JPS57175201A - Length measuring original device and blank for said device - Google Patents
Length measuring original device and blank for said deviceInfo
- Publication number
- JPS57175201A JPS57175201A JP5968881A JP5968881A JPS57175201A JP S57175201 A JPS57175201 A JP S57175201A JP 5968881 A JP5968881 A JP 5968881A JP 5968881 A JP5968881 A JP 5968881A JP S57175201 A JPS57175201 A JP S57175201A
- Authority
- JP
- Japan
- Prior art keywords
- measuring
- stage
- length measuring
- length
- blank
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B3/00—Measuring instruments characterised by the use of mechanical techniques
- G01B3/30—Bars, blocks, or strips in which the distance between a pair of faces is fixed, although it may be preadjustable, e.g. end measure, feeler strip
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B1/00—Measuring instruments characterised by the selection of material therefor
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Length-Measuring Instruments Using Mechanical Means (AREA)
Abstract
PURPOSE:To confirm the accurate working of a measuring device, by using a length measuring original device having a standard length measuring pattern formed on a substrate which has an extremely small linear expansion coefficient. CONSTITUTION:The blank for length measuring original device has a chromium film 2 formed on a glass substrate 1 having <=2X10<-7>/ deg.C (0-100 deg.C) linear expansion coefficient. The measuring original device is first put on a stage, and then the laser condensed at a microspot is irradiated at the measuring position 3. Then the scattered beams caused to the position 3 are caught to detect the position. Thereafter, the stage is moved to detect the measuring position 4 in the same way. The measurement of length is possible by obtaining the moving extent of the stage, and this operation is repeated several times to confirm the reproducibility of a measuring device. As a result, the accurate working can be confirmed for the measuring device.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP5968881A JPS57175201A (en) | 1981-04-22 | 1981-04-22 | Length measuring original device and blank for said device |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP5968881A JPS57175201A (en) | 1981-04-22 | 1981-04-22 | Length measuring original device and blank for said device |
Publications (1)
Publication Number | Publication Date |
---|---|
JPS57175201A true JPS57175201A (en) | 1982-10-28 |
Family
ID=13120392
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP5968881A Pending JPS57175201A (en) | 1981-04-22 | 1981-04-22 | Length measuring original device and blank for said device |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS57175201A (en) |
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2002031524A (en) * | 2000-07-18 | 2002-01-31 | Toray Ind Inc | Standard plate for calibrating length measuring instrument, method of calibration for instrumental error and method of manufacturing plasma display panel |
DE19755608B4 (en) * | 1997-12-15 | 2012-12-06 | Volkswagen Ag | Use of a device and method for calibrating a scale |
-
1981
- 1981-04-22 JP JP5968881A patent/JPS57175201A/en active Pending
Cited By (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
DE19755608B4 (en) * | 1997-12-15 | 2012-12-06 | Volkswagen Ag | Use of a device and method for calibrating a scale |
JP2002031524A (en) * | 2000-07-18 | 2002-01-31 | Toray Ind Inc | Standard plate for calibrating length measuring instrument, method of calibration for instrumental error and method of manufacturing plasma display panel |
JP4554778B2 (en) * | 2000-07-18 | 2010-09-29 | パナソニック株式会社 | Machine difference verification method and plasma display panel manufacturing method |
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