CN117288334A - Temperature measurement calibration method, device, equipment and storage medium - Google Patents
Temperature measurement calibration method, device, equipment and storage medium Download PDFInfo
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Abstract
The application provides a temperature measurement calibration method, device, equipment and storage medium, relates to the technical field of infrared temperature measurement, and is used for guaranteeing the temperature measurement precision of an infrared temperature measurement device outside a calibration temperature measurement range while guaranteeing the temperature measurement precision of the infrared temperature measurement device in the calibration temperature measurement range, and the method comprises the following steps: acquiring theoretical output values of the infrared temperature measuring device at different theoretical temperatures to obtain a plurality of first data pairs; establishing a corresponding relation between a theoretical output value and a theoretical temperature according to a plurality of first data pairs; acquiring actual output values of the infrared temperature measuring device at different calibration temperatures to obtain a plurality of second data pairs; the calibration temperature is the temperature within a preset temperature range; correcting the corresponding relation according to the plurality of second data pairs to obtain a corrected relation, wherein the corrected relation is used for determining an output value of the infrared temperature measuring device at the target temperature; the target temperature includes a temperature within a preset temperature range and a temperature outside the preset temperature range.
Description
Technical Field
The application relates to the technical field of infrared temperature measurement, in particular to a temperature measurement calibration method, a device, equipment and a storage medium.
Background
In nature, all objects above absolute zero are constantly radiating energy outwards. The principle of infrared temperature measurement is to calculate the temperature of a target by measuring the infrared radiation of the target, so that the infrared temperature measurement device is usually required to be calibrated. The traditional calibration method is to collect output values of an infrared temperature measuring device of a temperature measuring point in a known temperature measuring range, and then calibrate according to the output values. Therefore, the temperature measurement precision of the calibrated temperature measurement range can be ensured, and the temperature measurement precision is poor when the temperature exceeds the temperature measurement range.
Disclosure of Invention
Based on the technical problems, the application provides a temperature measurement calibration method, a device, equipment and a storage medium, which can ensure the temperature measurement precision in the calibrated temperature measurement range and simultaneously ensure the temperature measurement precision outside the temperature measurement range.
In a first aspect, the present application provides a temperature measurement calibration method, including: acquiring theoretical output values of the infrared temperature measuring device at different theoretical temperatures to obtain a plurality of first data pairs; a first data pair comprising a theoretical temperature and a corresponding theoretical output value; establishing a corresponding relation between a theoretical output value and a theoretical temperature according to a plurality of first data pairs; the corresponding relation is used for reflecting a theoretical output value corresponding to any theoretical temperature; acquiring actual output values of the infrared temperature measuring device at different calibration temperatures to obtain a plurality of second data pairs; a second data pair comprising a calibration temperature and corresponding actual output value; the calibration temperature is the temperature within a preset temperature range; correcting the corresponding relation according to the plurality of second data pairs to obtain a corrected relation, and taking the corrected relation as a temperature measurement calibration result of the infrared temperature measurement device; the correction relation is used for determining an output value of the infrared temperature measuring device at the target temperature; the target temperature includes a temperature within a preset temperature range and a temperature outside the preset temperature range.
In a possible implementation manner, acquiring theoretical output values of the infrared temperature measurement device at different theoretical temperatures includes: for any theoretical temperature, determining the target spectral radiant exitance of the black body at the theoretical temperature; substituting the target spectral radiation emergent degree into a preset theoretical calculation model, calculating a target output value of the infrared temperature measuring device, and taking the target output value as a theoretical output value corresponding to the theoretical temperature; the theoretical calculation model is pre-established based on optical characteristic parameters of the infrared temperature measuring device, wherein the optical characteristic parameters comprise loss parameters of an optical system of the infrared temperature measuring device to spectrum radiation and response parameters of a detector of the infrared temperature measuring device to the spectrum radiation.
In one possible implementation, the optical characteristic parameters include a start wavelength, a cut-off wavelength, a spectral transmittance, and a spectral response of the infrared temperature measurement device; substituting the target spectral radiant exitance into a theoretical calculation model to calculate a target output value of the infrared temperature measuring device, comprising: and carrying out fixed integral operation on the product of the spectral transmittance, the spectral response and the target spectral radiation exitance by taking the initial wavelength as an integral lower limit and the cut-off wavelength as an integral upper limit to obtain a target output value of the infrared temperature measuring device.
