CN115265825A - Inner surface temperature measuring method and device, storage medium and terminal - Google Patents

Inner surface temperature measuring method and device, storage medium and terminal Download PDF

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CN115265825A
CN115265825A CN202210789080.8A CN202210789080A CN115265825A CN 115265825 A CN115265825 A CN 115265825A CN 202210789080 A CN202210789080 A CN 202210789080A CN 115265825 A CN115265825 A CN 115265825A
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temperature
estimation value
value
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temperature estimation
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CN115265825B (en
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梅国晖
张澳
王宏伟
赵树茂
张玖
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Northeastern University China
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    • GPHYSICS
    • G01MEASURING; TESTING
    • G01KMEASURING TEMPERATURE; MEASURING QUANTITY OF HEAT; THERMALLY-SENSITIVE ELEMENTS NOT OTHERWISE PROVIDED FOR
    • G01K11/00Measuring temperature based upon physical or chemical changes not covered by groups G01K3/00, G01K5/00, G01K7/00 or G01K9/00
    • G01K11/12Measuring temperature based upon physical or chemical changes not covered by groups G01K3/00, G01K5/00, G01K7/00 or G01K9/00 using changes in colour, translucency or reflectance
    • GPHYSICS
    • G06COMPUTING; CALCULATING OR COUNTING
    • G06FELECTRIC DIGITAL DATA PROCESSING
    • G06F17/00Digital computing or data processing equipment or methods, specially adapted for specific functions
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    • G06F17/11Complex mathematical operations for solving equations, e.g. nonlinear equations, general mathematical optimization problems
    • G06F17/12Simultaneous equations, e.g. systems of linear equations

Abstract

The invention discloses an inner surface temperature measuring method and device, a storage medium and a terminal, relates to the technical field of temperature detection, and mainly aims to solve the problem of low inner surface temperature measuring accuracy. The method mainly comprises the steps of obtaining actual measurement temperature values of a plurality of target point positions in the inner surface to be measured; respectively initializing the real temperature estimated values corresponding to the plurality of target point positions; and taking the real temperature estimation value as an iteration variable, establishing an iteration relation based on the corresponding relation between the measured temperature estimation value and the real temperature estimation value and the residual error between the measured temperature estimation value and the actual value, obtaining the final real temperature estimation value of the target points through iteration calculation, taking the final real temperature estimation value as an inner surface temperature measurement result, and determining the corresponding relation between the measured temperature estimation value and the real temperature estimation value based on an effective emissivity model. Mainly for the determination of the temperature of the inner surface.

Description

Inner surface temperature measuring method and device, storage medium and terminal
Technical Field
The invention relates to the technical field of temperature detection, in particular to an inner surface temperature measuring method and device, a storage medium and a terminal.
Background
The determination of the surface temperature is a very important measurement item in industrial production, and particularly in the fields of metallurgy, petrifaction, aerospace, energy, materials, electric power and the like, the determination of the surface temperature occupies a very important position. For example, in a gas turbine known in the equipment manufacturing industry as "industrial crown pearl on the crown", for every 1% increase in temperature, the blade strength decreases by 15%; the temperature of the filament in the field of illumination is 1% higher than the rated temperature, and the service life is shortened by 25%; in ground wind tunnel experiments and engine test runs in the field of aerospace, temperature is a key index for evaluating and improving engine performance. Therefore, the accurate measurement of the surface temperature has important significance in the aspects of improving the quality and performance of products, saving energy, reducing consumption, realizing safe production and the like.
The surface temperature determination method comprises a contact method and a non-contact method, wherein the non-contact surface temperature determination method is not influenced by the motion state, corrosivity and the like of the object to be measured, and is widely applied to industrial production. The non-contact surface temperature determination method determines the temperature of an object to be measured based on Planck blackbody radiation law by detecting radiation on the surface of the object, but the accuracy of temperature measurement is low when the surface to be measured is the inner surface of a cavity or a complex plane.
Disclosure of Invention
In view of the above, the present invention provides an inner surface temperature measurement method and apparatus, a storage medium, and a terminal, and mainly aims to solve the problem that the accuracy of temperature measurement is low for the inner surface of a cavity structure or the inner surface of a plane intersection structure in the prior art.
According to an aspect of the present invention, there is provided an internal surface temperature measuring method including:
acquiring actual measurement temperature values of a plurality of target point positions in the inner surface to be measured;
respectively initializing the real temperature estimated values corresponding to the plurality of target points;
and taking the real temperature estimation value as an iteration variable, establishing an iteration relation based on the corresponding relation between the measured temperature estimation value and the real temperature estimation value and the residual error between the measured temperature estimation value and the actual value, obtaining the final real temperature estimation value of the target points through iteration calculation, taking the final real temperature estimation value as an inner surface temperature measurement result, and determining the corresponding relation between the measured temperature estimation value and the real temperature estimation value based on an effective emissivity model.
