JPS57179745A - Method and device for measuring material property by ultrasonic wave - Google Patents

Method and device for measuring material property by ultrasonic wave

Info

Publication number
JPS57179745A
JPS57179745A JP56065536A JP6553681A JPS57179745A JP S57179745 A JPS57179745 A JP S57179745A JP 56065536 A JP56065536 A JP 56065536A JP 6553681 A JP6553681 A JP 6553681A JP S57179745 A JPS57179745 A JP S57179745A
Authority
JP
Japan
Prior art keywords
circuit
ultrasonic wave
scanning
reflected wave
transducer
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP56065536A
Other languages
English (en)
Other versions
JPH026022B2 (ja
Inventor
Hirohide Miwa
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Fujitsu Ltd
Original Assignee
Fujitsu Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Fujitsu Ltd filed Critical Fujitsu Ltd
Priority to JP56065536A priority Critical patent/JPS57179745A/ja
Priority to US06/372,547 priority patent/US4452082A/en
Priority to EP82302228A priority patent/EP0064399B1/en
Priority to DE8282302228T priority patent/DE3277032D1/de
Publication of JPS57179745A publication Critical patent/JPS57179745A/ja
Publication of JPH026022B2 publication Critical patent/JPH026022B2/ja
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01S—RADIO DIRECTION-FINDING; RADIO NAVIGATION; DETERMINING DISTANCE OR VELOCITY BY USE OF RADIO WAVES; LOCATING OR PRESENCE-DETECTING BY USE OF THE REFLECTION OR RERADIATION OF RADIO WAVES; ANALOGOUS ARRANGEMENTS USING OTHER WAVES
    • G01S7/00—Details of systems according to groups G01S13/00, G01S15/00, G01S17/00
    • G01S7/52—Details of systems according to groups G01S13/00, G01S15/00, G01S17/00 of systems according to group G01S15/00
    • G01S7/52017—Details of systems according to groups G01S13/00, G01S15/00, G01S17/00 of systems according to group G01S15/00 particularly adapted to short-range imaging
    • G01S7/52023—Details of receivers
    • G01S7/52036—Details of receivers using analysis of echo signal for target characterisation
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N29/00—Investigating or analysing materials by the use of ultrasonic, sonic or infrasonic waves; Visualisation of the interior of objects by transmitting ultrasonic or sonic waves through the object
    • G01N29/04—Analysing solids
    • G01N29/11—Analysing solids by measuring attenuation of acoustic waves
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N29/00—Investigating or analysing materials by the use of ultrasonic, sonic or infrasonic waves; Visualisation of the interior of objects by transmitting ultrasonic or sonic waves through the object
    • G01N29/34—Generating the ultrasonic, sonic or infrasonic waves, e.g. electronic circuits specially adapted therefor
    • G01N29/348—Generating the ultrasonic, sonic or infrasonic waves, e.g. electronic circuits specially adapted therefor with frequency characteristics, e.g. single frequency signals, chirp signals
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2291/00—Indexing codes associated with group G01N29/00
    • G01N2291/02—Indexing codes associated with the analysed material
    • G01N2291/023—Solids
    • G01N2291/0234—Metals, e.g. steel

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Chemical & Material Sciences (AREA)
  • Immunology (AREA)
  • Health & Medical Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Engineering & Computer Science (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Pathology (AREA)
  • Acoustics & Sound (AREA)
  • Computer Networks & Wireless Communication (AREA)
  • Radar, Positioning & Navigation (AREA)
  • Remote Sensing (AREA)
  • Ultra Sonic Daignosis Equipment (AREA)
  • Investigating Or Analyzing Materials By The Use Of Ultrasonic Waves (AREA)
JP56065536A 1981-04-30 1981-04-30 Method and device for measuring material property by ultrasonic wave Granted JPS57179745A (en)

Priority Applications (4)

Application Number Priority Date Filing Date Title
JP56065536A JPS57179745A (en) 1981-04-30 1981-04-30 Method and device for measuring material property by ultrasonic wave
US06/372,547 US4452082A (en) 1981-04-30 1982-04-28 Ultrasonic measuring method
EP82302228A EP0064399B1 (en) 1981-04-30 1982-04-29 Ultrasonic measuring method
DE8282302228T DE3277032D1 (en) 1981-04-30 1982-04-29 Ultrasonic measuring method