In a possible implementation manner, establishing a corresponding relation between a theoretical output value and a theoretical temperature according to a plurality of first data pairs includes: acquiring a plurality of fitting functions, and fitting a plurality of first data pairs based on each fitting function; and taking a fitting function with the fitting degree larger than the preset degree as a corresponding relation.
In a possible implementation manner, acquiring actual output values of the infrared temperature measurement device at different calibration temperatures includes: for an object to be measured at any calibration temperature, measuring the temperature of the object to be measured by an infrared temperature measuring device, and acquiring an actual output value of the infrared temperature measuring device; and taking the actual temperature of the object to be measured and the actual output value of the infrared temperature measuring device as a second data pair.
In a possible implementation manner, correcting the correspondence relationship according to the plurality of second data pairs includes: determining the position relation between each second data pair and the function image of the corresponding relation; according to the position relation, adjusting the function image; the adjusting comprises rotation, translation or scaling, and the fitting degree of the adjusted function image and each second data pair is larger than that of the function image before the adjusting.
According to the method, theoretical output values of the infrared temperature measuring device at different theoretical temperatures are obtained from the angle of the working principle of the infrared temperature measuring device, and a plurality of first data pairs are obtained, wherein one first data pair comprises one theoretical temperature and a corresponding theoretical output value. According to the first data pairs, the corresponding relation between the theoretical output value and the theoretical temperature is simulated, so that the change trend of the response output of the infrared temperature measuring device in a larger temperature range is predicted. Further, the method obtains actual output values of the infrared temperature measuring device at different calibration temperatures to obtain a plurality of second data pairs, corrects the corresponding relation obtained through simulation according to the second data pairs to obtain a correction relation, and takes the correction relation as a temperature measurement calibration result of the infrared temperature measuring device. The correction relation not only can determine the temperature in the preset temperature range corresponding to the calibration temperature, but also can determine the temperature outside the preset temperature range. Compared with the traditional calibration method, the infrared temperature measuring device can only measure the temperature in the calibration temperature measuring range, and the temperature measuring precision of the temperature outside the calibration temperature measuring range is poorer.
In a second aspect, the present application provides a temperature measurement calibration device, which includes an acquisition unit and a processing unit; the acquisition unit is used for acquiring theoretical output values of the infrared temperature measuring device at different theoretical temperatures to obtain a plurality of first data pairs; a first data pair comprising a theoretical temperature and a corresponding theoretical output value; the processing unit is used for establishing a corresponding relation between a theoretical output value and a theoretical temperature according to the plurality of first data pairs; the corresponding relation is used for reflecting a theoretical output value corresponding to any theoretical temperature; the acquisition unit is also used for acquiring actual output values of the infrared temperature measuring device at different calibration temperatures to obtain a plurality of second data pairs; a second data pair comprising a calibration temperature and corresponding actual output value; the calibration temperature is the temperature within a preset temperature range; the processing unit is also used for correcting the corresponding relation according to the plurality of second data pairs to obtain a corrected relation, and taking the corrected relation as a temperature measurement calibration result of the infrared temperature measurement device; the correction relation is used for determining an output value of the infrared temperature measuring device at the target temperature; the target temperature includes a temperature within a preset temperature range and a temperature outside the preset temperature range.
In a possible implementation manner, the acquiring unit is specifically configured to: for any theoretical temperature, determining the target spectral radiant exitance of the black body at the theoretical temperature; substituting the target spectral radiation emergent degree into a preset theoretical calculation model, calculating a target output value of the infrared temperature measuring device, and taking the target output value as a theoretical output value corresponding to the theoretical temperature; the theoretical calculation model is pre-established based on optical characteristic parameters of the infrared temperature measuring device, wherein the optical characteristic parameters comprise loss parameters of an optical system of the infrared temperature measuring device to spectrum radiation and response parameters of a detector of the infrared temperature measuring device to the spectrum radiation.
In one possible implementation, the optical characteristic parameters include a start wavelength, a cut-off wavelength, a spectral transmittance, and a spectral response of the infrared temperature measurement device; the acquisition unit is specifically configured to: and carrying out fixed integral operation on the product of the spectral transmittance, the spectral response and the target spectral radiation exitance by taking the initial wavelength as an integral lower limit and the cut-off wavelength as an integral upper limit to obtain a target output value of the infrared temperature measuring device.
