1992-12-05 1997-09-03 ヤマハ株式会社 ドライエッチング方法及び装置
US5380370A (en) * 1993-04-30 1995-01-10 Tokyo Electron Limited Method of cleaning reaction tube
JP3024449B2 (ja) * 1993-07-24 2000-03-21 ヤマハ株式会社 縦型熱処理炉及び熱処理方法
JP3512496B2 (ja) * 1994-11-25 2004-03-29 株式会社半導体エネルギー研究所 Soi型半導体集積回路の作製方法
US5757456A (en) 1995-03-10 1998-05-26 Semiconductor Energy Laboratory Co., Ltd. Display device and method of fabricating involving peeling circuits from one substrate and mounting on other
JP3579492B2 (ja) * 1995-03-16 2004-10-20 株式会社半導体エネルギー研究所 表示装置の作製方法
US6849471B2 (en) 2003-03-28 2005-02-01 Reflectivity, Inc. Barrier layers for microelectromechanical systems
US6969635B2 (en) * 2000-12-07 2005-11-29 Reflectivity, Inc. Methods for depositing, releasing and packaging micro-electromechanical devices on wafer substrates
DE19713090B4 (de) * 1996-03-28 2004-06-17 Kabushiki Kaisha Toshiba, Kawasaki Verfahren und Apparatur zum Ätzen von Silicium-Materialien
US6162367A (en) * 1997-01-22 2000-12-19 California Institute Of Technology Gas-phase silicon etching with bromine trifluoride
US6165375A (en) 1997-09-23 2000-12-26 Cypress Semiconductor Corporation Plasma etching method
AU2010999A (en) * 1997-12-31 1999-07-19 Allied-Signal Inc. Method of etching and cleaning using interhalogen compounds
US6699794B1 (en) * 1998-03-09 2004-03-02 Siemens Aktiengesellschaft Self aligned buried plate
US6067999A (en) * 1998-04-23 2000-05-30 International Business Machines Corporation Method for deposition tool cleaning
US6074954A (en) * 1998-08-31 2000-06-13 Applied Materials, Inc Process for control of the shape of the etch front in the etching of polysilicon
US6107206A (en) * 1998-09-14 2000-08-22 Taiwan Semiconductor Manufacturing Company Method for etching shallow trenches in a semiconductor body
DE19843984B4 (de) * 1998-09-25 2013-10-24 Robert Bosch Gmbh Verfahren zur Herstellung von Strahlungssensoren
DE19847455A1 (de) * 1998-10-15 2000-04-27 Bosch Gmbh Robert Verfahren zur Bearbeitung von Silizium mittels Ätzprozessen
KR100804853B1 (ko) * 1999-03-04 2008-02-20 서페이스 테크놀로지 시스템스 피엘씨 삼불화염소가스발생기시스템
WO2000054312A1 (en) * 1999-03-12 2000-09-14 California Institute Of Technology Ic-compatible parylene mems technology and its application in integrated sensors
US6451642B1 (en) * 1999-07-14 2002-09-17 Texas Instruments Incorporated Method to implant NMOS polycrystalline silicon in embedded FLASH memory applications
US6942811B2 (en) * 1999-10-26 2005-09-13 Reflectivity, Inc Method for achieving improved selectivity in an etching process
US6949202B1 (en) 1999-10-26 2005-09-27 Reflectivity, Inc Apparatus and method for flow of process gas in an ultra-clean environment
US6960305B2 (en) * 1999-10-26 2005-11-01 Reflectivity, Inc Methods for forming and releasing microelectromechanical structures
US6290864B1 (en) 1999-10-26 2001-09-18 Reflectivity, Inc. Fluoride gas etching of silicon with improved selectivity
US7041224B2 (en) * 1999-10-26 2006-05-09 Reflectivity, Inc. Method for vapor phase etching of silicon
US6221784B1 (en) * 1999-11-29 2001-04-24 Applied Materials Inc. Method and apparatus for sequentially etching a wafer using anisotropic and isotropic etching
US6391790B1 (en) 2000-05-22 2002-05-21 Applied Materials, Inc. Method and apparatus for etching photomasks
US7115523B2 (en) * 2000-05-22 2006-10-03 Applied Materials, Inc. Method and apparatus for etching photomasks
US7019376B2 (en) * 2000-08-11 2006-03-28 Reflectivity, Inc Micromirror array device with a small pitch size
US6581612B1 (en) * 2001-04-17 2003-06-24 Applied Materials Inc. Chamber cleaning with fluorides of iodine
