JPS61110018A - Measuring apparatus for emissivity and temperature of object - Google Patents
Measuring apparatus for emissivity and temperature of objectInfo
- Publication number
- JPS61110018A JPS61110018A JP59232131A JP23213184A JPS61110018A JP S61110018 A JPS61110018 A JP S61110018A JP 59232131 A JP59232131 A JP 59232131A JP 23213184 A JP23213184 A JP 23213184A JP S61110018 A JPS61110018 A JP S61110018A
- Authority
- JP
- Japan
- Prior art keywords
- radiation
- emissivity
- temperature
- measured
- radiation sources
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 230000005855 radiation Effects 0.000 claims abstract description 51
- 238000005259 measurement Methods 0.000 claims abstract description 29
- 238000001514 detection method Methods 0.000 claims abstract 2
- 238000010586 diagram Methods 0.000 description 4
- 229910000831 Steel Inorganic materials 0.000 description 2
- 238000000034 method Methods 0.000 description 2
- 239000010959 steel Substances 0.000 description 2
- 230000015572 biosynthetic process Effects 0.000 description 1
- 230000000052 comparative effect Effects 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 238000005755 formation reaction Methods 0.000 description 1
- 238000010438 heat treatment Methods 0.000 description 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J5/00—Radiation pyrometry, e.g. infrared or optical thermometry
- G01J5/02—Constructional details
- G01J5/08—Optical arrangements
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J5/00—Radiation pyrometry, e.g. infrared or optical thermometry
- G01J5/0022—Radiation pyrometry, e.g. infrared or optical thermometry for sensing the radiation of moving bodies
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J5/00—Radiation pyrometry, e.g. infrared or optical thermometry
- G01J5/02—Constructional details
- G01J5/06—Arrangements for eliminating effects of disturbing radiation; Arrangements for compensating changes in sensitivity
- G01J5/064—Ambient temperature sensor; Housing temperature sensor; Constructional details thereof
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J5/00—Radiation pyrometry, e.g. infrared or optical thermometry
- G01J5/02—Constructional details
- G01J5/08—Optical arrangements
- G01J5/0831—Masks; Aperture plates; Spatial light modulators
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J5/00—Radiation pyrometry, e.g. infrared or optical thermometry
- G01J5/02—Constructional details
- G01J5/08—Optical arrangements
- G01J5/0896—Optical arrangements using a light source, e.g. for illuminating a surface
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J5/00—Radiation pyrometry, e.g. infrared or optical thermometry
- G01J5/80—Calibration
- G01J5/802—Calibration by correcting for emissivity
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J5/00—Radiation pyrometry, e.g. infrared or optical thermometry
- G01J2005/0074—Radiation pyrometry, e.g. infrared or optical thermometry having separate detection of emissivity
Abstract
Description
【発明の詳細な説明】
（１）発明の分野
この発明は、走査形放射温度計を用いた鋼板等の放射率
および温度の測定装置に関するものである。DETAILED DESCRIPTION OF THE INVENTION (1) Field of the Invention The present invention relates to an apparatus for measuring the emissivity and temperature of steel plates and the like using a scanning radiation thermometer.
（２）従来技術
出願人は、たとえば特開昭５７−１６１５２１号公報に
あるように、比較熱板と測定物体との距離を変化させた
ときの放射検出器の出力変化から測定物体の放射率を求
める方法を提案している。(2) Prior art As disclosed in Japanese Patent Laid-Open No. 57-161521, for example, the applicant has determined that the emissivity of the object to be measured is based on the change in the output of the radiation detector when the distance between the comparison hot plate and the object to be measured is changed. We are proposing a method to find the .
しかしながら、この方法では、比較熱板を駆動する装置
が大型なものとなり、また、一点測定のため測定物体の
広い範囲での放射率、温度パターンの測定が困難である
等の問題点を生じている。However, this method requires a large device to drive the comparative heating plate, and also has problems such as the difficulty of measuring emissivity and temperature patterns over a wide range of the measurement object because of the single-point measurement. There is.
