JPS57101728A - Method for measuring surface temperature of body - Google Patents
Method for measuring surface temperature of bodyInfo
- Publication number
- JPS57101728A JPS57101728A JP55178559A JP17855980A JPS57101728A JP S57101728 A JPS57101728 A JP S57101728A JP 55178559 A JP55178559 A JP 55178559A JP 17855980 A JP17855980 A JP 17855980A JP S57101728 A JPS57101728 A JP S57101728A
- Authority
- JP
- Japan
- Prior art keywords
- light
- diffused
- reflection coefficient
- temperature
- reflected
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 230000005855 radiation Effects 0.000 abstract 3
- 230000001678 irradiating effect Effects 0.000 abstract 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J5/00—Radiation pyrometry, e.g. infrared or optical thermometry
- G01J5/52—Radiation pyrometry, e.g. infrared or optical thermometry using comparison with reference sources, e.g. disappearing-filament pyrometer
Abstract
PURPOSE:To make it possible to measure the temperature of the body accurately by radiation temperature measuring method, by irradiating light on the surface of the body, and measuring a diffused reflection coefficient from a ratio of the mirror reflected light and the diffused reflected light around said light by an on-line method. CONSTITUTION:The energy radiated from the body 10 is directly inputted to a radio meter 16, or it is reflected by a reflecting mirror 12 and the surface of the body 10 and inputted to a radio meter 16. Directly inputted radiation energy E1 and E2 which is the sum of the E1 and the radiation energy which is inputted after the reflection are measured. The light B is irradiated on the surface of the body 10 and reflected by the mirror surface, and the light I1 is obtained. The ratio of the I1 and the diffused reflected light I2 around the I1 is obtained. Then, the diffused reflection coefficient of the surface of the body 10 is obtained. The surface temperature of the body 10 is obtained from said radiated energy E1 and E2 and the diffused reflection coefficient P. For example, a measuring device 42 of the diffused reflection coefficient P is provided at the input side of a furnace 40, a sensor part 44 is provided at the output side, and emissivity epsilon of the strip 10 are the temperature T are computed by a computing device 46.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP55178559A JPS6049852B2 (en) | 1980-12-17 | 1980-12-17 | How to measure object surface temperature |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP55178559A JPS6049852B2 (en) | 1980-12-17 | 1980-12-17 | How to measure object surface temperature |
Publications (2)
Publication Number | Publication Date |
---|---|
JPS57101728A true JPS57101728A (en) | 1982-06-24 |
JPS6049852B2 JPS6049852B2 (en) | 1985-11-05 |
Family
ID=16050597
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP55178559A Expired JPS6049852B2 (en) | 1980-12-17 | 1980-12-17 | How to measure object surface temperature |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS6049852B2 (en) |
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US6953281B2 (en) * | 2001-04-21 | 2005-10-11 | Robert Bosch Gmbh | Method for determining temperatures on semiconductor components |
CN115265825A (en) * | 2022-07-06 | 2022-11-01 | 东北大学 | Inner surface temperature measuring method and device, storage medium and terminal |
-
1980
- 1980-12-17 JP JP55178559A patent/JPS6049852B2/en not_active Expired
Cited By (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US6953281B2 (en) * | 2001-04-21 | 2005-10-11 | Robert Bosch Gmbh | Method for determining temperatures on semiconductor components |
CN115265825A (en) * | 2022-07-06 | 2022-11-01 | 东北大学 | Inner surface temperature measuring method and device, storage medium and terminal |
CN115265825B (en) * | 2022-07-06 | 2024-04-16 | 东北大学 | Method and device for measuring temperature of inner surface, storage medium and terminal |
Also Published As
Publication number | Publication date |
---|---|
JPS6049852B2 (en) | 1985-11-05 |
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