WO2002095800A2 (en) * 2001-05-22 2002-11-28 Reflectivity, Inc. A method for making a micromechanical device by removing a sacrificial layer with multiple sequential etchants
US7183201B2 (en) * 2001-07-23 2007-02-27 Applied Materials, Inc. Selective etching of organosilicate films over silicon oxide stop etch layers
US7189332B2 (en) 2001-09-17 2007-03-13 Texas Instruments Incorporated Apparatus and method for detecting an endpoint in a vapor phase etch
US20030073302A1 (en) * 2001-10-12 2003-04-17 Reflectivity, Inc., A California Corporation Methods for formation of air gap interconnects
US7027200B2 (en) * 2002-03-22 2006-04-11 Reflectivity, Inc Etching method used in fabrications of microstructures
US6965468B2 (en) * 2003-07-03 2005-11-15 Reflectivity, Inc Micromirror array having reduced gap between adjacent micromirrors of the micromirror array
US20040072081A1 (en) * 2002-05-14 2004-04-15 Coleman Thomas P. Methods for etching photolithographic reticles
US7067439B2 (en) 2002-06-14 2006-06-27 Applied Materials, Inc. ALD metal oxide deposition process using direct oxidation
US6803309B2 (en) * 2002-07-03 2004-10-12 Taiwan Semiconductor Manufacturing Co., Ltd Method for depositing an adhesion/barrier layer to improve adhesion and contact resistance
JP4694201B2 (ja) 2002-09-20 2011-06-08 インテグレイテッド ディーエヌエイ テクノロジーズ インコーポレイテッド アントラキノン消光色素、それらの製造方法及び使用
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US6980347B2 (en) * 2003-07-03 2005-12-27 Reflectivity, Inc Micromirror having reduced space between hinge and mirror plate of the micromirror
US7645704B2 (en) * 2003-09-17 2010-01-12 Texas Instruments Incorporated Methods and apparatus of etch process control in fabrications of microstructures
JP4094539B2 (ja) * 2003-12-12 2008-06-04 株式会社半導体エネルギー研究所 半導体集積回路の作製方法
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JP5590886B2 (ja) * 2006-09-26 2014-09-17 アプライド マテリアルズ インコーポレイテッド 欠陥パシベーションのための高kゲート積層構造に対するフッ素プラズマ処理
JP4799509B2 (ja) * 2007-08-16 2011-10-26 株式会社半導体エネルギー研究所 剥離方法
JP4596287B2 (ja) * 2008-09-19 2010-12-08 カシオ計算機株式会社 シリコンを含む膜のドライエッチング方法
CN103748671A (zh) * 2011-08-25 2014-04-23 大日本网屏制造株式会社 图案形成方法
JP6056136B2 (ja) * 2011-09-07 2017-01-11 セントラル硝子株式会社 ドライエッチング方法
US20180190792A1 (en) * 2017-01-04 2018-07-05 Globalfoundries Inc. Method of forming semiconductor structure and resulting structure
US20220051898A1 (en) * 2018-12-21 2022-02-17 Showa Denko K.K. Etching method using halogen fluoride and method for producing semiconductor
CN111799217B (zh) * 2020-07-17 2024-02-02 上海华虹宏力半导体制造有限公司 存储器字线形貌的控制方法

Citations (3)

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JPS52131470A (en) * 1976-04-28 1977-11-04 Hitachi Ltd Manufacture of semiconductor device
JPS54109387A (en) * 1978-02-15 1979-08-27 Hitachi Ltd Etching method
JPS5521198A (en) * 1978-07-31 1980-02-15 Western Electric Co Method of manufacturing semiconductor device

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JPS52131470A (en) * 1976-04-28 1977-11-04 Hitachi Ltd Manufacture of semiconductor device
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JPS5521198A (en) * 1978-07-31 1980-02-15 Western Electric Co Method of manufacturing semiconductor device

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6468843B2 (en) 1994-11-25 2002-10-22 Semiconductor Energy Laboratory Co., Ltd. MIS semiconductor device having an LDD structure and a manufacturing method therefor

Also Published As

Publication number Publication date
JPH0642470B2 (ja) 1994-06-01
EP0049272A1 (en) 1982-04-14
EP0049272A4 (en) 1984-06-13
WO1981002947A1 (en) 1981-10-15
US4310380A (en) 1982-01-12
JPH03114226A (ja) 1991-05-15
CA1160761A (en) 1984-01-17
EP0049272B1 (en) 1986-07-02

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