（３）発明の目的
ｉコ、の発明の目的は、以上の点に鑑み、より簡便、／
（？測定物体の広い範囲での放射率、温度の測定を可能
とした物体の放射率および温度の測定装置を提供するこ
とである。(3) Purpose of the Invention In view of the above, the purpose of the invention is to make it easier to measure the emissivity and temperature of an object over a wide range. The purpose of the present invention is to provide a measuring device for
（４）発明の概要
この発明は、走査形放射温度計に放射源からの異った開
口を介して２つの放射エネルギーが入射したときとしな
いときのそれぞれの検出値の差の比である寄与率の比と
寄与率の差とが所定の関係にあることに基いて１ｌｌ１
１定物体の放射率を求め、この放射率から測定物体の温
度を測定するようにした物体の故！）Ｉ率および温度の
測定装置である。(4) Summary of the Invention This invention provides a contribution that is the ratio of the difference between detected values when two radiant energies are incident on a scanning radiation thermometer through different apertures from a radiation source and when not. Based on the fact that the ratio of the ratio and the difference in the contribution rate have a predetermined relationship, 1ll1
1. The reason for the object is to find the emissivity of a constant object and measure the temperature of the object from this emissivity! ) I rate and temperature measuring device.
（５）発明の実施例
第１図は、この発明の一実施例を示す構成説明図である
。(5) Embodiment of the Invention FIG. 1 is an explanatory diagram showing an embodiment of the invention.
図において、１は、紙面に対して垂直に走行する鋼板の
ような測定物体、２は、測定物体の幅方向を垂直に走査
して測定物体１からの放射エネルギーを検出するＣＯＤ
または走査鏡等を用いた走査形放射温度計、３１．３２
は、走査形放射温度−’ｉ！ｉ ２の走査線上の両側に
位置し走査形放射温度計２′の走査領域の測定物体１に
放射エネルギーを放飼し測定物体１を反射した放飼エネ
ルギーが走査形成ｃＦ１温度計２に入射するよう設けら
れた放射源、４は、走査形放射温度計２、放射源３１．
３２を支持し、異った大きさの開口４１．４２から放射
源３１．３２の放射エネルギーを測定物体１に放射する
背景放射板（壁）、５は、背景放射板４の温度を検出す
る温度検出器、６は、走査形放射温度計２の出力信号、
放射源３１．３２、温度検出器５の出力信号が供給され
、所定の演１１処理を行うアナログ回路、マイクロコン
ピュータ１．パーソナルコンピュータ等の演算手段であ
る。In the figure, 1 is a measurement object such as a steel plate that runs perpendicular to the paper surface, and 2 is a COD that scans the width direction of the measurement object perpendicularly to detect the radiant energy from the measurement object 1.
or a scanning radiation thermometer using a scanning mirror, etc., 31.32
is the scanning radiation temperature −'i! Radiant energy is released to the measurement object 1 located on both sides of the scanning line of i 2 in the scanning area of the scanning radiation thermometer 2', and the released energy reflected from the measurement object 1 enters the scanning-forming cF1 thermometer 2. The radiation source 4 provided in this manner includes a scanning radiation thermometer 2, a radiation source 31.
a background radiation plate (wall) supporting 32 and radiating the radiant energy of the radiation source 31.32 to the measurement object 1 through apertures 41.42 of different sizes; 5 detects the temperature of the background radiation plate 4; Temperature detector 6 is an output signal of scanning radiation thermometer 2;
A radiation source 31, 32, an analog circuit to which the output signal of the temperature detector 5 is supplied, and a microcomputer 1, which performs predetermined processing. It is a calculation means such as a personal computer.
測定物体１の温度を王、放射率をε、放１８１３１．３
２の温度をＴｒ 、 ＩＩｌ射率をεｒ、背景放射板４
の温度をＴａ、走査形放射温度計２の出力信号をＥ ’
、黒体相当の放射エネルギーをＥ （Ｔ）とする。The temperature of the measurement object 1 is 1, the emissivity is ε, and the radiation is 18131.3.
2 temperature is Tr, IIl emissivity is εr, background radiation plate 4
The temperature is Ta, and the output signal of the scanning radiation thermometer 2 is E'
, let the radiant energy equivalent to a black body be E (T).