Further, before obtaining actual values of the measured temperatures of the plurality of target point locations in the inner surface to be measured, the method further includes:
acquiring structural characteristic data, material optical characteristic data and temperature characteristic data of the inner surface to be detected;
constructing a structural model of the inner surface to be detected based on the structural characteristic data and the temperature characteristic data, and constructing a light beam tracking model based on the material optical characteristic data and the structural model;
and constructing an effective emissivity model based on the structural model and the light beam tracking model, wherein the effective emissivity model is used for calculating the effective emissivity of any target point position according to the temperature distribution of the inner surface to be measured.
Further, taking the true temperature estimation value as an iteration variable, establishing an iteration relation based on a corresponding relation between the measured temperature estimation value and the true temperature estimation value and a residual error between the measured temperature estimation value and an actual value, and obtaining a final true temperature estimation value of the plurality of target point locations through iterative computation, wherein the iterative computation comprises:
calculating according to the real temperature estimation value to obtain a measured temperature estimation value;
residual error calculation is carried out on the estimated measured temperature value and the actual measured temperature value, and a residual error result is obtained;
if the residual error result is larger than a preset threshold value, correcting the real temperature estimation value according to the residual error result and the iterative relational expression, and repeating the step of calculating to obtain the measured temperature estimation value according to the real temperature estimation value;
and if the residual error result of the estimated measured temperature value and the actual measured temperature value is less than or equal to the preset threshold value, taking the real temperature estimated value as the inner surface temperature measurement result.
Further, the calculating a measured temperature estimation value according to the true temperature estimation value includes:
obtaining the temperature distribution estimation result of the inner surface to be measured by carrying out interpolation calculation on the real temperature estimation value;
calculating to obtain the effective emissivity of the inner surface to be measured according to the temperature distribution by using a pre-constructed effective emissivity model;
and calculating to obtain a measured temperature estimated value according to the effective emissivity and the temperature measurement principle.
Further, after the residual calculation is performed on the estimated measured temperature value and the actual measured temperature value to obtain a residual result, the method further includes:
converting a residual equation corresponding to the actual measured temperature value and the estimated measured temperature value into a multi-element nonlinear objective function;
and (4) designing an iterative relation according to the multivariate nonlinear objective function to correct the real temperature estimation value.
According to another aspect of the present invention, there is provided an internal surface temperature measuring device including:
the acquisition module is used for respectively initializing the real temperature estimation values corresponding to the plurality of target point positions;
the initialization module is used for respectively initializing the real temperature estimation values of the target point positions;
and the calculation module is used for establishing an iterative relation formula based on a corresponding relation between the measured temperature estimation value and the actual temperature estimation value and a residual error between the measured temperature estimation value and the actual value by taking the actual temperature estimation value as an iterative variable, obtaining final actual temperature estimation values of the plurality of target point positions through iterative calculation, taking the final actual temperature estimation values as inner surface temperature measurement results, and determining the corresponding relation between the measured temperature estimation value and the actual temperature estimation value based on an effective emissivity model.
Further, the apparatus further comprises:
the acquisition module is further used for acquiring structural characteristic data, material optical characteristic data and temperature characteristic data of the inner surface to be detected;
the first construction module is used for constructing a structural model of the inner surface to be detected based on the structural characteristic data and the temperature characteristic data and constructing a light beam tracking model based on the material optical characteristic data and the structural model;
and the second construction module is used for constructing an effective emissivity model based on the structural model and the light beam tracking model, and the effective emissivity model is used for calculating the effective emissivity of any target point position according to the temperature distribution of the inner surface to be measured.
Further, the calculation module includes:
the first calculation unit is used for calculating to obtain a measured temperature estimation value according to the real temperature estimation value;
the second calculation unit is used for carrying out residual calculation on the estimated measured temperature value and the actual measured temperature value to obtain a residual result;
a third calculation unit, configured to modify the true temperature estimation value according to a residual result and an iterative relationship if the residual result is greater than a preset threshold, and repeat the step of calculating a measured temperature estimation value according to the true temperature estimation value;
and the determining unit is used for taking the real temperature estimation value as the inner surface temperature measurement result if the residual error result of the measured temperature estimation value and the measured temperature actual value is less than or equal to the preset threshold value.
Further, in a specific application scenario, the first calculating unit is configured to obtain a temperature distribution estimation result of the inner surface to be measured by performing interpolation calculation on the actual temperature estimation value;
calculating to obtain the effective emissivity of the inner surface to be measured according to the temperature distribution by using a pre-constructed effective emissivity model;
and calculating to obtain a measured temperature estimated value according to the effective emissivity and the temperature measurement principle.
Further, the apparatus further comprises:
the conversion module is used for converting a residual equation corresponding to the actual measured temperature value and the estimated measured temperature value into a multi-element nonlinear objective function;
and the calculation module is also used for correcting the real temperature estimation value according to the multi-element nonlinear objective function design iteration relation.
According to yet another aspect of the present invention, there is provided a storage medium having stored therein at least one executable instruction for causing a processor to perform operations corresponding to the above-described method for measuring an internal surface temperature.
