CN115265825B - Method and device for measuring temperature of inner surface, storage medium and terminal - Google Patents
Method and device for measuring temperature of inner surface, storage medium and terminal Download PDFInfo
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Abstract
The invention discloses an inner surface temperature measurement method and device, a storage medium and a terminal, relates to the technical field of temperature detection, and mainly aims to solve the problem of low accuracy of inner surface temperature measurement. The method mainly comprises the steps of obtaining actual measured temperature values of a plurality of target points in an inner surface to be measured; respectively initializing real temperature estimated values corresponding to the target points; and taking the real temperature estimated value as an iteration variable, establishing an iteration relation based on a corresponding relation between the measured temperature estimated value and the real temperature estimated value and a residual error between the measured temperature estimated value and the real value, obtaining a final real temperature estimated value of the target points through iterative calculation, taking the final real temperature estimated value as an internal surface temperature measuring result, and determining the corresponding relation between the measured temperature estimated value and the real temperature estimated value based on an effective emissivity model. The method is mainly used for determining the temperature of the inner surface.
Description
Technical Field
The present invention relates to the field of temperature detection technologies, and in particular, to a method and apparatus for measuring an internal surface temperature, a storage medium, and a terminal.
Background
Surface temperature determination is a very important measurement item in industrial production, and particularly in the fields of metallurgy, petrochemical industry, aerospace, energy sources, materials, electric power and the like, the surface temperature determination occupies a very important place. For example, in gas turbines known in the equipment manufacturing industry as "industrial crown bright beads", each 1% increase in temperature, a 15% decrease in blade strength; the temperature of a filament in the field of illumination is higher than the rated temperature by 1%, and the service life is shortened by 25%; in the field of aerospace, ground wind tunnel experiments and engine test runs, temperature is a key index for evaluating and improving engine performance. Therefore, the accurate measurement of the surface temperature has important significance in the aspects of improving the quality and the performance of products, saving energy, reducing consumption, safety production and the like.
The surface temperature determination method includes both contact and non-contact, wherein the non-contact surface temperature determination method is widely used in industrial production because it is not affected by the motion state, corrosiveness, etc. of the object to be measured. The non-contact surface temperature determining method is used for determining the temperature of the object to be measured based on the Planck blackbody radiation law by detecting the radiation of the surface of the object to be measured, but when the surface to be measured is a cavity or an inner surface of a complex plane, the accuracy of temperature measurement is lower.
Disclosure of Invention
In view of this, the present invention provides a method and apparatus for measuring temperature of an inner surface, a storage medium, and a terminal, and aims to solve the problem that the accuracy of temperature measurement is low for the inner surface of a cavity structure or the inner surface of a plane intersection structure in the prior art.
According to one aspect of the present invention, there is provided an internal surface temperature measurement method comprising:
acquiring actual measured temperature values of a plurality of target points in the inner surface to be measured;
respectively initializing real temperature estimated values corresponding to the target points;
and taking the real temperature estimated value as an iteration variable, establishing an iteration relation based on a corresponding relation between the measured temperature estimated value and the real temperature estimated value and a residual error between the measured temperature estimated value and the real value, obtaining a final real temperature estimated value of the target points through iterative calculation, taking the final real temperature estimated value as an internal surface temperature measuring result, and determining the corresponding relation between the measured temperature estimated value and the real temperature estimated value based on an effective emissivity model.
Further, before the obtaining the actual measured temperature values of the target points in the inner surface to be measured, the method further includes:
acquiring structural feature data, material optical feature data and temperature feature data of the inner surface to be detected;
constructing a structural model of the inner surface to be detected based on the structural feature data and the temperature feature data, and constructing a beam tracking model based on the material optical feature data and the structural model;
and constructing an effective emissivity model based on the structural model and the beam tracking model, wherein the effective emissivity model is used for calculating the effective emissivity of any target point position according to the temperature distribution of the inner surface to be detected.
Further, taking the real temperature estimated value as an iteration variable, establishing an iteration relation based on a corresponding relation between the measured temperature estimated value and the real temperature estimated value and a residual error between the measured temperature estimated value and the real value, and obtaining final real temperature estimated values of the target points through iterative calculation, wherein the method comprises the following steps:
calculating according to the actual temperature estimated value to obtain a measured temperature estimated value;
carrying out residual calculation on the estimated value of the measured temperature and the actual value of the measured temperature to obtain a residual result;
if the residual result is larger than a preset threshold, correcting the real temperature estimated value according to the residual result and the iterative relation, and repeating the step of calculating the measured temperature estimated value according to the real temperature estimated value;
and if the residual error result of the measured temperature estimated value and the measured temperature actual value is smaller than or equal to the preset threshold value, taking the actual temperature estimated value as an inner surface temperature measurement result.
Further, the calculating according to the actual temperature estimated value to obtain a measured temperature estimated value includes:
obtaining a temperature distribution estimation result of the inner surface to be measured by carrying out interpolation calculation on the real temperature estimation value;
calculating the effective emissivity of the inner surface to be measured according to the temperature distribution by utilizing a pre-constructed effective emissivity model;
and calculating to obtain a measured temperature estimated value according to the effective emissivity and the temperature measurement principle.