In a possible implementation manner, the processing unit is specifically configured to: acquiring a plurality of fitting functions, and fitting a plurality of first data pairs based on each fitting function; and taking a fitting function with the fitting degree larger than the preset degree as a corresponding relation.
In a possible implementation manner, the acquiring unit is specifically configured to: for an object to be measured at any calibration temperature, measuring the temperature of the object to be measured by an infrared temperature measuring device, and acquiring an actual output value of the infrared temperature measuring device; and taking the actual temperature of the object to be measured and the actual output value of the infrared temperature measuring device as a second data pair.
In a possible implementation manner, the processing unit is specifically configured to: determining the position relation between each second data pair and the function image of the corresponding relation; according to the position relation, adjusting the function image; the adjusting comprises rotation, translation or scaling, and the fitting degree of the adjusted function image and each second data pair is larger than that of the function image before the adjusting.
In a third aspect, the present application provides an electronic device, comprising: a processor and a memory; the memory stores instructions executable by the processor; the processor is configured to execute the instructions to cause the electronic device to implement the method of the first aspect as described above.
In a fourth aspect, the present application provides a computer program product for, when run in an electronic device, causing the electronic device to perform the method of the first aspect described above, to carry out the method of the first aspect described above.
In a fifth aspect, the present application provides a computer readable storage medium comprising: a software instruction; the software instructions, when executed in an electronic device, cause the electronic device to implement the method of the first aspect described above.
The advantages of the second to fifth aspects described above may refer to the first aspect, and are not repeated here.
Drawings
In order to more clearly illustrate the technical solutions of the embodiments of the present application, the drawings that are needed in the description of the embodiments will be briefly introduced below, and it is obvious that the drawings in the following description are only some embodiments of the present application, and that other drawings may be obtained according to these drawings without inventive effort for a person skilled in the art.
FIG. 1 is a schematic structural diagram of an infrared temperature measurement calibration system according to an embodiment of the present application;
fig. 2 is a schematic diagram of the composition of an electronic device according to an embodiment of the present application;
FIG. 3 is a schematic flow chart of a temperature measurement calibration method according to an embodiment of the present application;
FIG. 4 is a schematic diagram of a function curve of the correspondence provided in the embodiment of the present application;
FIG. 5 is a schematic diagram of a function curve of the correspondence relationship before and after correction according to the embodiment of the present application;
FIG. 6 is a graph showing a comparison of response curves provided in the examples of the present application;
fig. 7 is a schematic diagram of a composition of a temperature measurement calibration device according to an embodiment of the present application.
Detailed Description
In order to enable those skilled in the art to better understand the technical solutions of the present application, the technical solutions in the embodiments of the present application will be clearly and completely described below with reference to the accompanying drawings.
It should be noted that the terms "first," "second," and the like in the description and claims of the present application and the above figures are used for distinguishing between similar objects and not necessarily for describing a particular sequential or chronological order. It is to be understood that the data so used may be interchanged where appropriate such that embodiments of the present application described herein may be implemented in sequences other than those illustrated or otherwise described herein. The implementations described in the following exemplary examples are not representative of all implementations consistent with the present application. Rather, they are merely examples of apparatus and methods consistent with some aspects of the present application as detailed in the accompanying claims.
In addition, in the description of the embodiments of the present application, "/" means or, unless otherwise indicated, for example, a/B may mean a or B. "and/or" herein is merely an association relationship describing an association object, and means that three relationships may exist, for example, a and/or B may mean: a exists alone, A and B exist together, and B exists alone. In addition, in the description of the embodiments of the present application, "plurality" means two or more than two.
Before explaining the embodiments of the present application in detail, some related terms and related techniques related to the embodiments of the present application are described.
Infrared imaging techniques, objects in nature, as long as their temperature is above absolute zero, constantly radiate energy outwards as a result of thermal movement of molecules within the object. Infrared imaging technology is to convert radiation into an infrared image which can be observed by human eyes and can be measured and analyzed according to the detected radiation energy of a shooting object.
Infrared temperature measurement is a temperature measurement mode for accurately measuring the temperature of a shooting object according to an infrared image of the shooting object under the condition that the shooting object is not contacted by utilizing an infrared imaging technology.