走査形放射温度計２が、測定物体１を走査すると、第２
図で示すように、放射源３１．３２から省放射エネルギ
ーが入射したときに高い出力信号Ｅ１．Ｅ２が得られ、
入射しないときに低い出力信号Ｅｏが得られ、次式が成
り立つ。When the scanning radiation thermometer 2 scans the measurement object 1, the second
As shown in the figure, a high output signal E1. E2 is obtained,
A low output signal Eo is obtained when no light is incident, and the following equation holds.
Ｅｏ−εＥ （Ｔ）＋ （１−ε） Ｅ （Ｔａ ）・
・・（１）
Ｅｌ−εＥ（Ｔ）＋Ｆ＋ ＜１−ε）εｒＥ（Ｔｒ
）＋ （１−Ｆｌ ） （１−ε） Ｅ （Ｔａ ）
・・・（２）
Ｅｌ−εＥ（Ｔ）＋Ｆ２（１−ε）εｒ Ｅ （Ｔｒ）
＋（１−Ｆ２）（１−ε）Ｅ（Ｔａ）・・・ （３）
ここで、Ｆｌ、Ｆ２は、放射源３１．３２からの放射エ
ネルギーが測定物体１を反射して、走査形成！）ｊ温度
計に入射する寄与率で、たとえばＦｌ＞ Ｆ ２である
。Eo−εE (T)+ (1−ε) E (Ta)・
...(1) El-εE(T)+F+ <1-ε)εrE(Tr
)+ (1-Fl) (1-ε) E (Ta)
...(2) El-εE(T)+F2(1-ε)εrE(Tr)
+(1-F2)(1-ε)E(Ta)... (3) Here, Fl and F2 are scanning formations caused by the radiation energy from the radiation sources 31 and 32 reflecting off the measurement object 1! )j is the contribution factor incident on the thermometer, for example Fl > F 2.
つまり、（１）式右辺第１項は測定物体１自体からの放
射エネルギー、第２項は背景放射板４からの放射エネル
ギー、（２）、（３）式右辺第２項は放射源３１．３２
からの寄与分、第３項は背景放射板４からの寄与分であ
る。That is, the first term on the right side of equation (1) is the radiant energy from the measurement object 1 itself, the second term is the radiant energy from the background radiation plate 4, and the second term on the right side of equations (2) and (3) is the radiation source 31. 32
The third term is the contribution from the background radiation plate 4.
、２）式から（１）式を減算し、〈３）式から・）式を
減算すると次式が得られる。, by subtracting equation (1) from equation (2) and subtracting equation (.) from equation (3), the following equation is obtained.
Ｅｌ−Ｅｏ−Ｆｌ （１−ｅｖｅｒ Ｅ （Ｔｒ ）
−Ｆｌ （１−６）Ｅ （Ｔａ ）
Ｅｌ−ＥＱ−Ｆ２ （１−ε）εｒ Ｅ （Ｔｒ ）−
Ｆ２ （１−６） Ｅ （Ｔａ ）
その比Ｒをとると次式が得られる。El-Eo-Fl (1-ever E (Tr)
-Fl (1-6)E (Ta) El-EQ-F2 (1-ε)εr E (Tr)-
F2 (1-6) E (Ta) Taking the ratio R, the following formula is obtained.
Ｒ＝ Ｆ ＋ ／ Ｆ ２ ・・
・（４）また、（２）、（３）式を辺々差し引くと次式
が得られる。R=F+/F2...
・(4) Also, by subtracting equations (2) and (3), the following equation is obtained.
Ｅｌ −Ｅ ２＝（Ｆｌ−Ｆ２＞ （１−６＞
（εｒＥ （Ｔｒ ） −Ｅ （Ｔａ ）
）これより、放射率εは、次式となる。El −E 2=(Fl−F2>(1−6>
(εrE (Tr) −E (Ta)
) From this, the emissivity ε becomes the following formula.
ε−１−（Ｅｌ−２２）／［（Ｆｌ−Ｆ２）・［：ｒ
Ｅ （Ｔｒ ） −Ｅ （Ｔａ ＞ ） ）・・・ く
５ ）
ここで、Ｄ＝Ｆ＋−Ｆ２とＲ−Ｆｌ／’Ｆ２との関係は
、第２図で示すようにＤ−ｆ （Ｒ）で、所定お関数
関係にあることが実験的に児い出された。ε-1-(El-22)/[(Fl-F2)・[:r
E (Tr) -E (Ta > ))... Ku 5) Here, the relationship between D=F+-F2 and R-Fl/'F2 is D-f (R) as shown in Figure 2. It was experimentally determined that there is a predetermined functional relationship.