Further, after the residual calculation is performed on the estimated value of the measured temperature and the actual value of the measured temperature to obtain a residual result, the method further includes:
converting a residual equation corresponding to the actual measured temperature value and the estimated measured temperature value into a multi-element nonlinear objective function;
and correcting the real temperature estimated value according to the iterative relation of the multi-element nonlinear objective function design.
According to another aspect of the present invention, there is provided an internal surface temperature measuring device including:
the acquisition module is used for initializing the real temperature estimated values corresponding to the target point positions respectively;
the initialization module is used for initializing the real temperature estimation values of the target points respectively;
the calculation module is used for taking the real temperature estimated value as an iteration variable, establishing an iteration relation based on the corresponding relation between the measured temperature estimated value and the real temperature estimated value and the residual error between the measured temperature estimated value and the real value, obtaining final real temperature estimated values of the target points through iterative calculation, taking the final real temperature estimated values as an internal surface temperature measurement result, and determining the corresponding relation between the measured temperature estimated value and the real temperature estimated value based on an effective emissivity model.
Further, the apparatus further comprises:
the acquisition module is also used for acquiring structural characteristic data, material optical characteristic data and temperature characteristic data of the inner surface to be detected;
the first construction module is used for constructing a structural model of the inner surface to be detected based on the structural feature data and the temperature feature data, and constructing a beam tracking model based on the material optical feature data and the structural model;
the second construction module is used for constructing an effective emissivity model based on the structure model and the beam tracking model, and the effective emissivity model is used for calculating the effective emissivity of any target point position according to the temperature distribution of the inner surface to be detected.
Further, the computing module includes:
the first calculation unit is used for calculating a measured temperature estimated value according to the real temperature estimated value;
the second calculation unit is used for carrying out residual calculation on the estimated value of the measured temperature and the actual value of the measured temperature to obtain a residual result;
the third calculation unit is used for correcting the real temperature estimated value according to the residual error result and the iteration relation if the residual error result is larger than a preset threshold value, and repeating the step of calculating the measured temperature estimated value according to the real temperature estimated value;
and the determining unit is used for taking the real temperature estimated value as an internal surface temperature measurement result if the residual result of the measured temperature estimated value and the measured temperature actual value is smaller than or equal to the preset threshold value.
Further, in a specific application scenario, the first calculating unit is configured to obtain a temperature distribution estimation result of the inner surface to be measured by performing interpolation calculation on the actual temperature estimation value;
calculating the effective emissivity of the inner surface to be measured according to the temperature distribution by utilizing a pre-constructed effective emissivity model;
and calculating to obtain a measured temperature estimated value according to the effective emissivity and the temperature measurement principle.
Further, the apparatus further comprises:
the conversion module is used for converting a residual equation corresponding to the actual measured temperature value and the estimated measured temperature value into a multi-element nonlinear objective function;
the calculation module is also used for correcting the real temperature estimated value according to the iterative relation of the multi-element nonlinear objective function design.
According to still another aspect of the present invention, there is provided a storage medium having stored therein at least one executable instruction for causing a processor to perform operations corresponding to the above-described internal surface temperature measurement method.
According to still another aspect of the present invention, there is provided a terminal including: the device comprises a processor, a memory, a communication interface and a communication bus, wherein the processor, the memory and the communication interface complete communication with each other through the communication bus;
the memory is used for storing at least one executable instruction, and the executable instruction enables the processor to execute the operation corresponding to the inner surface temperature measuring method.
By means of the technical scheme, the technical scheme provided by the embodiment of the invention has at least the following advantages:
the embodiment of the invention provides a method and a device for measuring the temperature of an inner surface, a storage medium and a terminal; respectively initializing the real temperature estimation values of the target points; and taking the real temperature estimated value as an iteration variable, establishing an iteration relation based on a corresponding relation between the measured temperature estimated value and the real temperature estimated value and a residual error between the measured temperature estimated value and the real value, obtaining a final real temperature estimated value of the target points through iterative calculation, taking the final real temperature estimated value as an internal surface temperature measurement result, wherein the corresponding relation between the measured temperature estimated value and the real temperature estimated value is determined based on an effective emissivity model, fully analyzing the influence of reflected radiation generated by a cavity effect on the accuracy of the measured temperature, eliminating the influence of the reflected radiation on the inaccuracy of the measured temperature based on the ideas of active temperature correction and inversion reasoning, and obtaining the real temperature estimated value which is closer to the real temperature of the internal surface to be measured, thereby improving the accuracy of the determined internal surface temperature value.
The foregoing description is only an overview of the present invention, and is intended to be implemented in accordance with the teachings of the present invention in order that the same may be more clearly understood and to make the same and other objects, features and advantages of the present invention more readily apparent.