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP56065536A JPS57179745A (en) 1981-04-30 1981-04-30 Method and device for measuring material property by ultrasonic wave

Publications (2)

Publication Number Publication Date
JPS57179745A true JPS57179745A (en) 1982-11-05
JPH026022B2 JPH026022B2 (ja) 1990-02-07

Family

ID=13289828

Family Applications (1)

Application Number Title Priority Date Filing Date
JP56065536A Granted JPS57179745A (en) 1981-04-30 1981-04-30 Method and device for measuring material property by ultrasonic wave

Country Status (4)

Country Link
US (1) US4452082A (ja)
EP (1) EP0064399B1 (ja)
JP (1) JPS57179745A (ja)
DE (1) DE3277032D1 (ja)

Cited By (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS57209040A (en) * 1981-05-29 1982-12-22 Tokyo Shibaura Electric Co Ultrasonic diagnostic apparatus
JPS59203549A (ja) * 1983-04-30 1984-11-17 中山　淑 超音波診断装置
JPS60153849A (ja) * 1983-12-16 1985-08-13 ソシエテ　アノニム　セージーアール　ウルトラソニツク 媒体の構造を特徴付けする方法及びこの方法を実施する装置
JPS61237055A (ja) * 1985-04-15 1986-10-22 Bridgestone Corp 材料物性測定方法
JP2011000344A (ja) * 2009-06-22 2011-01-06 Nidek Co Ltd 非接触式超音波眼圧計
JP2011087900A (ja) * 2009-03-31 2011-05-06 Nidek Co Ltd 非接触式超音波眼圧計
JP5451764B2 (ja) * 2009-08-05 2014-03-26 帝人ファーマ株式会社 照射位置確認機能を有する超音波検出装置及びその方法
CN108326723A (zh) * 2018-01-24 2018-07-27 廊坊京磁精密材料有限公司 钕铁硼小零件倒角设备