According to still another aspect of the present invention, there is provided a terminal including: the system comprises a processor, a memory, a communication interface and a communication bus, wherein the processor, the memory and the communication interface complete mutual communication through the communication bus;
the memory is used for storing at least one executable instruction, and the executable instruction causes the processor to execute the operation corresponding to the internal surface temperature measuring method.
By means of the technical scheme, the technical scheme provided by the embodiment of the invention at least has the following advantages:
the invention provides an inner surface temperature measuring method and device, a storage medium and a terminal, wherein the embodiment of the invention obtains actual measured temperature values of a plurality of target point positions in an inner surface to be measured; respectively initializing real temperature estimated values of the target point positions; and taking the real temperature estimation value as an iteration variable, establishing an iteration relation based on a corresponding relation between the measured temperature estimation value and the real temperature estimation value and a residual error between the measured temperature estimation value and an actual value, obtaining a final real temperature estimation value of the target points through iterative calculation, taking the final real temperature estimation value as an inner surface temperature measurement result, determining the corresponding relation between the measured temperature estimation value and the real temperature estimation value based on an effective emissivity model, fully analyzing the influence of reflected radiation generated by a cavity effect on the accuracy of the measured temperature, and eliminating the influence of the reflected radiation on inaccurate measured temperature based on the ideas of active temperature correction and inversion reasoning to obtain a real temperature estimation value closer to the real temperature of the inner surface to be measured, thereby improving the accuracy of the determined inner surface temperature value.
The foregoing description is only an overview of the technical solutions of the present invention, and the embodiments of the present invention are described below in order to make the technical means of the present invention more clearly understood and to make the above and other objects, features, and advantages of the present invention more clearly understandable.
Drawings
Various other advantages and benefits will become apparent to those of ordinary skill in the art upon reading the following detailed description of the preferred embodiments. The drawings are only for purposes of illustrating the preferred embodiments and are not to be construed as limiting the invention. Also, like reference numerals are used to refer to like parts throughout the drawings. In the drawings:
FIG. 1 is a flow chart of a method for measuring an internal surface temperature according to an embodiment of the present invention;
FIG. 2 is a schematic diagram illustrating a temperature measurement principle of a temperature measurement device according to an embodiment of the present invention;
FIG. 3 illustrates a schematic view of an exemplary interior surface configuration provided by an embodiment of the present invention;
FIG. 4 is a flow chart of another method for measuring the temperature of an interior surface according to an embodiment of the present invention;
FIG. 5 is a flow chart illustrating another method for measuring internal surface temperature provided by an embodiment of the present invention;
FIG. 6 is a block diagram illustrating an apparatus for measuring an internal surface temperature according to an embodiment of the present invention;
fig. 7 is a schematic structural diagram of a terminal according to an embodiment of the present invention.
Detailed Description
Exemplary embodiments of the present disclosure will be described in more detail below with reference to the accompanying drawings. While exemplary embodiments of the present disclosure are shown in the drawings, it should be understood that the present disclosure may be embodied in various forms and should not be limited to the embodiments set forth herein. Rather, these embodiments are provided so that this disclosure will be thorough and complete, and will fully convey the scope of the disclosure to those skilled in the art.
The method aims at the existing non-contact surface temperature determination method, the temperature of the measured object is determined by detecting the radiation of the surface of the measured object based on the Planck blackbody radiation law, but when the surface to be measured is the inner surface of a cavity or a complex plane, the accuracy of temperature measurement is low. An embodiment of the present invention provides an internal surface temperature measurement method, as shown in fig. 1, the method includes:
101. and acquiring actual measurement temperature values of a plurality of target point positions in the inner surface to be measured.
In the embodiment of the invention, the actual measured temperature value is a plurality of temperature values obtained by measuring a plurality of target point positions in the inner surface to be measured by using temperature measuring equipment, wherein the plurality of target point positions can be set according to the distribution characteristics of the temperature and can also be set randomly; the temperature measuring device may be a luminance thermometer, and the embodiment of the present invention is not particularly limited with respect to the target point location and the temperature measuring device. As shown in fig. 2, it can be known that, when the temperature measurement device measures the inner surfaces of a multi-plane structure or a cavity, the collected radiation includes not only the inherent radiation generated by the surfaces of measurement points, but also the reflected radiation generated by other surfaces, and this reflected radiation is not shielded, and the total radiation of the inner surfaces is increased by the blending of the reflected radiation, which is often referred to as cavity effect. Wherein the interior surface of the multi-planar structure or cavity includes, but is not limited to, the structure shown in fig. 3.
102. And respectively initializing the real temperature estimated values corresponding to the plurality of target point positions.
In the embodiment of the present invention, the initialization of the real temperature estimation value may be set based on experience, or may be set randomly, and the embodiment of the present invention is not limited specifically. Because the actual value of the measured temperature is inaccurate relative to the actual temperature value of the target point location of the inner surface to be measured, the actual temperature value can be assumed as a known quantity, the assumed actual temperature value is an actual temperature estimation value, and an initial value is set for the actual temperature estimation value, so that an assumed measured temperature value, namely a measured temperature estimation value, is obtained according to the actual temperature estimation value.