Drawings
Various other advantages and benefits will become apparent to those of ordinary skill in the art upon reading the following detailed description of the preferred embodiments. The drawings are only for purposes of illustrating the preferred embodiments and are not to be construed as limiting the invention. Also, like reference numerals are used to designate like parts throughout the figures. In the drawings:
FIG. 1 shows a flow chart of an internal surface temperature measurement method provided by an embodiment of the invention;
fig. 2 is a schematic diagram of a temperature measurement principle of a temperature measurement device according to an embodiment of the present invention;
FIG. 3 illustrates a schematic view of an exemplary internal surface structure provided by an embodiment of the present invention;
FIG. 4 is a flow chart of another method for measuring the temperature of an inner surface according to an embodiment of the present invention;
FIG. 5 shows a flow chart of yet another method for measuring the temperature of an interior surface provided by an embodiment of the present invention;
FIG. 6 shows a block diagram of an internal surface temperature measurement device according to an embodiment of the present invention;
fig. 7 shows a schematic structural diagram of a terminal according to an embodiment of the present invention.
Detailed Description
Exemplary embodiments of the present disclosure will be described in more detail below with reference to the accompanying drawings. While exemplary embodiments of the present disclosure are shown in the drawings, it should be understood that the present disclosure may be embodied in various forms and should not be limited to the embodiments set forth herein. Rather, these embodiments are provided so that this disclosure will be thorough and complete, and will fully convey the scope of the disclosure to those skilled in the art.
Aiming at the existing non-contact surface temperature determining method, the temperature of the object is determined based on the Planckian blackbody radiation law by detecting the radiation of the surface of the object to be measured, but when the surface to be measured is a cavity or the inner surface of a complex plane, the accuracy of temperature measurement is lower. The embodiment of the invention provides an inner surface temperature measuring method, as shown in fig. 1, which comprises the following steps:
101. and obtaining actual measured temperature values of a plurality of target points in the inner surface to be measured.
In the embodiment of the invention, the actual measured temperature value is a plurality of temperature values obtained by measuring a plurality of target points in the inner surface to be measured by using temperature measuring equipment, wherein the plurality of target points can be set according to the temperature distribution characteristics or can be set randomly; the temperature measuring device may be a brightness thermometer, and the embodiment of the present invention is not limited specifically for the above-mentioned target point location and temperature measuring device. As shown in fig. 2, by analyzing the process of measuring the temperature of different inner surfaces by the temperature measuring device, it can be known that when the temperature measuring device measures the inner surface of the multi-plane structure or the cavity, the collected radiation includes not only the inherent radiation generated by the surface of the measuring point, but also the reflected radiation generated by other surfaces, and part of the reflected radiation cannot be shielded, and the total radiation of the inner surface is increased due to the integration of the reflected radiation, which is commonly called as the cavity effect, and the actual measured temperature value of the target point of the inner surface to be measured is greater than the actual temperature value of the target point of the inner surface to be measured due to the influence of the cavity effect. Wherein the interior surfaces of the multi-planar structure or cavity include, but are not limited to, the structure shown in fig. 3.
102. And initializing the real temperature estimated values corresponding to the target points respectively.
In the embodiment of the invention, the initialization of the actual temperature estimated value can be set based on experience or randomly, and the embodiment of the invention is not particularly limited. Because the actual measured temperature value is inaccurate relative to the actual temperature value of the target point of the inner surface to be measured, the actual temperature value can be firstly assumed to be a known quantity, the assumed actual temperature value is the actual temperature estimated value, and an initial value is set for the actual temperature estimated value, so that an assumed measured temperature value, namely the measured temperature estimated value, is obtained according to the actual temperature estimated value.
103. And taking the real temperature estimated value as an iteration variable, establishing an iteration relation based on a corresponding relation between the measured temperature estimated value and the real temperature estimated value and a residual error between the measured temperature estimated value and the real value, obtaining a final real temperature estimated value of the target points through iterative calculation, and taking the final real temperature estimated value as an internal surface temperature measurement result.
In the embodiment of the invention, when an assumed real temperature estimated value exists for any target point position of the inner surface to be detected, a corresponding measured temperature estimated value can be obtained based on the corresponding relation between the measured temperature value and the real temperature estimated value. Since the measured temperature actual value is the measured accurate value, if the measured temperature actual value and the measured temperature estimated value are approximately equal, the assumed true temperature estimated value is also approximately equal to the true temperature value, that is, an accurate true temperature value (true temperature estimated value) is obtained from an assumed true temperature value. Based on the inversion process, the real temperature estimated value is continuously corrected through iterative calculation, so that the measured temperature estimated value approaches to the measured temperature actual value, and the real temperature estimated value is obtained.