Black body is an idealized object that, in theory, absorbs all extraneous electromagnetic radiation without any reflection or transmission. In other words, the absorption coefficient of the black body for electromagnetic waves of any wavelength is 1, and the transmission coefficient is 0. It should be noted that in the embodiments of the present application, the blackbody includes a plurality of components, wherein the components, which are considered to be reference to the blackbody, are idealized objects that, in theory, absorb all electromagnetic radiation from the outside and do not have any reflection or transmission.
In recent years, non-contact temperature measurement technology is rapidly developed and widely popularized and applied. The infrared thermometer is widely applied to various industries because of the advantages of high response speed, wide measurement range, high sensitivity and the like, and becomes one of the most main non-contact temperature measurement modes at present.
In nature, all objects above absolute zero are constantly radiating energy outwards. The principle of infrared temperature measurement is to calculate the temperature of a target by measuring the infrared radiation of the target, so that the infrared temperature measurement device is usually required to be calibrated.
In some related technologies, gray values of a blackbody at a plurality of temperature points at isothermal difference intervals are measured by using first infrared thermal imaging equipment to be calibrated; drawing a curve template based on the gray value, wherein the curve template is a relation curve between gray difference values between adjacent temperature points and temperature sections between the corresponding adjacent temperature points; inputting the curve template into second infrared thermal imaging equipment to be calibrated, compensating the reference temperature of the second infrared thermal imaging equipment to be calibrated, and adjusting the parameters of an infrared temperature measuring device; the second infrared thermal imaging equipment to be calibrated is first infrared thermal imaging equipment to be calibrated or infrared thermal imaging equipment to be calibrated, which has an infrared temperature measuring device of the same type as the first infrared thermal imaging equipment to be calibrated.
However, the above-described method is only suitable for measuring the temperature of the temperature measuring point in the known temperature measuring range, and when the temperature exceeds the temperature measuring range, the temperature measuring accuracy is poor.
In view of the above problems, embodiments of the present application provide a temperature measurement calibration method, device, apparatus, and storage medium, which are capable of guaranteeing temperature measurement accuracy outside a temperature measurement range while guaranteeing temperature measurement accuracy within a calibrated temperature measurement range by a method combining theoretical simulation and reality.
The temperature measurement calibration method provided by the embodiment of the application is described in detail below with reference to the accompanying drawings.
The temperature measurement calibration method provided by the embodiment of the application can be applied to an infrared temperature measurement calibration system, and fig. 1 shows a schematic structural diagram of the infrared temperature measurement calibration system. As shown in fig. 1, the infrared thermometry calibration system 10 includes a thermometry calibration device 11 and an infrared thermometry device 12. The temperature measurement calibration device 11 and the infrared temperature measurement device 12 may be connected in a wired manner or may be connected in a wireless manner, which is not limited in the embodiment of the present application.
The thermometric calibration apparatus 11 may be an electronic device having data processing capabilities. For example, the temperature measurement calibration device 11 may be a mobile phone, a tablet computer, a notebook computer, an ultra-mobile personal computer (UMPC), a netbook, a personal digital assistant (personal digital ass istant, PDA), a desktop computer, a cloud server, etc., and the embodiment of the present application does not limit the specific type of the electronic device.
The infrared temperature measuring device 12 is a device that converts an incident infrared radiation signal into an electric signal and outputs the electric signal. The infrared temperature measuring device 12 may be a device for measuring the temperature of the measurement target by infrared technology, such as an infrared thermometer or a thermal infrared imager, or may be another device having a temperature measuring function, and is not limited thereto.
The infrared temperature measurement device 12 may be used to detect infrared light of a specific wavelength band emitted from an object, and convert the infrared light of these analog quantities into digital values (analog-to-digital convers ion, a/D) and output a/D values.
The temperature measurement calibration device 11 can perform temperature measurement calibration on the infrared temperature measurement device 12 according to the actual temperature of the object and the A/D value output by the infrared temperature measurement device 12. The specific process of performing temperature measurement calibration on the infrared temperature measurement device 12 can refer to the temperature measurement calibration method described in the following method embodiments, which is not described herein.