103. And taking the real temperature estimation value as an iteration variable, establishing an iteration relation based on a corresponding relation between the measured temperature estimation value and the real temperature estimation value and a residual error between the measured temperature estimation value and an actual value, obtaining a final real temperature estimation value of the plurality of target point positions through iteration calculation, and taking the final real temperature estimation value as an inner surface temperature measurement result.
In the embodiment of the invention, when an assumed real temperature estimation value exists for any target point position of the inner surface to be measured, a corresponding measured temperature estimation value can be obtained based on the corresponding relation between the measured temperature value and the real temperature estimation value. Since the measured temperature actual value is the measured accurate value, if the measured temperature actual value and the measured temperature estimated value approach to be equal, the assumed true temperature estimated value also approaches to the true temperature value, that is, an accurate true temperature value (true temperature estimated value) is obtained according to an assumed true temperature value. Based on the inversion process, the real temperature estimation value is continuously corrected through iterative calculation so that the measured temperature estimation value approaches to the actual measured temperature value, and therefore the real temperature estimation value is obtained.
It should be noted that the correspondence between the measured temperature estimate and the actual temperature estimate is determined based on an effective emissivity model. For any point of the inner surface to be measured, due to the influence of the cavity effect, the radiation collected by the temperature collecting equipment at the point comprises the inherent radiation of the inner surface and the radiation projected by the relevant areaThis radiation is referred to as effective radiation. The inherent radiation is the black body radiation of the inner surface to be measured at the current point position and can be expressed by a Planck formula. The effective emissivity is the ratio of the radiation of the inner surface to be measured to the radiation of the black body at the reference temperature, and the formula is as follows:
Figure BDA0003733047570000071
wherein L isλThe spectral radiance, L, of the target point p along the direction omegabIs black body at temperature TrefSpectral emittance of lower, TdisAnd (3) representing the real temperature distribution of the inner surface to be measured, wherein epsilon represents the inherent emissivity, lambda represents the radiation wavelength, and p represents the target point position p. Wherein, TrefCan be determined according to specific application scenariosdisThe real temperature distribution is a main factor influencing the effective emissivity of the current point location. Since the measurement temperature value acquired by the temperature measurement device represents effective radiation and represents blackbody radiation, the corresponding relation between the measurement temperature estimated value and the real temperature estimated value can be described based on an effective emissivity model. The preset threshold value may be self-defined according to application requirements, and embodiments of the present invention are not particularly limited. Based on the ideas of active temperature correction and inversion, the deviation reason between the measured temperature value and the real temperature value is determined by analyzing the principle of radiation collection of temperature measuring equipment, the real temperature estimated value closest to the real temperature value of the target point position of the inner surface to be measured can be obtained, the influence of the cavity effect on the measured temperature value is eliminated, and therefore the more accurate inner surface temperature value is obtained.
In an embodiment of the present invention, for further explanation and limitation, as shown in fig. 4, before the obtaining actual values of the measured temperatures of the plurality of target points in the inner surface to be measured in step 101, the method further includes:
201. and acquiring structural characteristic data, material optical characteristic data and temperature characteristic data of the inner surface to be detected.
202. And constructing a structural model of the inner surface to be detected based on the structural characteristic data and the temperature characteristic data, and constructing a beam tracking model based on the material optical characteristic data and the structural model.
203. And constructing an effective emissivity model based on the structural model and the light beam tracking model.
In the embodiment of the invention, because the effective reflectivity is difficult to determine based on the measurement method, the effective emissivity of any point in the inner surface to be measured needs to be determined based on a mode of constructing an effective emissivity model. The essence of the effective emissivity model is an effective emissivity distribution function of the inner surface to be measured. The effective emissivity is closely related to factors such as inherent emissivity, wavelength, temperature distribution of the inner surface to be measured, position of a target point position, reflected energy distribution characteristics, measurement position of an infrared measuring instrument and the like. Therefore, it is necessary to obtain characteristic parameters of the inner surface to be measured, including: structural feature data, e.g., height, radius, curvature, etc., of the cylinder, cone; material optical characteristic data, e.g., reflectance, transmittance, absorbance, etc.; temperature profile data, e.g., temperature profile data, etc. The structural model includes a cavity geometric model of the inner surface to be measured and a probability model describing optical properties of the cavity, such as an absorption probability model, a reflection probability model, and the like. The light beam tracking model is constructed based on a light beam tracking process of a simulation light beam in the structure model. The process of beam tracking specifically comprises the following steps: 1) Setting a starting point and a target point of the radiant energy to obtain an incident direction omega; 2) Dispersing incident radiation energy into N beams, and dispersing single beam energy into w0=1 (typically take N = 10)6-109) (ii) a 3) Tracing the light beam, and solving an intersection point of the light beam and the wall surface of the cavity; 4) Judging whether the light beam is absorbed or not based on an absorption/reflection probability model, and calculating the energy increased by the cavity according to the temperature of an absorption point when the light beam is absorbed; 5) If reflection occurs, determining a reflection direction based on a reflection direction probability model; 6) Calculating the next intersection point with the cavity according to the reflection direction; 7) Repeating the processes of 3) -6) until the light beam is absorbed or escapes from the cavity opening; 8) Repeating the processing steps 1) to 7) on the N light beams, and counting the energy absorbed by the inner surface to be measured based on the Monte Carlo method, wherein the energy is represented as Nα(ii) a According to kirchhoff's law: the object good at emission is also good at absorption, and can be calculated by calculating the target point along the direction omegaAbsorption rate, determining effective emissivityeThe formula is expressed as:
Figure BDA0003733047570000081
wherein, NαIs the radiant energy absorbed by the inner surface, with N being the radiant energy of the starting point.