It should be noted that, the correspondence between the measured temperature estimation value and the actual temperature estimation value is determined based on the effective emissivity model. For any point of the inner surface to be measured, the radiation of the point is collected by the temperature collection device under the influence of the cavity effect, and the radiation comprises the inherent radiation of the inner surface and the reflected radiation of the radiation projected by the relevant area, and the radiation is called effective radiation. The inherent radiation is blackbody radiation of the inner surface to be measured at the current point position and can be expressed by a Planck formula. The effective emissivity is the ratio of the radiation of the inner surface to be measured to the radiation of the blackbody at the reference temperature, and the formula is:
wherein L is λ For the spectral radiance of the target point p along the direction omega, L b At temperature T of a black body ref Spectral emittance at T dis The temperature distribution is the true temperature distribution of the inner surface to be measured, epsilon is the inherent emissivity, lambda is the radiation wavelength, and p is the target point position p. Wherein T is ref Can be determined according to specific application scenes, T dis The true temperature distribution is effective in influencing the effective emission of the current point positionThe main factor of the rate. Since the measured temperature value collected by the temperature measurement device characterizes the effective radiation and the blackbody radiation, the corresponding relationship between the measured temperature estimated value and the actual temperature estimated value can be described based on the effective emissivity model. The preset threshold may be customized according to application requirements, and embodiments of the present invention are not specifically limited. Based on the ideas of active temperature correction and inversion, the deviation reason of the measured temperature value and the real temperature value is determined by analyzing the principle that the temperature measuring equipment collects radiation, the real temperature estimated value closest to the real temperature value of the target point of the inner surface to be measured can be obtained, and the influence of the cavity effect on the measured temperature value is eliminated, so that a more accurate inner surface temperature value is obtained.
For further explanation and limitation, before step 101 of obtaining actual measured temperature values of a plurality of target points in the inner surface to be measured, the method further includes:
201. and acquiring structural characteristic data, material optical characteristic data and temperature characteristic data of the inner surface to be detected.
202. And constructing a structural model of the inner surface to be detected based on the structural feature data and the temperature feature data, and constructing a beam tracking model based on the material optical feature data and the structural model.
203. And constructing an effective emissivity model based on the structural model and the beam tracking model.
In the embodiment of the invention, the effective reflectivity is difficult to determine based on a measurement method, so that the effective emissivity of any point in the inner surface to be measured needs to be determined based on a mode of constructing an effective emissivity model. The essence of the effective emissivity model is the effective emissivity distribution function of the inner surface to be measured. The effective emissivity has close relation with the inherent emissivity, the wavelength, the temperature distribution of the inner surface to be measured, the position of the target point position, the reflection energy distribution characteristic, the measurement position of the infrared measuring instrument and the like. Thus, there is a need to obtain characteristic parameters of the inner surface to be measured, including: structural feature data, e.g.Height, radius, curvature, etc. of the cylinder, cone; material optical characteristic data, e.g., reflectivity, transmissivity, absorptivity, etc.; temperature profile data, e.g., temperature profile, etc. The structural model comprises a cavity geometric model of the inner surface to be detected and a probability model describing the optical property of the cavity, such as an absorption probability model, a reflection probability model and the like. The beam tracking model is constructed based on a beam tracking process of the simulated beam in the structural model. The process of beam tracking specifically comprises the following steps: 1) Setting a starting point and a target point of radiant energy to obtain an incident direction omega; 2) The incident radiation energy is scattered into N beams, and the single beam energy is w 0 =1 (generally take n=10 6 -10 9 ) The method comprises the steps of carrying out a first treatment on the surface of the 3) Tracking the light beam, and solving the intersection point of the light beam and the wall surface of the cavity; 4) Judging whether the light beam is absorbed or not based on the absorption/reflection probability model, and calculating the energy added to the cavity according to the temperature of the absorption point when the light beam is absorbed; 5) If reflection occurs, determining a reflection direction based on a reflection direction probability model; 6) Calculating the next intersection point with the cavity according to the reflection direction; 7) Repeating the processes of 3) to 6) until the light beam is absorbed or escapes from the cavity opening; 8) Repeating the processing of 1) to 7) on N light beams, and counting the energy absorbed by the inner surface to be measured based on the Monte Carlo method, wherein the energy is expressed as N α The method comprises the steps of carrying out a first treatment on the surface of the According to kirchhoff's law: the object good at transmitting is also good at absorbing, and the effective emissivity epsilon can be determined by calculating the absorptivity of the target point in the direction omega e The formula is:wherein N is α Is the radiant energy absorbed by the inner surface, N being the radiant energy from the origin.
It should be noted that the effective emissivity calculation model characterizes the mutual radiation relationship between the points on the inner surface with the cavity effect, and the accuracy of the effective emissivity model directly affects the accuracy of the inversion method. For example, the inner surface to be measured is usually a mixed reflection of specular reflection and diffuse reflection, if diffusion approximation is adopted, larger errors are brought, and a bidirectional reflection distribution function of an interface needs to be established to express; secondly, effective radiation characteristics and distribution rules among the inner surfaces need to be studied; in addition, non-uniform specular reflection can result in the effective radiation also having directional sensitivity, such that there is a difference in the energy received in different directions. The effective emissivity model is constructed based on the characteristic data of the inner surface to be detected and the Monte Carlo method, the influence of the factors such as the structure and the material to be detected on the effective emissivity can be fully fused, the accuracy of the effective emissivity model is ensured, the requirement of the inversion process on the accuracy of the effective emissivity is met, and therefore an accurate real temperature estimated value is obtained.
