JPS6463879A - Semiconductor integrated circuit - Google Patents

Semiconductor integrated circuit

Info

Publication number
JPS6463879A
JPS6463879A JP62221506A JP22150687A JPS6463879A JP S6463879 A JPS6463879 A JP S6463879A JP 62221506 A JP62221506 A JP 62221506A JP 22150687 A JP22150687 A JP 22150687A JP S6463879 A JPS6463879 A JP S6463879A
Authority
JP
Japan
Prior art keywords
circuit
ring oscillator
gate delay
lsi tester
terminal
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP62221506A
Other languages
Japanese (ja)
Inventor
Fumio Ikegami
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
NEC Corp
Original Assignee
NEC Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by NEC Corp filed Critical NEC Corp
Priority to JP62221506A priority Critical patent/JPS6463879A/en
Publication of JPS6463879A publication Critical patent/JPS6463879A/en
Pending legal-status Critical Current

Links

Landscapes

  • Testing Of Individual Semiconductor Devices (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
  • Semiconductor Integrated Circuits (AREA)
  • Analogue/Digital Conversion (AREA)

Abstract

PURPOSE:To measure a gate delay time with high accuracy using an LSI tester, by mounting a means for counting the oscillation frequency of a ring oscillator for measuring gate delay to convert the same to analogue voltage. CONSTITUTION:A semiconductor integrated circuit is constituted of a ring oscillator 1 consisting of (n) inverters 1-1-1-n, a frequency divider 2, an AND circuit 3, a counter circuit 4, a D/A converter 5 and an internal logical circuit 6. The divided frequency output of the ring oscillator 1 is inputted to one of the input terminals of the AND circuit 3 and an LSI tester is connected to the other input terminal through an input terminal 52 to input a pulse having a predetermined width. Then, the frequency dividing output of the ring oscillator 1 is gated by said pulse to be counted by a counter 4 and converted to analogue voltage by the D/A converter 5 to be outputted. By this constitution, only a terminal 53 is used as an output terminal and a gate delay time can be measured using the LSI tester.
JP62221506A 1987-09-03 1987-09-03 Semiconductor integrated circuit Pending JPS6463879A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP62221506A JPS6463879A (en) 1987-09-03 1987-09-03 Semiconductor integrated circuit

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP62221506A JPS6463879A (en) 1987-09-03 1987-09-03 Semiconductor integrated circuit

Publications (1)

Publication Number Publication Date
JPS6463879A true JPS6463879A (en) 1989-03-09

Family

ID=16767779

Family Applications (1)

Application Number Title Priority Date Filing Date
JP62221506A Pending JPS6463879A (en) 1987-09-03 1987-09-03 Semiconductor integrated circuit

Country Status (1)

Country Link
JP (1) JPS6463879A (en)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2002100962A (en) * 2000-09-21 2002-04-05 Texas Instr Japan Ltd Frequency-characteristic adjusting circuit
KR100812739B1 (en) * 2006-08-16 2008-03-12 삼성전기주식회사 Inspection device of radio frequency module and method thereof

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2002100962A (en) * 2000-09-21 2002-04-05 Texas Instr Japan Ltd Frequency-characteristic adjusting circuit
KR100812739B1 (en) * 2006-08-16 2008-03-12 삼성전기주식회사 Inspection device of radio frequency module and method thereof

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