It should be noted that the effective emissivity calculation model represents the mutual radiation relationship between points of the inner surface with the cavity effect, and the accuracy of the effective emissivity model directly affects the accuracy of the inversion method. For example, the inner surface to be measured is usually a mixed reflection of specular reflection and diffuse reflection, and if a diffuse approximation is adopted, a large error is brought, and a bidirectional reflection distribution function of an interface needs to be established for expression; secondly, the effective radiation characteristics and the distribution rule among the inner surfaces need to be researched; in addition, the non-uniform diffuse reflection of the mirror can cause the effective radiation to have directional sensitivity, so that the energy received in different directions has difference. An effective emissivity model is constructed based on the characteristic data of the inner surface to be measured and a Monte Carlo method, so that the influence of the structure, materials and other factors shown by the measurement on the effective emissivity can be fully fused, the accuracy of the effective emissivity model is ensured, the requirement of an inversion process on the accuracy of the effective emissivity is met, and an accurate real temperature estimation value is obtained.
For further explanation and limitation, as shown in fig. 5, in step 103, taking an initial value of the real temperature estimation value as an iteration initial value, taking the actual measured temperature value as an iteration target value, and performing an iterative calculation based on a corresponding relationship between the measured temperature value and the real temperature estimation value to obtain real temperature estimation values of the plurality of target points, the method includes:
301. and calculating to obtain a measured temperature estimated value according to the real temperature estimated value.
302. And carrying out residual calculation on the estimated measured temperature value and the actual measured temperature value to obtain a residual result.
303. And if the residual error result is larger than a preset threshold value, correcting the real temperature estimation value according to the residual error result and the iteration relation, and repeating the step of calculating to obtain the measured temperature estimation value according to the real temperature estimation value.
304. And if the residual error result of the measured temperature estimated value and the measured temperature actual value is less than or equal to the preset threshold value, taking the corresponding real temperature estimated value as the inner surface temperature measurement result.
In the embodiment of the invention, because the relationship between the real temperature estimation value and the measured temperature estimation value is established based on the effective emissivity, the effective emissivity of each target point needs to be obtained by calculating according to the real temperature estimation value of each target point, and then the measured temperature estimation value of the point is calculated according to the effective emissivity. The method comprises the steps of calculating a residual error between a measured temperature estimated value and a measured temperature actual value, and correcting a real temperature estimated value based on the deviation between a residual error result and a preset threshold value, so that the real temperature estimated value is closer to a real temperature value of a current target point position of the inner surface to be measured when the measured temperature estimated value tends to the measured temperature actual value, the correction of the real temperature estimated value based on the measured temperature actual value is realized, and the accurate real temperature estimated value is obtained.
For further explanation and limitation, step 301 of calculating a measured temperature estimate from the true temperature estimate comprises:
and carrying out interpolation calculation on the initial value of the real temperature estimation value to obtain a target temperature distribution estimation result of the inner surface to be measured.
And calculating to obtain the effective emissivity of the inner surface to be measured according to the target temperature distribution by using a pre-constructed effective emissivity model.
And calculating to obtain a measured temperature estimated value according to the effective emissivity and the temperature measurement principle.
In the embodiment of the invention, interpolation calculation is carried out according to the initial value of the target temperature of each target point position to obtain the estimation result of the target temperature distribution of the inner surface to be measured, which is represented as Tdis_estThe formula is expressed as: t isdis_est=I(Tt_est-1,…,Tt_est-p,…,Tt_est-N) (3); wherein, Tt_est-pIs a target pointThe true temperature estimate for bit p, N is the number of target bit locations. After the target temperature distribution of the inner surface to be measured is obtained, an approximate value of the effective emissivity of each target point position is calculated by utilizing an effective emissivity model which is constructed in advance based on the characteristic data of the inner surface to be measured. And after the effective emissivity of each target point is obtained, calculating a measurement temperature estimation value according to a temperature measurement principle. Specifically, taking the measurement principle of the luminance thermometer as an example for analysis, the measured temperature value and the real temperature value should satisfy the following formula: epsilone(ε,λ,Tdis,Tref,p,ω)Lb(λ,Tref)=Lb(λ,Tm-p) (4); wherein L isb(λ,Tm-p) Black body radiation energy, L, collected for temperature measuring equipmentbIs the Planck formula. The planck formula is:
Figure BDA0003733047570000101
wherein T is thermodynamic temperature, K, C1Is the first radiation constant of 3.741832 x 10-16W·m2,C2Is the second radiation constant of 1.438786 × 10-16m.K. Substituting the formula (5) into the formula (4) to obtain a measured temperature value T of a point pm-pAnd TdisCan be expressed as formula Tm-p=f(ε,λ,TdisP, ω) (6); and f is a relationship derived based on the effective emissivity and is used for representing the influence of the cavity effect on the measured temperature. Based on the derivation, the target temperature distribution estimation result T of the inner surface to be measured is obtaineddis_estThereafter, a measured temperature estimate, denoted T, may be calculatedm_est-pThe formula is as follows: t ism_est-p=f'(ε,λ,Tdis_estP, ω) (7); wherein f' is a corresponding relationship derived based on the effective emissivity model.