In an embodiment of the present invention, for further explanation and limitation, as shown in fig. 5, in step 103, the step of using the initial value of the actual temperature estimation value as an iteration initial value, using the actual measured temperature value as an iteration target value, and performing iterative calculation based on the correspondence between the measured temperature value and the actual temperature estimation value to obtain actual temperature estimation values of the target points includes:
301. and calculating according to the actual temperature estimated value to obtain a measured temperature estimated value.
302. And carrying out residual calculation on the estimated value of the measured temperature and the actual value of the measured temperature to obtain a residual result.
303. And if the residual result is larger than a preset threshold, correcting the real temperature estimated value according to the residual result and the iterative relation, and repeating the step of calculating the measured temperature estimated value according to the real temperature estimated value.
304. And if the residual error result of the measured temperature estimated value and the measured temperature actual value is smaller than or equal to the preset threshold value, taking the corresponding real temperature estimated value as an inner surface temperature measurement result.
In the embodiment of the invention, because the relation between the actual temperature estimated value and the measured temperature estimated value is established based on the effective emissivity, the effective emissivity of each target point is calculated according to the actual temperature estimated value of the point, and then the measured temperature estimated value of the point is calculated according to the effective emissivity. The residual error between the measured temperature estimated value and the measured temperature actual value is calculated, and the real temperature estimated value is corrected based on the deviation between the residual error result and the preset threshold value, so that the real temperature estimated value is closer to the real temperature value of the current target point position of the inner surface to be measured when the measured temperature estimated value tends to the measured temperature actual value, the correction of the real temperature estimated value based on the measured temperature actual value is realized, and the accurate real temperature estimated value is obtained.
For further explanation and limitation, in one embodiment of the present invention, step 301 includes:
and obtaining a target temperature distribution estimation result of the inner surface to be measured by carrying out interpolation calculation on the initial value of the real temperature estimation value.
And calculating the effective emissivity of the inner surface to be measured according to the target temperature distribution by utilizing a pre-constructed effective emissivity model.
And calculating to obtain a measured temperature estimated value according to the effective emissivity and the temperature measurement principle.
In the embodiment of the invention, interpolation calculation is performed according to the target temperature initial value of each target point location to obtain a target temperature distribution estimation result of the inner surface to be measured, which is expressed as T dis_est The formula is: t (T) dis_est ＝I(T t_est-1 ,…,T t_est-p ,…,T t_est-N ) (3); wherein T is t_est-p And N is the number of the target points and is the actual temperature estimated value of the target point p. After the target temperature distribution of the inner surface to be measured is obtained, calculating the approximate value of the effective emissivity of each target point position by utilizing an effective emissivity model which is built in advance based on the characteristic data of the inner surface to be measured. After the effective emissivity of each target point position is obtained, the estimated value of the measured temperature is further calculated according to the temperature measurement principle. Specifically, taking the measurement principle of the brightness thermometer as an example for analysis, the measured temperature value and the actual temperature value should satisfy the following formula: epsilon e (ε,λ,T dis ,T ref ,p,ω)L b (λ,T ref )＝L b (λ,T m-p ) (4); wherein L is b (λ,T m-p ) For blackbody radiation energy collected by the temperature measuring device, L b Is the planck formula. The planck formula is:wherein T is thermodynamic temperature, K, C 1 For a first radiation constant 3.741832 ×10 -16 W·m 2 ，C 2 For a second radiation constant 1.438786 ×10 -16 m.K. Taking equation (5) into (4) to obtain the measured temperature value T of p point m-p And T dis The relationship between them can be expressed as formula T m-p ＝f(ε,λ,T dis P, ω) (6); where f is a relationship derived based on the effective emissivity for characterizing the effect of cavity effects on the measured temperature. Based on the above deduction, a target temperature distribution estimation result T of the inner surface to be measured is obtained dis_est Thereafter, a measured temperature estimate, denoted T, may be calculated m_est-p The formula is: t (T) m_est-p ＝f'(ε,λ,T dis_est P, ω) (7); wherein f' is a corresponding relationship derived based on the effective emissivity model.
In one embodiment of the present invention, for further explanation and limitation, in step 302, the residual calculation is performed on the estimated value of the measured temperature and the actual value of the measured temperature, and after obtaining the residual result, the method further includes:
converting a residual equation corresponding to the actual measured temperature value and the estimated measured temperature value into a multi-element nonlinear objective function;
and correcting the real temperature estimated value according to the iterative relation of the multi-element nonlinear objective function design.