ンまり、ＲからＤを求めることができ、（５）式の右辺
のその他の値は測定等により求まるので、放射率εを求
めることができる。Therefore, D can be found from R, and the other values on the right side of equation (5) can be found by measurement, etc., so the emissivity ε can be found.
そして、（１）式より
Ｅ（Ｔ）−（Ｅｏ−（１−ε）Ｅ（Ｔａ））／ε・・・
（６）
であるから、この（６）式に、（５）式より求めた放射
率ε等を代入して、１ｌｌ１１定物体１のＴＸ温度が求
まる。From equation (1), E(T)-(Eo-(1-ε)E(Ta))/ε...
(6) Therefore, the TX temperature of the 1ll11 constant object 1 is found by substituting the emissivity ε obtained from the equation (5) into the equation (6).
つまり、測定前、あらかじめ第２図で示すような測定に
より求めたＤ−Ｆｌ−Ｆ２とＲ−Ｆ １ ／Ｆ２どの関
数関係（）−ｆ （Ｒ１，放′＃４源３１．３２の放
射率εｒ等を演算手段６に記憶する。In other words, before the measurement, the functional relationship between D-Fl-F2 and R-F 1 /F2 obtained by measurements as shown in Figure 2 is εr, etc. are stored in the calculation means 6.
次に、測定時、走査形故躬濡度計２は、１１１１定物体
１を走査し、各測定位置Ｘ１に対応した出力信＠Ｅｉを
演算手段６に供給する。このとき、放射源３１．３２の
測定物体１を反射したときの出力信号をＥＩ、Ｆ２．そ
れ以外での出力信号をＥ。Next, during measurement, the scanning wetness meter 2 scans the 1111 fixed object 1 and supplies an output signal @Ei corresponding to each measurement position X1 to the calculation means 6. At this time, the output signals when the radiation sources 31 and 32 reflect the measurement object 1 are EI, F2. E for the output signal in other cases.
とする。また、放射源３１．３２の温度信号Ｔｒ１１Ｒ
景放射板４の温度信号Ｔａを検出する温度検出器５の出
力信号も演算手段６に供給される。shall be. In addition, the temperature signal Tr11R of the radiation source 31.32
The output signal of the temperature detector 5 which detects the temperature signal Ta of the view radiation plate 4 is also supplied to the calculation means 6.
清算手段は、（１）、（２）、（３）式に対応０た信号
Ｅａ、Ｅｌ、Ｆ２より〈４）式の比Ｒを求め、これによ
りＤを求め、また、信＠Ｔｒ 、 ＴａよりＥ （Ｔｒ
） 、 Ｅ （Ｔａ ）を演算し、（５）式の右辺の
演算を行って放射率εを求める。また、この放射率εを
用いて（６）式の演算を行って測定物体１の温度Ｔを求
めることができる。The clearing means calculates the ratio R of the equation (4) from the signals Ea, El, and F2 which correspond to 0 in the equations (1), (2), and (3), thereby obtaining the ratio D, and also calculates the ratio R of the equation (1), (2), and (3). From E (Tr
), E (Ta), and calculate the right side of equation (5) to find the emissivity ε. Furthermore, the temperature T of the measurement object 1 can be determined by calculating the equation (6) using this emissivity ε.
このようにして、放Ｄ１ａ３１．３２の寄与率から測定
物体１の放射率εを求め、各点の温度Ｔを求めることが
できる。あらかじめ放射率εを求めた後は、放射源３１
．３２の開口にシキ・ツタをし、連続測定を行ってもよ
い。In this way, the emissivity ε of the measurement object 1 can be determined from the contribution rate of the radiation 1a31.32, and the temperature T at each point can be determined. After determining the emissivity ε in advance, the radiation source 31
．． It is also possible to make continuous measurements by placing an ivy in the opening of No. 32.