For further illustration and limitation, in an embodiment of the present invention, after performing a residual calculation on the estimated measured temperature value and the actual measured temperature value in step 302 to obtain a residual result, the method further includes:
converting a residual equation corresponding to the actual measured temperature value and the estimated measured temperature value into a multi-element nonlinear objective function;
and (4) designing an iterative relation according to the multivariate nonlinear objective function to correct the real temperature estimation value.
In the embodiment of the present invention, after obtaining the measured temperature estimation value of each target point, in order to obtain the true temperature estimation value, the equation system needs to be solved:
Figure BDA0003733047570000111
wherein, Tm-pIs the actual value of the measured temperature, T, corresponding to the target point position Pm_est-pIs the measured temperature estimation value corresponding to the target point location P, and N is the number of the target point locations. And enabling the residual error between the estimated measured temperature values and the actual measured temperature values of all the points to approach 0, so that the target estimated temperature approaches the real temperature value. The solving method is a key step of the inversion algorithm. Since equation (8) is an implicit system of function equations, it is difficult to solve directly. And converting the linear function into a multi-element nonlinear objective function in an optimization problem to obtain an approximate solution. Wherein the objective function is defined as:
Figure BDA0003733047570000112
wherein, Δ TpMeasuring the residual error of the temperature estimation value and the actual value for the p point, FobjThe square sum of the residual errors of the measured temperature estimated values corresponding to the N target points and the actual value is obtained. In the multivariate nonlinear programming problem, the real temperature estimation value has a lower limit of 0K, but the research object of the problem has high temperature characteristics, and the lower limit can be not considered, and an unconstrained optimization method such as a steepest descent method is adopted for optimization, so that the measurement temperature estimation value is converged. Specifically, the formula is obtained according to the formulas (3), (7), (9):
Figure BDA0003733047570000113
where k is the number of iterations and a is the step size. The formula is derived:
Figure BDA0003733047570000114
wherein i is an index number of the iteration. Further according to an iterative formula for obtaining the true temperature estimation value:
Figure BDA0003733047570000115
because the relation determined based on the effective emissivity model cannot be accurately derived, a numerical method is adopted to approximate the derivation, and the formula is as follows:
Figure BDA0003733047570000116
Figure BDA0003733047570000117
wherein, Tt-pFor the true temperature estimate, Δ t is the amount of change in the derivative of the difference value.
The invention provides an inner surface temperature measuring method, which comprises the steps of obtaining actual measuring temperature values of a plurality of target point positions in an inner surface to be measured; respectively initializing the real temperature estimated values corresponding to the plurality of target point positions; and taking the real temperature estimation value as an iteration variable, establishing an iteration relation based on a corresponding relation between the measured temperature estimation value and the real temperature estimation value and a residual error between the measured temperature estimation value and an actual value, obtaining a final real temperature estimation value of the target points through iterative calculation, taking the final real temperature estimation value as an inner surface temperature measurement result, determining the corresponding relation between the measured temperature estimation value and the real temperature estimation value based on an effective emissivity model, fully analyzing the influence of reflected radiation generated by a cavity effect on the accuracy of the measured temperature, and eliminating the influence of the reflected radiation on inaccurate measured temperature based on the ideas of active temperature correction and inversion reasoning to obtain a real temperature estimation value closer to the real temperature of the inner surface to be measured, thereby improving the accuracy of the determined inner surface temperature value.
Further, as an implementation of the method shown in fig. 1, an embodiment of the present invention provides an inner surface temperature measuring apparatus, as shown in fig. 6, the apparatus including:
the obtaining module 41 is configured to obtain actual measured temperature values of a plurality of target point locations in the inner surface to be measured;
the initialization module 42 is configured to respectively initialize the real temperature estimation values corresponding to the plurality of target point locations;
and the calculating module 43 is configured to use the actual temperature estimated value as an iteration variable, establish an iteration relation based on a corresponding relationship between the measured temperature estimated value and the actual temperature estimated value and a residual between the measured temperature estimated value and an actual value, obtain final actual temperature estimated values of the plurality of target points through iterative calculation, use the final actual temperature estimated values as an inner surface temperature measurement result, and determine a corresponding relationship between the measured temperature estimated value and the actual temperature estimated value based on an effective emissivity model.