In the embodiment of the invention, after obtaining the estimated value of the measured temperature of each target point, in order to obtain the estimated value of the actual temperature, the equation set needs to be solved:wherein T is m-p For the actual measured temperature value T corresponding to the target point position P m_est-p And N is the number of the target points for the estimated value of the measured temperature corresponding to the target point P. The residual errors of the measured temperature estimated values and the measured temperature actual values of all points are made to approach 0, so that the target estimated temperature approaches to the actual temperature value. Solving forThe solution method is a key step of the inversion algorithm. Since equation (8) is a system of implicit function equations, it is difficult to solve directly. It is converted into a multiple nonlinear objective function in the optimization problem to find an approximate solution. Wherein the objective function is defined as:wherein DeltaT p Measuring the residual error between the temperature estimated value and the actual value for the p point, F obj And the sum of squares of residual errors of the estimated value and the actual value of the measured temperature corresponding to the N target points. In the multi-element nonlinear programming problem, the real temperature estimated value has a lower limit of 0K, but the research object of the problem has high temperature characteristics, and an unconstrained optimization method such as a steepest descent method can be adopted to optimize the real temperature estimated value without considering the lower limit, so that the measured temperature estimated value is converged. Specifically, the formulas are obtained according to formulas (3), (7), (9): />Where k is the number of iterations and a is the step size. The derivation yields the formula: />Where i is the index number of the iteration. Further according to an iterative formula for obtaining the true temperature estimated value:
because the relation determined based on the effective emissivity model cannot be accurately derived, a numerical method is adopted to approximate the derivative, and the formula is as follows:
wherein T is t-p And delta t is the variation of derivative of the differential value for the actual temperature estimated value.
The embodiment of the invention provides an inner surface temperature measuring method, which comprises the steps of obtaining actual measured temperature values of a plurality of target points in an inner surface to be measured; respectively initializing real temperature estimated values corresponding to the target points; and taking the real temperature estimated value as an iteration variable, establishing an iteration relation based on a corresponding relation between the measured temperature estimated value and the real temperature estimated value and a residual error between the measured temperature estimated value and the real value, obtaining a final real temperature estimated value of the target points through iterative calculation, taking the final real temperature estimated value as an internal surface temperature measurement result, wherein the corresponding relation between the measured temperature estimated value and the real temperature estimated value is determined based on an effective emissivity model, fully analyzing the influence of reflected radiation generated by a cavity effect on the accuracy of the measured temperature, eliminating the influence of the reflected radiation on the inaccuracy of the measured temperature based on the ideas of active temperature correction and inversion reasoning, and obtaining the real temperature estimated value which is closer to the real temperature of the internal surface to be measured, thereby improving the accuracy of the determined internal surface temperature value.
Further, as an implementation of the method shown in fig. 1, an embodiment of the present invention provides an apparatus for measuring an internal surface temperature, as shown in fig. 6, where the apparatus includes:
an acquisition module 41, configured to acquire actual measured temperature values of a plurality of target points in the inner surface to be measured;
an initialization module 42, configured to initialize the real temperature estimation values corresponding to the target points respectively;
the calculation module 43 is configured to set the actual temperature estimated value as an iteration variable, set an iteration relation based on a correspondence between the measured temperature estimated value and the actual temperature estimated value, and a residual error between the measured temperature estimated value and the actual value, obtain final actual temperature estimated values of the target points through iterative calculation, and set the final actual temperature estimated value as an internal surface temperature measurement result, where the correspondence between the measured temperature estimated value and the actual temperature estimated value is determined based on an effective emissivity model.
Further, the apparatus further comprises:
the acquisition module is also used for acquiring structural characteristic data, material optical characteristic data and temperature characteristic data of the inner surface to be detected;
the first construction module is used for constructing a structural model of the inner surface to be detected based on the structural feature data and the temperature feature data, and constructing a beam tracking model based on the material optical feature data and the structural model;
the second construction module is used for constructing an effective emissivity model based on the structure model and the beam tracking model, and the effective emissivity model is used for calculating the effective emissivity of any target point position according to the temperature distribution of the inner surface to be detected.
Further, the calculating module 43 includes:
the first calculation unit is used for calculating a measured temperature estimated value according to the real temperature estimated value;
the second calculation unit is used for carrying out residual calculation on the estimated value of the measured temperature and the actual value of the measured temperature to obtain a residual result;
the third calculation unit is used for correcting the real temperature estimated value according to the residual error result and the iteration relation if the residual error result is larger than a preset threshold value, and repeating the step of calculating the measured temperature estimated value according to the real temperature estimated value;
and the determining unit is used for taking the corresponding real temperature estimated value as an inner surface temperature measurement result if the residual result of the measured temperature estimated value and the measured temperature actual value is smaller than or equal to the preset threshold value.
Further, in a specific application scenario, the first calculating unit is configured to obtain a temperature distribution of the inner surface to be measured by performing interpolation calculation on the actual temperature estimated value;
calculating the effective emissivity of the inner surface to be measured according to the temperature distribution by utilizing a pre-constructed effective emissivity model;
and calculating to obtain a measured temperature estimated value according to the effective emissivity and the temperature measurement principle.
Further, the apparatus further comprises:
the conversion module is used for converting a residual equation corresponding to the actual measured temperature value and the estimated measured temperature value into a multi-element nonlinear objective function;
the calculation module 43 is further configured to correct the actual temperature estimation value according to an iterative relation of the multi-element nonlinear objective function design.