Families Citing this family (42)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5855850A (ja) * 1981-09-30 1983-04-02 Fujitsu Ltd 反射超音波による媒体特性測定方法
JPS5919852A (ja) * 1982-07-26 1984-02-01 Fujitsu Ltd 超音波生体組織特性測定方式
US4575799A (en) * 1983-03-23 1986-03-11 Fujitsu Limited Ultrasonic living body tissue characterization system
FR2554238B1 (fr) * 1983-10-28 1986-02-28 Labo Electronique Physique Appareil d'exploration de milieux par echographie ultrasonore
JPS60176629A (ja) * 1984-02-23 1985-09-10 テルモ株式会社 超音波測定装置
FR2563918B1 (fr) * 1984-04-10 1987-06-05 Labo Electronique Physique Appareil d'exploration de milieux par echographie ultrasonore
US4621645A (en) * 1984-09-14 1986-11-11 General Electric Company Method of estimating tissue attenuation using wideband ultrasonic pulse and apparatus for use therein
FR2580818B1 (fr) * 1985-04-19 1987-06-05 Labo Electronique Physique Appareil d'examen de milieux par echographie ultrasonore
JPH0613027B2 (ja) * 1985-06-26 1994-02-23 富士通株式会社 超音波媒体特性値測定装置
US4649750A (en) * 1985-09-13 1987-03-17 The United States Of America As Represented By The Administrator Of The National Aeronautics And Space Administration Acoustic radiation stress measurement
US4817015A (en) * 1985-11-18 1989-03-28 The United States Government As Represented By The Secretary Of The Health And Human Services High speed texture discriminator for ultrasonic imaging
US4873984A (en) * 1986-05-30 1989-10-17 Hewlett-Packard Company Techniques for calculating ultrasonic integrated backscatter using frequency or time domain techniques
JPH0681616B2 (ja) * 1988-05-26 1994-10-19 淑 中山 超音波診断装置
US5410516A (en) * 1988-09-01 1995-04-25 Schering Aktiengesellschaft Ultrasonic processes and circuits for performing them
DE3829999A1 (de) 1988-09-01 1990-03-15 Schering Ag Ultraschallverfahren und schaltungen zu deren durchfuehrung
US5228004A (en) * 1988-12-21 1993-07-13 Ngk Insulators, Ltd. Ultrasonic testing method
EP0377986A3 (en) * 1988-12-21 1990-10-31 Ngk Insulators, Ltd. Ultrasonic testing method
US5305239A (en) * 1989-10-04 1994-04-19 The Texas A&M University System Ultrasonic non-destructive evaluation of thin specimens
JPH04188058A (ja) * 1990-11-21 1992-07-06 Olympus Optical Co Ltd 超音波探傷装置
US5742036A (en) * 1994-10-04 1998-04-21 Rockwell International Corporation Method for marking, capturing and decoding machine-readable matrix symbols using magneto-optic imaging techniques
US5663502A (en) * 1994-10-18 1997-09-02 Hitachi, Ltd. Method and apparatus for measuring thickness of layer using acoustic waves
US5678553A (en) * 1994-11-01 1997-10-21 Schering Aktiengesellschaft Ultrasonic processes and circuits for carrying out those processes
JP3639352B2 (ja) * 1995-06-28 2005-04-20 富士通株式会社 波動解析方法及びその装置
FR2752461B1 (fr) * 1996-08-14 1998-11-06 Dory Jacques Procede et dispositif pour le traitement de signaux representatifs d'ondes reflechies ou transmises par une structure volumique en vue d'effectuer une exploration et une analyse de cette structure
US5868676A (en) * 1996-10-25 1999-02-09 Acuson Corporation Interactive doppler processor and method
US6769307B1 (en) 1997-11-21 2004-08-03 Perceptron, Inc. Method and system for processing measurement signals to obtain a value for a physical parameter
US6128081A (en) * 1996-11-22 2000-10-03 Perceptron, Inc. Method and system for measuring a physical parameter of at least one layer of a multilayer article without damaging the article and sensor head for use therein
WO1998022801A1 (en) * 1996-11-22 1998-05-28 Autospect, Inc. Physical parameter measuring apparatus and method thereof
AU1751999A (en) * 1997-12-22 1999-07-12 Kare Christiansen A method and an apparatus for investigating material properties of bone using ultrasound
WO1999034638A1 (en) 1997-12-23 1999-07-08 Nokia Networks Oy Clock generating method and apparatus for an asynchronous transmission
JP3581262B2 (ja) * 1998-10-07 2004-10-27 有限会社オープンハート 超音波波形を利用した媒質中の異物の非破壊検出方法
US7481769B2 (en) * 2003-09-30 2009-01-27 Fujifilm Corporation Ultrasonic diagnosing apparatus
WO2006054330A1 (ja) * 2004-11-16 2006-05-26 H & B System Co., Ltd. 共振現象を利用した超音波探査方法およびその装置
WO2006131022A1 (en) * 2005-06-07 2006-12-14 Intel Corporation Ultrasonic tracking
JP2008545123A (ja) * 2005-07-06 2008-12-11 ナショナル・リサーチ・カウンシル・オブ・カナダ 超音波減衰量を使用して材料特性を決定する方法及びシステム
US7353709B2 (en) 2005-07-06 2008-04-08 National Research Council Of Canada Method and system for determining material properties using ultrasonic attenuation
FR2992426B1 (fr) * 2012-06-20 2014-07-18 Snecma Procede de determination de la contrainte a la rupture par cisaillement d'une piece d'epaisseur determinee
AR091741A1 (es) * 2012-07-13 2015-02-25 Sicpa Holding Sa Metodo para autenticar un reloj
EP2872950B1 (en) 2012-07-13 2017-12-06 Sicpa Holding SA Method and system for authenticating a timepiece
AR091742A1 (es) 2012-07-13 2015-02-25 Sicpa Holding Sa Metodo para autenticar un reloj
JP6440151B2 (ja) 2013-08-23 2018-12-19 シクパ ホルディング ソシエテ アノニムＳｉｃｐａ Ｈｏｌｄｉｎｇ Ｓａ デバイスを認証するための方法及びシステム
CN112051328B (zh) * 2020-09-02 2024-06-07 贵州交通职业技术学院 一种气体声弛豫吸收系数的测量方法