Further, the apparatus further comprises:
the acquisition module is further used for acquiring structural characteristic data, material optical characteristic data and temperature characteristic data of the inner surface to be detected;
the first construction module is used for constructing a structural model of the inner surface to be detected based on the structural characteristic data and the temperature characteristic data and constructing a light beam tracking model based on the material optical characteristic data and the structural model;
and the second construction module is used for constructing an effective emissivity model based on the structure model and the light beam tracking model, and the effective emissivity model is used for calculating the effective emissivity of any target point according to the temperature distribution of the inner surface to be measured.
Further, the calculating module 43 includes:
the first calculation unit is used for calculating to obtain a measured temperature estimation value according to the real temperature estimation value;
the second calculation unit is used for carrying out residual calculation on the estimated measured temperature value and the actual measured temperature value to obtain a residual result;
a third calculating unit, configured to, if the residual result is greater than a preset threshold, modify the true temperature estimation value according to the residual result and the iterative relationship, and repeat the step of obtaining the measured temperature estimation value by calculation according to the true temperature estimation value;
and the determining unit is used for taking the corresponding real temperature estimation value as the inner surface temperature measurement result if the residual error result of the measurement temperature estimation value and the measurement temperature actual value is less than or equal to the preset threshold value.
Further, in a specific application scenario, the first calculating unit is configured to obtain the temperature distribution of the inner surface to be measured by performing interpolation calculation on the real temperature estimation value;
calculating to obtain the effective emissivity of the inner surface to be measured according to the temperature distribution by using a pre-constructed effective emissivity model;
and calculating to obtain a measured temperature estimated value according to the effective emissivity and the temperature measurement principle.
Further, the apparatus further comprises:
the conversion module is used for converting a residual equation corresponding to the actual measured temperature value and the estimated measured temperature value into a multi-element nonlinear objective function;
the calculating module 43 is further configured to correct the real temperature estimation value according to a multivariate nonlinear objective function design iterative relationship.
The invention provides an inner surface temperature measuring device, which is characterized in that the actual measuring temperature values of a plurality of target point positions in an inner surface to be measured are obtained; respectively initializing real temperature estimated values of the target point positions; and taking the real temperature estimation value as an iteration variable, establishing an iteration relation based on a corresponding relation between the measured temperature estimation value and the real temperature estimation value and a residual error between the measured temperature estimation value and an actual value, obtaining a final real temperature estimation value of the target points through iterative calculation, taking the final real temperature estimation value as an inner surface temperature measurement result, determining the corresponding relation between the measured temperature estimation value and the real temperature estimation value based on an effective emissivity model, fully analyzing the influence of reflected radiation generated by a cavity effect on the accuracy of the measured temperature, and eliminating the influence of the reflected radiation on inaccurate measured temperature based on the ideas of active temperature correction and inversion reasoning to obtain a real temperature estimation value closer to the real temperature of the inner surface to be measured, thereby improving the accuracy of the determined inner surface temperature value.
According to an embodiment of the present invention, there is provided a storage medium storing at least one executable instruction, the computer executable instruction being capable of performing the method for measuring an internal surface temperature in any of the method embodiments described above.
Fig. 7 is a schematic structural diagram of a terminal according to an embodiment of the present invention, and the specific embodiment of the present invention does not limit the specific implementation of the terminal.
As shown in fig. 7, the terminal may include: a processor (processor) 502, a Communications Interface (Communications Interface) 504, a memory 506, and a communication bus 508.
Wherein: the processor 502, communication interface 504, and memory 506 communicate with one another via a communication bus 508.
A communication interface 504 for communicating with network elements of other devices, such as clients or other servers.
The processor 502 is configured to execute the program 510, and may specifically execute the relevant steps in the above-described embodiment of the method for measuring an inner surface temperature.
In particular, program 510 may include program code that includes computer operating instructions.
The processor 502 may be a central processing unit CPU, or an Application Specific Integrated Circuit ASIC (Application Specific Integrated Circuit), or one or more Integrated circuits configured to implement an embodiment of the present invention. The terminal comprises one or more processors, which can be the same type of processor, such as one or more CPUs; or may be different types of processors such as one or more CPUs and one or more ASICs.
A memory 506 for storing a program 510. The memory 506 may comprise high-speed RAM memory, and may also include non-volatile memory (non-volatile memory), such as at least one disk memory.
The program 510 may specifically be used to cause the processor 502 to perform the following operations:
acquiring actual measurement temperature values of a plurality of target point positions in the inner surface to be measured;
respectively initializing the real temperature estimated values corresponding to the plurality of target points;
and taking the actual temperature estimation value as an iteration variable, establishing an iteration relation based on a corresponding relation between the measured temperature estimation value and the actual temperature estimation value and a residual error between the measured temperature estimation value and an actual value, obtaining final actual temperature estimation values of the target points through iterative calculation, taking the final actual temperature estimation values as an inner surface temperature measurement result, and determining the corresponding relation between the measured temperature estimation value and the actual temperature estimation value based on an effective emissivity model.