It should be noted that, in fig. 1, the temperature measurement calibration device 11 and the infrared temperature measurement device 12 are described as separate devices, and alternatively, the temperature measurement calibration device 11 and the infrared temperature measurement device 12 may be combined into one device. For example, the thermometric calibration device 11 or its corresponding functionality, and the infrared thermometric device 12 or its corresponding functionality may be integrated in one device. The embodiments of the present application are not limited in this regard.
The main execution body of the temperature measurement calibration method provided in the embodiment of the present application may be the temperature measurement calibration device 11. As described above, the temperature measurement calibration device 11 may be an electronic device having a data processing function, such as a computer or a server. Alternatively, the temperature measurement calibration device 11 may be a processor (e.g. a central processing unit (central process ing unit, CPU)) in the aforementioned electronic device; alternatively, the temperature measurement calibration device 11 may be an application program (APP) with a data processing function installed in the foregoing electronic apparatus; alternatively, the temperature measurement calibration device 11 may be a functional module having a data processing function in the electronic device. The embodiments of the present application are not limited in this regard.
For simplicity of description, the temperature measurement calibration device 11 will be described by taking an electronic device as an example.
Fig. 2 is a schematic diagram of the composition of an electronic device according to an embodiment of the present application. As shown in fig. 2, the electronic device may include: processor 20, memory 21, communication line 22, and communication interface 23, and input-output interface 24.
The processor 20, the memory 21, the communication interface 23, and the input/output interface 24 may be connected by a communication line 22.
The processor 20 is configured to execute instructions stored in the memory 21 to implement a fault analysis method provided in the following embodiments of the present application. The processor 20 may be a CPU, general purpose processor network processor (network processor, NP), digital signal processor (digital s ignal process ing, DSP), microprocessor, microcontroller (micro control unit, MCU)/single-chip microcomputer, programmable logic device (programmable logic device, PLD), or any combination thereof. The processor 20 may also be any other apparatus having a processing function, such as a circuit, a device, or a software module, which is not limited in this embodiment. In one example, processor 20 may include one or more CPUs, such as CPU0 and CPU1 in fig. 2. As an alternative implementation, the electronic device may include multiple processors, for example, processor 25 (illustrated in phantom in fig. 2) in addition to processor 20.
A memory 21 for storing instructions. For example, the instructions may be a computer program. Alternatively, the memory 21 may be a read-only memory (ROM) or other type of static electronic device capable of storing static information and/or instructions, an access memory (random access memory, RAM) or other type of dynamic electronic device capable of storing information and/or instructions, or an electrically erasable programmable read-only memory (electrical ly erasable programmable read-only memory, EEPROM), a compact disc (compact disc read-only memory, CD-ROM) or other optical disc storage, optical disc storage (including compact disc, laser disc, optical disc, digital versatile disc, blu-ray disc, etc.), magnetic disk storage media, or other magnetoelectronics devices, etc., which are not limited in this embodiment.
It should be noted that, the memory 21 may exist separately from the processor 20 or may be integrated with the processor 20. The memory 21 may be located inside the electronic device or may be located outside the electronic device, which is not limited in the embodiment of the present application.
Communication lines 22 for conveying information between components included in the electronic device.
A communication interface 23 for communicating with other devices (e.g., the infrared thermometers 12 described above) or other communication networks. The other communication network may be an ethernet, a radio access network (radio access network, RAN), a wireless local area network (wireless local area networks, WLAN), etc. The communication interface 23 may be a module, a circuit, a transceiver, or any device capable of enabling communication.
And an input-output interface 24 for enabling human-machine interaction between the user and the electronic device. Such as enabling action interactions or information interactions between a user and an electronic device.
The input/output interface 24 may be a mouse, a keyboard, a display screen, or a touch-sensitive display screen, for example. The action interaction or information interaction between the user and the electronic equipment can be realized through a mouse, a keyboard, a display screen, a touch display screen or the like.
It should be noted that the structure shown in fig. 2 does not constitute a limitation of the electronic device, and the electronic device may include more or less components than those shown in fig. 2, or a combination of some components, or a different arrangement of components.
The temperature measurement calibration method provided by the embodiment of the application is described below.
Fig. 3 is a schematic flow chart of a temperature measurement calibration method according to an embodiment of the present application. Alternatively, the method may be performed by an electronic device having the above-described hardware structure shown in fig. 2, and as shown in fig. 3, the method includes S301 to S304.