The embodiment of the invention provides an internal surface temperature measuring device, which is characterized in that the actual measured temperature values of a plurality of target points in the internal surface to be measured are obtained; respectively initializing the real temperature estimation values of the target points; and taking the real temperature estimated value as an iteration variable, establishing an iteration relation based on a corresponding relation between the measured temperature estimated value and the real temperature estimated value and a residual error between the measured temperature estimated value and the real value, obtaining a final real temperature estimated value of the target points through iterative calculation, taking the final real temperature estimated value as an internal surface temperature measurement result, wherein the corresponding relation between the measured temperature estimated value and the real temperature estimated value is determined based on an effective emissivity model, fully analyzing the influence of reflected radiation generated by a cavity effect on the accuracy of the measured temperature, eliminating the influence of the reflected radiation on the inaccuracy of the measured temperature based on the ideas of active temperature correction and inversion reasoning, and obtaining the real temperature estimated value which is closer to the real temperature of the internal surface to be measured, thereby improving the accuracy of the determined internal surface temperature value.
According to one embodiment of the present invention, there is provided a storage medium storing at least one executable instruction for performing the method of measuring an internal surface temperature in any of the above-described method embodiments.
Fig. 7 is a schematic structural diagram of a terminal according to an embodiment of the present invention, and the specific embodiment of the present invention is not limited to the specific implementation of the terminal.
As shown in fig. 7, the terminal may include: a processor 502, a communication interface (Communications Interface) 504, a memory 506, and a communication bus 508.
Wherein: processor 502, communication interface 504, and memory 506 communicate with each other via communication bus 508.
A communication interface 504 for communicating with network elements of other devices, such as clients or other servers.
The processor 502 is configured to execute the program 510, and may specifically perform the relevant steps in the above-described embodiment of the method for measuring an internal surface temperature.
In particular, program 510 may include program code including computer-operating instructions.
The processor 502 may be a central processing unit CPU, or a specific integrated circuit ASIC (Application Specific Integrated Circuit), or one or more integrated circuits configured to implement embodiments of the present invention. The one or more processors included in the terminal may be the same type of processor, such as one or more CPUs; but may also be different types of processors such as one or more CPUs and one or more ASICs.
A memory 506 for storing a program 510. Memory 506 may comprise high-speed RAM memory or may also include non-volatile memory (non-volatile memory), such as at least one disk memory.
The program 510 may be specifically operable to cause the processor 502 to:
acquiring actual measured temperature values of a plurality of target points in the inner surface to be measured;
respectively initializing real temperature estimated values corresponding to the target points;
and taking the real temperature estimated value as an iteration variable, establishing an iteration relation based on a corresponding relation between the measured temperature estimated value and the real temperature estimated value and a residual error between the measured temperature estimated value and the real value, obtaining a final real temperature estimated value of the target points through iterative calculation, taking the final real temperature estimated value as an internal surface temperature measuring result, and determining the corresponding relation between the measured temperature estimated value and the real temperature estimated value based on an effective emissivity model.
It will be appreciated by those skilled in the art that the modules or steps of the invention described above may be implemented in a general purpose computing device, they may be concentrated on a single computing device, or distributed across a network of computing devices, they may alternatively be implemented in program code executable by computing devices, so that they may be stored in a memory device for execution by computing devices, and in some cases, the steps shown or described may be performed in a different order than that shown or described, or they may be separately fabricated into individual integrated circuit modules, or multiple modules or steps within them may be fabricated into a single integrated circuit module for implementation. Thus, the present invention is not limited to any specific combination of hardware and software.
The above description is only of the preferred embodiments of the present invention and is not intended to limit the present invention, but various modifications and variations can be made to the present invention by those skilled in the art. Any modification, equivalent replacement, improvement, etc. made within the spirit and principle of the present invention should be included in the protection scope of the present invention.
