JPS6463879A - Semiconductor integrated circuit - Google Patents
Semiconductor integrated circuitInfo
- Publication number
- JPS6463879A JPS6463879A JP62221506A JP22150687A JPS6463879A JP S6463879 A JPS6463879 A JP S6463879A JP 62221506 A JP62221506 A JP 62221506A JP 22150687 A JP22150687 A JP 22150687A JP S6463879 A JPS6463879 A JP S6463879A
- Authority
- JP
- Japan
- Prior art keywords
- circuit
- ring oscillator
- gate delay
- lsi tester
- terminal
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Landscapes
- Testing Of Individual Semiconductor Devices (AREA)
- Testing Or Measuring Of Semiconductors Or The Like (AREA)
- Semiconductor Integrated Circuits (AREA)
- Analogue/Digital Conversion (AREA)
Abstract
PURPOSE:To measure a gate delay time with high accuracy using an LSI tester, by mounting a means for counting the oscillation frequency of a ring oscillator for measuring gate delay to convert the same to analogue voltage. CONSTITUTION:A semiconductor integrated circuit is constituted of a ring oscillator 1 consisting of (n) inverters 1-1-1-n, a frequency divider 2, an AND circuit 3, a counter circuit 4, a D/A converter 5 and an internal logical circuit 6. The divided frequency output of the ring oscillator 1 is inputted to one of the input terminals of the AND circuit 3 and an LSI tester is connected to the other input terminal through an input terminal 52 to input a pulse having a predetermined width. Then, the frequency dividing output of the ring oscillator 1 is gated by said pulse to be counted by a counter 4 and converted to analogue voltage by the D/A converter 5 to be outputted. By this constitution, only a terminal 53 is used as an output terminal and a gate delay time can be measured using the LSI tester.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP62221506A JPS6463879A (en) | 1987-09-03 | 1987-09-03 | Semiconductor integrated circuit |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP62221506A JPS6463879A (en) | 1987-09-03 | 1987-09-03 | Semiconductor integrated circuit |
Publications (1)
Publication Number | Publication Date |
---|---|
JPS6463879A true JPS6463879A (en) | 1989-03-09 |
Family
ID=16767779
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP62221506A Pending JPS6463879A (en) | 1987-09-03 | 1987-09-03 | Semiconductor integrated circuit |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS6463879A (en) |
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2002100962A (en) * | 2000-09-21 | 2002-04-05 | Texas Instr Japan Ltd | Frequency-characteristic adjusting circuit |
KR100812739B1 (en) * | 2006-08-16 | 2008-03-12 | 삼성전기주식회사 | Inspection device of radio frequency module and method thereof |
-
1987
- 1987-09-03 JP JP62221506A patent/JPS6463879A/en active Pending
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2002100962A (en) * | 2000-09-21 | 2002-04-05 | Texas Instr Japan Ltd | Frequency-characteristic adjusting circuit |
KR100812739B1 (en) * | 2006-08-16 | 2008-03-12 | 삼성전기주식회사 | Inspection device of radio frequency module and method thereof |
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