JPS57197831A - Integration circuit chip - Google Patents

Integration circuit chip

Info

Publication number
JPS57197831A
JPS57197831A JP56082185A JP8218581A JPS57197831A JP S57197831 A JPS57197831 A JP S57197831A JP 56082185 A JP56082185 A JP 56082185A JP 8218581 A JP8218581 A JP 8218581A JP S57197831 A JPS57197831 A JP S57197831A
Authority
JP
Japan
Prior art keywords
circuit
frequency
signal
oscillation
delay time
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP56082185A
Other languages
English (en)
Japanese (ja)
Other versions
JPH0136597B2 (enrdf_load_stackoverflow
Inventor
Masaaki Yano
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
NEC Corp
Original Assignee
NEC Corp
Nippon Electric Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by NEC Corp, Nippon Electric Co Ltd filed Critical NEC Corp
Priority to JP56082185A priority Critical patent/JPS57197831A/ja
Publication of JPS57197831A publication Critical patent/JPS57197831A/ja
Publication of JPH0136597B2 publication Critical patent/JPH0136597B2/ja
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00—Error detection; Error correction; Monitoring
    • G06F11/22—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing
    • G06F11/24—Marginal checking or other specified testing methods not covered by G06F11/26, e.g. race tests

Landscapes

  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Theoretical Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Quality & Reliability (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
  • Semiconductor Integrated Circuits (AREA)
JP56082185A 1981-05-29 1981-05-29 Integration circuit chip Granted JPS57197831A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP56082185A JPS57197831A (en) 1981-05-29 1981-05-29 Integration circuit chip

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP56082185A JPS57197831A (en) 1981-05-29 1981-05-29 Integration circuit chip

Publications (2)

Publication Number Publication Date
JPS57197831A true JPS57197831A (en) 1982-12-04
JPH0136597B2 JPH0136597B2 (enrdf_load_stackoverflow) 1989-08-01

Family

ID=13767377

Family Applications (1)

Application Number Title Priority Date Filing Date
JP56082185A Granted JPS57197831A (en) 1981-05-29 1981-05-29 Integration circuit chip

Country Status (1)

Country Link
JP (1) JPS57197831A (enrdf_load_stackoverflow)

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS59181548A (ja) * 1983-03-31 1984-10-16 Fujitsu Ltd 半導体装置
JPS6089937A (ja) * 1983-10-24 1985-05-20 Nec Corp 集積回路装置
JPH02284080A (ja) * 1988-09-02 1990-11-21 Internatl Business Mach Corp <Ibm> 集積回路チツプとその動作速度検出方法
JPH03157950A (ja) * 1989-11-15 1991-07-05 Nec Corp 半導体集積回路

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS59181548A (ja) * 1983-03-31 1984-10-16 Fujitsu Ltd 半導体装置
JPS6089937A (ja) * 1983-10-24 1985-05-20 Nec Corp 集積回路装置
JPH02284080A (ja) * 1988-09-02 1990-11-21 Internatl Business Mach Corp <Ibm> 集積回路チツプとその動作速度検出方法
JPH03157950A (ja) * 1989-11-15 1991-07-05 Nec Corp 半導体集積回路

Also Published As

Publication number Publication date
JPH0136597B2 (enrdf_load_stackoverflow) 1989-08-01

Similar Documents

Publication Publication Date Title
JPS5580061A (en) Frequency measuring apparatus
DE3871425D1 (de) Integrierte schaltungsanordnung zur ueberwachung eines mitintegrierten oszillators.
JPS57197831A (en) Integration circuit chip
JPS57136107A (en) Ultrasonic thickness measuring method and apparatus
JPS57192876A (en) Measuring device for average frequency
DE69010870D1 (de) Spannungsgesteuerter Oszillator.
JPS57131085A (en) Ultrasonic wave measuring system
JPS57118184A (en) Time measuring device
JPS5717236A (en) Detector for synchronism
JPS5733364A (en) Voltage divider for high voltage
JPS57197478A (en) Measuring method for propagation delay time of integrated circuit
JPS55158516A (en) Ultrasonic type flow meter
JPS55115733A (en) Test system for frequency divider
SU143437A1 (ru) Способ измерени группового времени распространени
JPS5312215A (en) Pulse transfer circuit
JPS55142221A (en) Temperature detector
JPS567527A (en) High speed frequency division circuit
JPS5512455A (en) Ultrasonic level meter
GB2111685A (en) Apparatus for determining the ratio of two signal repetition rates
JPS5749261A (en) Integrated circuit device
JPS54128215A (en) Buffer memory unit
JPS5479672A (en) Temperature compensating electronic watch
JPS55147034A (en) Two phase pulse generator
JPS52123662A (en) Ic inspection circuit in electronic watches
JPS5333041A (en) Frequency step-multiplication circuit