Claims (5)
1. A method of measuring an internal surface temperature, comprising:
acquiring actual measured temperature values of a plurality of target points in the inner surface to be measured;
respectively initializing real temperature estimated values corresponding to the target points;
establishing an iterative relation based on a corresponding relation between a measured temperature estimated value and a real temperature estimated value and a residual error between the measured temperature estimated value and the measured temperature actual value by taking the real temperature estimated value as an iterative variable, obtaining final real temperature estimated values of the target points through iterative calculation, taking the final real temperature estimated values as an internal surface temperature measuring result, and determining the corresponding relation between the measured temperature estimated value and the real temperature estimated value based on an effective emissivity model;
before the actual measured temperature values of the target points in the inner surface to be measured are obtained, the method further comprises:
acquiring structural feature data, material optical feature data and temperature feature data of the inner surface to be detected;
constructing a structural model of the inner surface to be detected based on the structural feature data and the temperature feature data, and constructing a beam tracking model based on the material optical feature data and the structural model;
based on the structural model and the beam tracking model, an effective emissivity model is constructed, and the effective emissivity model is used for calculating the effective emissivity of any target point position according to the temperature distribution of the inner surface to be detected;
establishing an iterative relation based on a corresponding relation between a measured temperature estimated value and a real temperature estimated value and a residual error between the measured temperature estimated value and the measured temperature actual value by taking the real temperature estimated value as an iterative variable, obtaining final real temperature estimated values of the target points through iterative calculation, and taking the final real temperature estimated values as an internal surface temperature measurement result, wherein the final real temperature estimated values comprise:
calculating according to the actual temperature estimated value to obtain a measured temperature estimated value;
carrying out residual calculation on the estimated value of the measured temperature and the actual value of the measured temperature to obtain a residual result;
if the residual result is larger than a preset threshold, correcting the real temperature estimated value according to the residual result and the iterative relation, and repeating the step of calculating the measured temperature estimated value according to the real temperature estimated value;
if the residual error result of the measured temperature estimated value and the measured temperature actual value is smaller than or equal to the preset threshold value, the corresponding real temperature estimated value is used as an inner surface temperature measuring result;
the calculating according to the real temperature estimated value to obtain a measured temperature estimated value includes:
obtaining a temperature distribution estimation result of the inner surface to be measured by carrying out interpolation calculation on the real temperature estimation value;
calculating the effective emissivity of the inner surface to be measured according to the temperature distribution estimation result by utilizing a pre-constructed effective emissivity model;
and calculating to obtain a measured temperature estimated value according to the effective emissivity and the temperature measurement principle.
2. The method according to claim 1, wherein after performing a residual calculation on the estimated value of the measured temperature and the actual value of the measured temperature to obtain a residual result, the method further comprises:
converting a residual equation corresponding to the actual measured temperature value and the estimated measured temperature value into a multi-element nonlinear objective function;
and correcting the real temperature estimated value according to the iterative relation of the multi-element nonlinear objective function design.
3. An internal surface temperature measurement device, comprising:
the acquisition module is used for acquiring actual measured temperature values of a plurality of target points in the inner surface to be measured;
the initialization module is used for respectively initializing the real temperature estimated values corresponding to the target point positions;
the calculation module is used for taking the real temperature estimated value as an iteration variable, establishing an iteration relation based on a corresponding relation between the measured temperature estimated value and the real temperature estimated value and a residual error between the measured temperature estimated value and the measured temperature actual value, obtaining final real temperature estimated values of the target points through iterative calculation, taking the final real temperature estimated values as an internal surface temperature measurement result, and determining the corresponding relation between the measured temperature estimated value and the real temperature estimated value based on an effective emissivity model;
before the actual measured temperature values of the target points in the inner surface to be measured are obtained, the method further comprises:
acquiring structural feature data, material optical feature data and temperature feature data of the inner surface to be detected;
constructing a structural model of the inner surface to be detected based on the structural feature data and the temperature feature data, and constructing a beam tracking model based on the material optical feature data and the structural model;
based on the structural model and the beam tracking model, an effective emissivity model is constructed, and the effective emissivity model is used for calculating the effective emissivity of any target point position according to the temperature distribution of the inner surface to be detected;
establishing an iterative relation based on a corresponding relation between a measured temperature estimated value and a real temperature estimated value and a residual error between the measured temperature estimated value and the measured temperature actual value by taking the real temperature estimated value as an iterative variable, obtaining final real temperature estimated values of the target points through iterative calculation, and taking the final real temperature estimated values as an internal surface temperature measurement result, wherein the final real temperature estimated values comprise:
calculating according to the actual temperature estimated value to obtain a measured temperature estimated value;
carrying out residual calculation on the estimated value of the measured temperature and the actual value of the measured temperature to obtain a residual result;
if the residual result is larger than a preset threshold, correcting the real temperature estimated value according to the residual result and the iterative relation, and repeating the step of calculating the measured temperature estimated value according to the real temperature estimated value;
if the residual error result of the measured temperature estimated value and the measured temperature actual value is smaller than or equal to the preset threshold value, the corresponding real temperature estimated value is used as an inner surface temperature measuring result;
the calculating according to the real temperature estimated value to obtain a measured temperature estimated value includes:
obtaining a temperature distribution estimation result of the inner surface to be measured by carrying out interpolation calculation on the real temperature estimation value;
calculating the effective emissivity of the inner surface to be measured according to the temperature distribution estimation result by utilizing a pre-constructed effective emissivity model;
and calculating to obtain a measured temperature estimated value according to the effective emissivity and the temperature measurement principle.
4. A storage medium having stored therein at least one executable instruction for causing a processor to perform operations corresponding to the method of measuring an internal surface temperature of any one of claims 1-2.
5. A terminal, comprising: the device comprises a processor, a memory, a communication interface and a communication bus, wherein the processor, the memory and the communication interface complete communication with each other through the communication bus;
the memory is configured to store at least one executable instruction that causes the processor to perform operations corresponding to the method for measuring an internal surface temperature according to any one of claims 1-2.
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