JPS574164A - Sos/mos transistor - Google Patents
Sos/mos transistorInfo
- Publication number
- JPS574164A JPS574164A JP7741680A JP7741680A JPS574164A JP S574164 A JPS574164 A JP S574164A JP 7741680 A JP7741680 A JP 7741680A JP 7741680 A JP7741680 A JP 7741680A JP S574164 A JPS574164 A JP S574164A
- Authority
- JP
- Japan
- Prior art keywords
- concentration
- impurities
- gate
- region
- layer
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 239000012535 impurity Substances 0.000 abstract 6
- 230000003071 parasitic effect Effects 0.000 abstract 1
- 229910021420 polycrystalline silicon Inorganic materials 0.000 abstract 1
- 229910052594 sapphire Inorganic materials 0.000 abstract 1
- 239000010980 sapphire Substances 0.000 abstract 1
- 239000000758 substrate Substances 0.000 abstract 1
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L29/00—Semiconductor devices adapted for rectifying, amplifying, oscillating or switching, or capacitors or resistors with at least one potential-jump barrier or surface barrier, e.g. PN junction depletion layer or carrier concentration layer; Details of semiconductor bodies or of electrodes thereof ; Multistep manufacturing processes therefor
- H01L29/66—Types of semiconductor device ; Multistep manufacturing processes therefor
- H01L29/68—Types of semiconductor device ; Multistep manufacturing processes therefor controllable by only the electric current supplied, or only the electric potential applied, to an electrode which does not carry the current to be rectified, amplified or switched
- H01L29/76—Unipolar devices, e.g. field effect transistors
- H01L29/772—Field effect transistors
- H01L29/78—Field effect transistors with field effect produced by an insulated gate
Abstract
PURPOSE:To work all original gate width as an effective gate by a method wherein the concentration of the impurities of the side and the lowermost section of an island-shaped Si layer just under the gate is made concentration, which is comparatively high and in which the desired threshold is obtained extending over the whole width of the surface. CONSTITUTION:A Si monocrystal film grown on a sapphire substrate 1 is mesa- etched and the island-shaped Si layer 2 is made up, the surface and the side of the layer 2 are coated with a gate oxide film 8 together and gate poly Si is placed on the oxide film. A region 7 of the lowermost section in the layer 2 is built up so that the concentration of impurities is comparatively high in order to decrease leak due to punch-through and back-channel. The regions 4 of the sides are regions having the high concentration of impurities formed in order to make the threshold of a side parasitic transistor TR higher than that of a surface TR, and the concentration of the impurities is approximately the same as the region 7. The concentration of the impurities of a region 9 of the surface is set properly conforming to the threshold, but the value is smaller than the region 7 or 4. There is no concentration difference of impurities in the lateral direction in a section under the gate oxide film functioning as the surface TR.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP7741680A JPS574164A (en) | 1980-06-09 | 1980-06-09 | Sos/mos transistor |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP7741680A JPS574164A (en) | 1980-06-09 | 1980-06-09 | Sos/mos transistor |
Publications (1)
Publication Number | Publication Date |
---|---|
JPS574164A true JPS574164A (en) | 1982-01-09 |
Family
ID=13633332
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP7741680A Pending JPS574164A (en) | 1980-06-09 | 1980-06-09 | Sos/mos transistor |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS574164A (en) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4662059A (en) * | 1985-09-19 | 1987-05-05 | Rca Corporation | Method of making stabilized silicon-on-insulator field-effect transistors having 100 oriented side and top surfaces |
Citations (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5286088A (en) * | 1976-01-13 | 1977-07-16 | Agency Of Ind Science & Technol | Manufacture of semiconductor device |
JPS5293277A (en) * | 1976-01-30 | 1977-08-05 | Matsushita Electric Ind Co Ltd | Semiconductor device and its manufacture |
-
1980
- 1980-06-09 JP JP7741680A patent/JPS574164A/en active Pending
Patent Citations (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5286088A (en) * | 1976-01-13 | 1977-07-16 | Agency Of Ind Science & Technol | Manufacture of semiconductor device |
JPS5293277A (en) * | 1976-01-30 | 1977-08-05 | Matsushita Electric Ind Co Ltd | Semiconductor device and its manufacture |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4662059A (en) * | 1985-09-19 | 1987-05-05 | Rca Corporation | Method of making stabilized silicon-on-insulator field-effect transistors having 100 oriented side and top surfaces |
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