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS578445A (en) * 1980-06-20 1982-01-16 Hitachi Ltd Method and device of non-destructive inspection by frequency spectral analysis

Family Cites Families (14)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3538753A (en) * 1968-04-24 1970-11-10 Us Army Ultrasonic spectroscope
FR2049304A5 (ja) * 1969-06-06 1971-03-26 Realisations Ultrasoniques Sa
GB1332898A (en) * 1969-10-15 1973-10-10 Atomic Energy Authority Uk Nondestructive examination of materials
US3662589A (en) * 1971-02-02 1972-05-16 Atomic Energy Commission Ultrasonic flaw determination by spectral analysis
AU490105B2 (en) * 1972-06-08 1974-12-05 Commonwealth Of Australia, The 'ultrasonic echogram display' accompanied by a provisional specification
US3815409A (en) * 1973-02-15 1974-06-11 A Macovski Focused sonic imaging system
US3996791A (en) * 1975-04-24 1976-12-14 Krautkramer-Branson, Incorporated Ultrasonic test method and apparatus utilizing scattered signals
US4016750B1 (en) * 1975-11-06 1994-04-05 Stanford Research Inst Ultrasonic imaging method and apparatus
US4063549A (en) * 1975-12-22 1977-12-20 Technicon Instruments Corporation Ultrasonic method and apparatus for imaging and characterization of bodies
US4106327A (en) * 1977-11-22 1978-08-15 The United States Of America As Represented By The United States Department Of Energy Anisotropic determination and correction for ultrasonic flaw detection by spectral analysis
US4228804A (en) * 1978-02-28 1980-10-21 Case Western Reserve University Diagnostic ultrasonography utilizing frequency spectrum analysis presented in terms of B-scan color patterns or X-Y graph displays
FR2429430A1 (fr) * 1978-06-21 1980-01-18 Anvar Procede et appareil destines a l'evaluation de fissures, en particulier a la mesure de leur longueur
US4322974A (en) * 1980-02-05 1982-04-06 New York University Ultrasound scanner
US4428235A (en) * 1980-06-20 1984-01-31 Hitachi, Ltd. Non-destructive inspection by frequency spectrum resolution

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS578445A (en) * 1980-06-20 1982-01-16 Hitachi Ltd Method and device of non-destructive inspection by frequency spectral analysis

Cited By (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS57209040A (en) * 1981-05-29 1982-12-22 Tokyo Shibaura Electric Co Ultrasonic diagnostic apparatus
JPS59203549A (ja) * 1983-04-30 1984-11-17 中山　淑 超音波診断装置
JPH0216140B2 (ja) * 1983-04-30 1990-04-16 Kyoshi Nakayama
JPS60153849A (ja) * 1983-12-16 1985-08-13 ソシエテ　アノニム　セージーアール　ウルトラソニツク 媒体の構造を特徴付けする方法及びこの方法を実施する装置
JPS61237055A (ja) * 1985-04-15 1986-10-22 Bridgestone Corp 材料物性測定方法
JP2011087900A (ja) * 2009-03-31 2011-05-06 Nidek Co Ltd 非接触式超音波眼圧計
JP2011000344A (ja) * 2009-06-22 2011-01-06 Nidek Co Ltd 非接触式超音波眼圧計
JP5451764B2 (ja) * 2009-08-05 2014-03-26 帝人ファーマ株式会社 照射位置確認機能を有する超音波検出装置及びその方法
CN108326723A (zh) * 2018-01-24 2018-07-27 廊坊京磁精密材料有限公司 钕铁硼小零件倒角设备

Also Published As

Publication number Publication date
DE3277032D1 (en) 1987-09-24
EP0064399A3 (en) 1984-06-06
JPH026022B2 (ja) 1990-02-07
EP0064399A2 (en) 1982-11-10
EP0064399B1 (en) 1987-08-19
US4452082A (en) 1984-06-05

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