JPS57175276A - Delayed time measuring circuit - Google Patents

Delayed time measuring circuit

Info

Publication number
JPS57175276A
JPS57175276A JP6031381A JP6031381A JPS57175276A JP S57175276 A JPS57175276 A JP S57175276A JP 6031381 A JP6031381 A JP 6031381A JP 6031381 A JP6031381 A JP 6031381A JP S57175276 A JPS57175276 A JP S57175276A
Authority
JP
Japan
Prior art keywords
delayed time
period
equal
points
circuit part
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP6031381A
Other languages
Japanese (ja)
Inventor
Hideyuki Obara
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Fujitsu Ltd
Original Assignee
Fujitsu Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Fujitsu Ltd filed Critical Fujitsu Ltd
Priority to JP6031381A priority Critical patent/JPS57175276A/en
Publication of JPS57175276A publication Critical patent/JPS57175276A/en
Pending legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G04—HOROLOGY
    • G04F—TIME-INTERVAL MEASURING
    • G04F10/00—Apparatus for measuring unknown time intervals by electric means
    • G04F10/06—Apparatus for measuring unknown time intervals by electric means by measuring phase

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Measurement Of Unknown Time Intervals (AREA)
  • Networks Using Active Elements (AREA)

Abstract

PURPOSE:To realize the measurement of the delayed time with high accuracy and an easy operation, by counting the period of an output signal at the time when the input and output signals of a circuit part to be measured are equal in phase and then measuring the frequency or the period. CONSTITUTION:The output frequency signal sent from a voltage control oscillator 1 is supplied to a circuit part 7 to be measured. Thus the phases of frequencies f1 and f2 are equal to each other for the two input signals of a phase comparator 2. Furthermore the line lengths l1 and l2 from points A and B through the comparator 2 are set equal or shortest. As a result, the points A and B are set equal in phase. In other words, the oscillator 1 oscillates with period equal to the delayed time between the points A and B. Then the frequency or the period is measurd for the output signal at the point B by a counter 6 which is connected to the point B. In such way, the delayed time of the circuit part 7 can be easily measured with high accuracy.
JP6031381A 1981-04-21 1981-04-21 Delayed time measuring circuit Pending JPS57175276A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP6031381A JPS57175276A (en) 1981-04-21 1981-04-21 Delayed time measuring circuit

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP6031381A JPS57175276A (en) 1981-04-21 1981-04-21 Delayed time measuring circuit

Publications (1)

Publication Number Publication Date
JPS57175276A true JPS57175276A (en) 1982-10-28

Family

ID=13138549

Family Applications (1)

Application Number Title Priority Date Filing Date
JP6031381A Pending JPS57175276A (en) 1981-04-21 1981-04-21 Delayed time measuring circuit

Country Status (1)

Country Link
JP (1) JPS57175276A (en)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP0294938A2 (en) * 1987-05-08 1988-12-14 Hewlett-Packard Company Exponential decay time constant measurement using frequency of offset-phase locked loop: system and method
CN103631133A (en) * 2013-12-17 2014-03-12 哈尔滨工程大学 Method and device for measuring transmission time of electric signals in double-frequency modulation wire

Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5344065A (en) * 1976-07-28 1978-04-20 Anritsu Electric Co Ltd Group time lag measuring device
JPS54152949A (en) * 1978-05-24 1979-12-01 Nec Corp Phase synchronous oscillation circuit
JPS5523476A (en) * 1978-08-09 1980-02-19 Fuji Electric Co Ltd Detection circuit device for ultrasonic propagation time
JPS5633584A (en) * 1979-08-27 1981-04-04 Fujitsu Ltd Measurement of time delay

Patent Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5344065A (en) * 1976-07-28 1978-04-20 Anritsu Electric Co Ltd Group time lag measuring device
JPS54152949A (en) * 1978-05-24 1979-12-01 Nec Corp Phase synchronous oscillation circuit
JPS5523476A (en) * 1978-08-09 1980-02-19 Fuji Electric Co Ltd Detection circuit device for ultrasonic propagation time
JPS5633584A (en) * 1979-08-27 1981-04-04 Fujitsu Ltd Measurement of time delay

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP0294938A2 (en) * 1987-05-08 1988-12-14 Hewlett-Packard Company Exponential decay time constant measurement using frequency of offset-phase locked loop: system and method
CN103631133A (en) * 2013-12-17 2014-03-12 哈尔滨工程大学 Method and device for measuring transmission time of electric signals in double-frequency modulation wire
CN103631133B (en) * 2013-12-17 2016-09-14 哈尔滨工程大学 Signal of telecommunication transmission time measurement method and device in a kind of double frequency modulation wire

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