JPS5485079A - Simultaneous measurement method of temperature and emissivity - Google Patents

Simultaneous measurement method of temperature and emissivity

Info

Publication number
JPS5485079A
JPS5485079A JP15344877A JP15344877A JPS5485079A JP S5485079 A JPS5485079 A JP S5485079A JP 15344877 A JP15344877 A JP 15344877A JP 15344877 A JP15344877 A JP 15344877A JP S5485079 A JPS5485079 A JP S5485079A
Authority
JP
Japan
Prior art keywords
temperature
emissivity
radiation
epsilon
cavity
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP15344877A
Other languages
Japanese (ja)
Other versions
JPS5940250B2 (en
Inventor
Toru Inouchi
Tsugio Ishida
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Nippon Steel Corp
Original Assignee
Nippon Steel Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Nippon Steel Corp filed Critical Nippon Steel Corp
Priority to JP15344877A priority Critical patent/JPS5940250B2/en
Publication of JPS5485079A publication Critical patent/JPS5485079A/en
Publication of JPS5940250B2 publication Critical patent/JPS5940250B2/en
Expired legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J5/00—Radiation pyrometry, e.g. infrared or optical thermometry
    • G01J5/0003—Radiation pyrometry, e.g. infrared or optical thermometry for sensing the radiant heat transfer of samples, e.g. emittance meter

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Radiation Pyrometers (AREA)

Abstract

PURPOSE:To make possible immediate use of the temperature-emissivity simultaneous measuring radiation thermometer anywhere by making possible automatic correction of parameter alpha of the operation formulas used for calculation of temperature and emissivity. CONSTITUTION:A cavity 2 whose inside surface is a reflectance mirror face and is of tubular form is placed on the measuring object 1 by leaving a specing therebetween. A radiation thermometer 3 is placed thereon. An optical roughness gauge is added to the thermometer 3 and the radiation energies E1, E2 from the object having simply transmitted in the cavity and having transmitted after making multiple reflections in the cavity are measured. Surface roughness is then measured. From this roughness, the parameter alpha of the operation formulas epsilon=(alpha+1-alphaG)/G and Eb (T)=E1/epsilon (here G=E1/E2, Eb(T) is the radiation energy of the black body of a temperature T) for calculating the temperature T and emissivity epsilon from the radiation energies is corrected, whereby the correct temperature and emissivity are obtained.
JP15344877A 1977-12-20 1977-12-20 How to measure temperature and emissivity simultaneously Expired JPS5940250B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP15344877A JPS5940250B2 (en) 1977-12-20 1977-12-20 How to measure temperature and emissivity simultaneously

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP15344877A JPS5940250B2 (en) 1977-12-20 1977-12-20 How to measure temperature and emissivity simultaneously

Publications (2)

Publication Number Publication Date
JPS5485079A true JPS5485079A (en) 1979-07-06
JPS5940250B2 JPS5940250B2 (en) 1984-09-28

Family

ID=15562764

Family Applications (1)

Application Number Title Priority Date Filing Date
JP15344877A Expired JPS5940250B2 (en) 1977-12-20 1977-12-20 How to measure temperature and emissivity simultaneously

Country Status (1)

Country Link
JP (1) JPS5940250B2 (en)

Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2002506988A (en) * 1998-03-18 2002-03-05 アプライド マテリアルズ インコーポレイテッド Substrate temperature measuring method and substrate temperature measuring device
WO2008013004A1 (en) 2006-07-27 2008-01-31 Kabushiki Kaisha Kobe Seiko Sho Temperature measuring method and temperature measuring device of steel plate, and temperature control method of steel plate
JP2010066132A (en) * 2008-09-11 2010-03-25 Nippon Steel Corp Method of controlling temperature in continuous annealing furnace, and continuous annealing furnace
JP2020034430A (en) * 2018-08-30 2020-03-05 株式会社チノー Temperature measurement method, and temperature measurement device
CN115265825A (en) * 2022-07-06 2022-11-01 东北大学 Inner surface temperature measuring method and device, storage medium and terminal

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH01169561U (en) * 1988-05-18 1989-11-30
JPH0240750U (en) * 1988-09-07 1990-03-20

Cited By (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2002506988A (en) * 1998-03-18 2002-03-05 アプライド マテリアルズ インコーポレイテッド Substrate temperature measuring method and substrate temperature measuring device
WO2008013004A1 (en) 2006-07-27 2008-01-31 Kabushiki Kaisha Kobe Seiko Sho Temperature measuring method and temperature measuring device of steel plate, and temperature control method of steel plate
US8812168B2 (en) 2006-07-27 2014-08-19 Kobe Steel, Ltd. Temperature measuring method and temperature measuring device of steel plate, and temperature control method of steel plate
JP2010066132A (en) * 2008-09-11 2010-03-25 Nippon Steel Corp Method of controlling temperature in continuous annealing furnace, and continuous annealing furnace
JP2020034430A (en) * 2018-08-30 2020-03-05 株式会社チノー Temperature measurement method, and temperature measurement device
CN115265825A (en) * 2022-07-06 2022-11-01 东北大学 Inner surface temperature measuring method and device, storage medium and terminal
CN115265825B (en) * 2022-07-06 2024-04-16 东北大学 Method and device for measuring temperature of inner surface, storage medium and terminal

Also Published As

Publication number Publication date
JPS5940250B2 (en) 1984-09-28

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