JPS57197409A - Measuring method for film thickness of magnetic substance coated on both sides of high polymer film - Google Patents

Measuring method for film thickness of magnetic substance coated on both sides of high polymer film

Info

Publication number
JPS57197409A
JPS57197409A JP8317081A JP8317081A JPS57197409A JP S57197409 A JPS57197409 A JP S57197409A JP 8317081 A JP8317081 A JP 8317081A JP 8317081 A JP8317081 A JP 8317081A JP S57197409 A JPS57197409 A JP S57197409A
Authority
JP
Japan
Prior art keywords
sides
magnetic substance
rays
irradiated
film
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP8317081A
Other languages
English (en)
Japanese (ja)
Other versions
JPS6253044B2 (enrdf_load_stackoverflow
Inventor
Naoki Matsuura
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Rigaku Corp
Original Assignee
Rigaku Industrial Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Rigaku Industrial Corp filed Critical Rigaku Industrial Corp
Priority to JP8317081A priority Critical patent/JPS57197409A/ja
Publication of JPS57197409A publication Critical patent/JPS57197409A/ja
Publication of JPS6253044B2 publication Critical patent/JPS6253044B2/ja
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B15/00—Measuring arrangements characterised by the use of electromagnetic waves or particle radiation, e.g. by the use of microwaves, X-rays, gamma rays or electrons
    • G01B15/02—Measuring arrangements characterised by the use of electromagnetic waves or particle radiation, e.g. by the use of microwaves, X-rays, gamma rays or electrons for measuring thickness

Landscapes

  • Physics & Mathematics (AREA)
  • Electromagnetism (AREA)
  • General Physics & Mathematics (AREA)
  • Length-Measuring Devices Using Wave Or Particle Radiation (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
JP8317081A 1981-05-29 1981-05-29 Measuring method for film thickness of magnetic substance coated on both sides of high polymer film Granted JPS57197409A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP8317081A JPS57197409A (en) 1981-05-29 1981-05-29 Measuring method for film thickness of magnetic substance coated on both sides of high polymer film

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP8317081A JPS57197409A (en) 1981-05-29 1981-05-29 Measuring method for film thickness of magnetic substance coated on both sides of high polymer film

Publications (2)

Publication Number Publication Date
JPS57197409A true JPS57197409A (en) 1982-12-03
JPS6253044B2 JPS6253044B2 (enrdf_load_stackoverflow) 1987-11-09

Family

ID=13794793

Family Applications (1)

Application Number Title Priority Date Filing Date
JP8317081A Granted JPS57197409A (en) 1981-05-29 1981-05-29 Measuring method for film thickness of magnetic substance coated on both sides of high polymer film

Country Status (1)

Country Link
JP (1) JPS57197409A (enrdf_load_stackoverflow)

Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6228607A (ja) * 1985-07-30 1987-02-06 Seiko Instr & Electronics Ltd 高分子膜上の磁性体膜厚測定方法
DE3921825A1 (de) * 1988-07-01 1990-01-11 Fuji Photo Film Co Ltd Verfahren zum messen der dicke eines magnetischen aufzeichnungsmediums
JP2010169528A (ja) * 2009-01-22 2010-08-05 Japan Gore Tex Inc 蛍光ｘ線分析（ｘｒｆ）を用いた積層体の表裏を判別する方法
JP2018105859A (ja) * 2016-12-22 2018-07-05 マルバーン パナリティカル ビー ヴィ 層状サンプルのｘｒｆによる分析
CN111412847A (zh) * 2015-10-10 2020-07-14 江苏新思达电子有限公司 一种测量非导电材质涂装膜厚度的方法

Cited By (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6228607A (ja) * 1985-07-30 1987-02-06 Seiko Instr & Electronics Ltd 高分子膜上の磁性体膜厚測定方法
DE3921825A1 (de) * 1988-07-01 1990-01-11 Fuji Photo Film Co Ltd Verfahren zum messen der dicke eines magnetischen aufzeichnungsmediums
DE3921825C2 (de) * 1988-07-01 1999-02-25 Fuji Photo Film Co Ltd Verfahren zum Messen der Dicke eines magnetischen Aufzeichnungsmediums
JP2010169528A (ja) * 2009-01-22 2010-08-05 Japan Gore Tex Inc 蛍光ｘ線分析（ｘｒｆ）を用いた積層体の表裏を判別する方法
CN111412847A (zh) * 2015-10-10 2020-07-14 江苏新思达电子有限公司 一种测量非导电材质涂装膜厚度的方法
JP2018105859A (ja) * 2016-12-22 2018-07-05 マルバーン パナリティカル ビー ヴィ 層状サンプルのｘｒｆによる分析

Also Published As

Publication number Publication date
JPS6253044B2 (enrdf_load_stackoverflow) 1987-11-09

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