S301, acquiring theoretical output values of the infrared temperature measuring device at different theoretical temperatures, and obtaining a plurality of first data pairs.
Wherein a first data pair comprises a theoretical temperature and a corresponding theoretical output value.
As a possible implementation manner, after the electronic device determines the infrared temperature measuring device to be calibrated, the electronic device obtains an optical characteristic parameter of the infrared temperature measuring device, and determines theoretical output values of the infrared temperature measuring device at different theoretical temperatures according to the optical characteristic parameter.
In some embodiments, the electronic device may pre-establish a theoretical calculation model based on the optical characteristic parameters of the infrared temperature measurement device, so as to predict the loss of the infrared temperature measurement device on the radiant emittance of different spectrums, and take the loss as a theoretical output value. For example, after obtaining the optical characteristic parameters of the infrared temperature measurement device, the electronic device may establish a theoretical calculation model in combination with planck's radiation law, so as to simulate theoretical output values of the infrared temperature measurement device for different theoretical temperatures, and further obtain a plurality of first data pairs.
It will be appreciated that an object in nature will constantly radiate energy outwards as long as its temperature is above absolute zero, as a result of thermal movement of molecules within the object. Infrared imaging technology is to convert radiation into an infrared image which can be observed by human eyes and can be measured and analyzed according to the detected radiation energy of a shooting object. While planck's law of radiation describes the relationship between the emissivity and frequency of electromagnetic radiation emitted from a black body at any temperature T.
Therefore, the electronic equipment can determine the spectral radiation exitance of the black body at any temperature according to the planck radiation law description. The infrared temperature measuring device can detect the spectral radiation emergent degree and convert the spectral radiation emergent degree into a response value for reference. However, because the optical characteristic parameters corresponding to the different infrared temperature measuring devices are different, the response values of the different infrared temperature measuring devices for the same spectrum radiation emittance are different. Therefore, after the infrared temperature measuring device to be calibrated is fixed, the electronic equipment can simulate theoretical output values of the infrared temperature measuring device for different theoretical temperatures according to the optical characteristic parameters of the infrared temperature measuring device and by combining the Planckian radiation law.
In practical application, the electronic equipment can determine the radiance of the black body at a certain temperature by using the Planckian radiation law, and then determine the output response of the infrared temperature measuring device after the radiance is lost by using the optical characteristic parameter.
It should be noted that the optical characteristic parameters include related parameters of the infrared temperature measuring device, and also include related parameters of an infrared lens matched with the infrared temperature measuring device, which is also called related parameters of an optical system. The embodiment of the application does not limit specific optical characteristic parameters.
The theoretical temperature can be set in the electronic equipment in advance by operation and maintenance personnel, and in the simulation process, the electronic equipment can take the theoretical temperature as input and output the response of the infrared temperature measuring device to different theoretical temperatures as theoretical output values. The response output of the infrared temperature measuring device can be current, voltage, resistance and the like, and can also be a numerical value of the infrared temperature measuring device after secondary treatment, which is not limited in the embodiment of the application.
Exemplary, the electronics simulate the output of the infrared thermometry device in response to different theoretical temperatures in combination with Planckian radiation law (T 1 ,V 1 )，(T 2 ,V 2 )，(T 3 ,V 3 )，......(T n-1 ,V n-1 )，(T n ,V n ). Wherein T is 1 ,T 2 ,……T n-1 ,T n At theoretical temperature, V 1 ,V 2 ,……V n-1 ,V n The response output of the simulated infrared temperature measuring device can be current, voltage, resistance and the like, and can also be a numerical value of the infrared temperature measuring device after secondary treatment.
S302, according to a plurality of first data pairs, establishing a corresponding relation between a theoretical output value and a theoretical temperature.
The corresponding relation is used for reflecting a theoretical output value corresponding to any theoretical temperature.
As a possible implementation manner, the electronic device may obtain a plurality of fitting functions, and fit the plurality of first data pairs based on each fitting function, and further, the electronic device uses the fitting function with the fitting degree being greater than the preset degree as the corresponding relationship.
It should be noted that, the electronic device may store a plurality of fitting functions in advance, where the fitting functions may be exponential fitting functions or multiple fitting functions, and the embodiment of the present application does not limit the specific fitting function type.