It will be apparent to those skilled in the art that the modules or steps of the present invention described above may be implemented by a general purpose computing device, they may be centralized on a single computing device or distributed across a network of multiple computing devices, and alternatively, they may be implemented by program code executable by a computing device, such that they may be stored in a storage device and executed by a computing device, and in some cases, the steps shown or described may be performed in an order different than that described herein, or they may be separately fabricated into individual integrated circuit modules, or multiple ones of them may be fabricated into a single integrated circuit module. Thus, the present invention is not limited to any specific combination of hardware and software.
The above description is only a preferred embodiment of the present invention and is not intended to limit the present invention, and various modifications and changes may be made by those skilled in the art. Any modification, equivalent replacement, or improvement made within the spirit and principle of the present invention should be included in the protection scope of the present invention.

Claims (8)

1. An internal surface temperature measurement method, comprising:
acquiring actual measurement temperature values of a plurality of target point positions in the inner surface to be measured;
respectively initializing the real temperature estimated values corresponding to the plurality of target points;
and taking the real temperature estimation value as an iteration variable, establishing an iteration relation based on the corresponding relation between the measured temperature estimation value and the real temperature estimation value and the residual error between the measured temperature estimation value and the actual value, obtaining the final real temperature estimation value of the target points through iteration calculation, taking the final real temperature estimation value as an inner surface temperature measurement result, and determining the corresponding relation between the measured temperature estimation value and the real temperature estimation value based on an effective emissivity model.
2. The method of claim 1, wherein prior to obtaining actual values of measured temperatures for a plurality of target points in the interior surface under test, the method further comprises:
acquiring structural characteristic data, material optical characteristic data and temperature characteristic data of the inner surface to be detected;
constructing a structural model of the inner surface to be detected based on the structural characteristic data and the temperature characteristic data, and constructing a beam tracking model based on the material optical characteristic data and the structural model;
and constructing an effective emissivity model based on the structural model and the light beam tracking model, wherein the effective emissivity model is used for calculating the effective emissivity of any target point position according to the temperature distribution of the inner surface to be measured.
3. The method of claim 1, wherein the step of using the true temperature estimation value as an iteration variable, establishing an iteration relation based on a correspondence between the measured temperature estimation value and the true temperature estimation value and a residual between the measured temperature estimation value and an actual value, obtaining a final true temperature estimation value of the plurality of target points through iteration calculation, and using the final true temperature estimation value as an inner surface temperature measurement result comprises:
calculating according to the real temperature estimation value to obtain a measured temperature estimation value;
performing residual calculation on the estimated measured temperature value and the actual measured temperature value to obtain a residual result;
if the residual error result is larger than a preset threshold value, correcting the real temperature estimation value according to the residual error result and the iterative relational expression, and repeating the step of calculating to obtain the measured temperature estimation value according to the real temperature estimation value;
and if the residual error result of the estimated measured temperature value and the actual measured temperature value is less than or equal to the preset threshold value, taking the corresponding real temperature estimated value as the inner surface temperature measurement result.
4. The method of claim 3, wherein calculating a measured temperature estimate from the true temperature estimate comprises:
carrying out interpolation calculation on the real temperature estimation value to obtain a temperature distribution estimation result of the inner surface to be detected;
calculating to obtain the effective emissivity of the inner surface to be measured according to the temperature distribution estimation result by utilizing a pre-constructed effective emissivity model;
and calculating to obtain a measured temperature estimated value according to the effective emissivity and the temperature measurement principle.
5. The method of claim 3, wherein after performing the residual calculation on the estimated measured temperature value and the actual measured temperature value to obtain a residual result, the method further comprises:
converting a residual equation corresponding to the actual measured temperature value and the estimated measured temperature value into a multi-element nonlinear objective function;
and (4) designing an iterative relation according to the multivariate nonlinear objective function to correct the real temperature estimation value.
6. An internal surface temperature measuring device, comprising:
the acquisition module is used for acquiring actual measurement temperature values of a plurality of target point positions in the inner surface to be measured;
the initialization module is used for respectively initializing the real temperature estimation values corresponding to the plurality of target point positions;
and the calculation module is used for establishing an iterative relational expression by taking the real temperature estimation value as an iterative variable based on the corresponding relation between the measured temperature estimation value and the real temperature estimation value and the residual error between the measured temperature estimation value and the actual value, obtaining the final real temperature estimation values of the target points through iterative calculation, taking the final real temperature estimation values as the inner surface temperature measurement results, and determining the corresponding relation between the measured temperature estimation value and the real temperature estimation value based on the effective emissivity model.
7. A storage medium having stored therein at least one executable instruction that causes a processor to perform operations corresponding to the internal surface temperature measurement method of any one of claims 1-5.
8. A terminal, comprising: the system comprises a processor, a memory, a communication interface and a communication bus, wherein the processor, the memory and the communication interface complete mutual communication through the communication bus;
the memory is configured to store at least one executable instruction that causes the processor to perform operations corresponding to the interior surface temperature measurement method of any of claims 1-5.
CN202210789080.8A 2022-07-06 Method and device for measuring temperature of inner surface, storage medium and terminal Active CN115265825B (en)

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