第４図は、他の実施例を示し、第１図と同一’ｈ１号は
同一構成要素を示す。この例では、１個の放射源３は、
測定物体１の法線に対して走査形放射温度計２と所定の
角度をもたせて設けられており背景放射板４は、異なる
大きさの開口４１．４２を介して１個の放射源３の放飼
エネルギーを測定物体１に放射している。FIG. 4 shows another embodiment, in which the same reference numeral 'h1 as in FIG. 1 indicates the same component. In this example, one radiation source 3 is
The background radiation plate 4 is provided at a predetermined angle with the scanning radiation thermometer 2 with respect to the normal to the measurement object 1, and the background radiation plate 4 is connected to one radiation source 3 through apertures 41 and 42 of different sizes. Release energy is radiated to the measurement object 1.
（６）発明の効果
あらかじめ、寄与率の差が寄与率の比と所定の関係にあ
ることを利用し、走査形成射ン昌度計を用いて放射率、
温度を測定するようにしているので、簡単な構成で、測
定物体の広い範囲についての放射率補正された正しい温
度分布をヨ１１定することができる。(6) Effects of the invention Utilizing the fact that the difference in contribution rates has a predetermined relationship with the ratio of contribution rates, emissivity,
Since the temperature is measured, it is possible to determine the correct emissivity-corrected temperature distribution over a wide range of the measurement object with a simple configuration.
第１図、第４図は、この発明の一実施例を示す構成訳明
図、第２図は、動作説明用波形図、第３図は寄与率の差
と比の関係図である。1 and 4 are configuration diagrams showing an embodiment of the present invention, FIG. 2 is a waveform diagram for explaining the operation, and FIG. 3 is a diagram showing the relationship between the difference and ratio of contribution rates.
Claims (1)
を検出する走査形放射温度計と、この走査形放射温度計
の走査領域内の測定物体に異つた大きさの開口を介して
放射エネルギーを放射する放射源と、走査形放射温度計
に放射源からの２つの放射エネルギーが入射したときと
しないときのそれぞれの検出値の差の比である寄与率の
比と寄与率の差とが所定の関係にあることに基いて測定
物体の放射率を求め、この放射率から測定物体の温度を
測定することを特徴とする物体の放射率および温度の測
定装置。1. A scanning radiation thermometer that scans the measurement object to detect the radiant energy from the measurement object, and a scanning radiation thermometer that detects the radiant energy from the measurement object through apertures of different sizes to the measurement object within the scanning area of this scanning radiation thermometer. The contribution rate ratio and the contribution rate difference, which are the ratios of the differences between the detection values of the emitting radiation source and the scanning radiation thermometer when two radiant energies from the radiation source are incident and not, are predetermined. 1. An apparatus for measuring the emissivity and temperature of an object, characterized in that the emissivity of the object to be measured is determined based on the relationship , and the temperature of the object to be measured is measured from this emissivity.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP59232131A JPS61110018A (en) | 1984-11-02 | 1984-11-02 | Measuring apparatus for emissivity and temperature of object |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP59232131A JPS61110018A (en) | 1984-11-02 | 1984-11-02 | Measuring apparatus for emissivity and temperature of object |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS61110018A true JPS61110018A (en) | 1986-05-28 |
| JPH0511252B2 JPH0511252B2 (en) | 1993-02-15 |
Family
ID=16934482
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP59232131A Granted JPS61110018A (en) | 1984-11-02 | 1984-11-02 | Measuring apparatus for emissivity and temperature of object |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS61110018A (en) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN115265825A (en) * | 2022-07-06 | 2022-11-01 | 东北大学 | Inner surface temperature measuring method and device, storage medium and terminal |
-
1984
- 1984-11-02 JP JP59232131A patent/JPS61110018A/en active Granted
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN115265825A (en) * | 2022-07-06 | 2022-11-01 | 东北大学 | Inner surface temperature measuring method and device, storage medium and terminal |
| CN115265825B (en) * | 2022-07-06 | 2024-04-16 | 东北大学 | Method and device for measuring temperature of inner surface, storage medium and terminal |
Also Published As
| Publication number | Publication date |
|---|---|
| JPH0511252B2 (en) | 1993-02-15 |
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