Illustratively, the multiple term fitting function can be expressed as:
V＝a n T n +a n-1 T n-1 +…+a 2 T 2 +a 1 T 1 +a 0
the exponential fit function can be expressed as:
V＝aexp(bT+c) d +e
the correspondence obtained by fitting can be expressed as:
V＝f 0 (T)
fig. 4 shows a function curve of the correspondence relationship, in which the abscissa represents the theoretical temperature T and the ordinate represents the theoretical output value V, and by means of the function curve, the theoretical output value corresponding to any one theoretical temperature can be reflected.
In practical application, for any fitting function, the electronic device may measure the fitting degree of the fitting function according to the number of the first data pairs falling on the image of the fitting function. For example, during the fitting process, there are 5 first data pairs falling on the fitting function 1, and 10 first data pairs falling on the fitting function 2, the fitting degree of the fitting function 1 is smaller than the fitting degree of the fitting function 2.
S303, acquiring actual output values of the infrared temperature measuring device at different calibration temperatures to obtain a plurality of second data pairs.
Wherein a second data pair comprises a calibration temperature and a corresponding actual output value; the calibration temperature is a temperature within a preset temperature range.
As a possible implementation manner, the electronic device may control the infrared temperature measuring device to measure the infrared temperature of the objects with different known temperatures, and sequentially obtain the actual output values of the infrared temperature measuring device, so as to obtain a plurality of second data pairs.
It should be noted that each calibration temperature and the preset temperature range may be set by the electronic device. For example, if the temperature measurement range is 20 degrees celsius (deg c) to 100 degrees celsius (deg c) and the number of objects is 5, the temperatures of the objects may be sequentially set to 20 degrees celsius (deg c), 40 degrees celsius (deg c), 60 degrees celsius (deg c), 80 degrees celsius (deg c), 100 degrees celsius (deg c), and then the infrared temperature measurement device is controlled to measure the infrared temperature of the objects at these temperatures, and the actual output values of the infrared temperature measurement device at these temperatures are sequentially obtained.
For an object to be measured at any calibration temperature, the electronic device measures the temperature of the object to be measured through the infrared temperature measuring device, and obtains an actual output value of the infrared temperature measuring device. Further, the electronic device takes the actual temperature of the object to be measured and the actual output value of the infrared temperature measuring device as a second data pair. If the electronic equipment obtains the actual response output (T) 1 ′,V 1 ′)，(T 2 ′,V 2 ′)，(T 3 ′ ,V 3 ′ )，......(T n-1 ′,V n-1 ′)，(T n ′,V n ′ ) Wherein T is 1 ′ ,T 2 ′ ,……T n-1 ′ ,T n ′ For the actual temperature of the target object, V 1 ′,V 2 ′,……V n-1 ′,V n ' is the actual response output of the infrared temperature measuring device.
S304, correcting the corresponding relation according to the plurality of second data pairs to obtain a corrected relation, and taking the corrected relation as a temperature measurement calibration result of the infrared temperature measurement device.
The correction relation is used for determining the output value of the infrared temperature measuring device at the target temperature. The target temperature includes a temperature within a preset temperature range and a temperature outside the preset temperature range.
As one possible implementation manner, the electronic device determines the functional image of the correspondence relationship and the positional relationship between each second data pair and the functional image. Further, the electronic equipment determines adjustment operation according to the position relation, adjusts the function image according to the adjustment operation to obtain a correction relation, and further uses the correction relation as a temperature measurement calibration result of the infrared temperature measurement device.
It should be noted that the adjustment operation may include translation, scaling, rotation, or the like. Translation means that the function image of the corresponding relation is moved for a certain distance along the coordinate axis direction, and the obtained function image is the correction relation. Translation may change the position of the functional image of the correspondence but not its shape. For example, the correspondence relation is f (x), and the correction relation after translation may be 2f (x-2). Scaling refers to stretching or compressing the function image of the correspondence relationship along the coordinate axis direction, so as to change the shape and size of the function image. Scaling may be achieved by changing the coefficients of the function, for example, the correspondence is f (x), and the scaled correction relationship may be 2f (x).
In some embodiments, the electronic device may adjust the function image according to the specific positional relationship between the second data pair and the function image. For example, in the case that the plurality of second data pairs are located above the function image, the electronic device may translate the function image upward, so that the plurality of second data pairs may fall on the translated function image, and thus, compared to before translation, the fitting degree of the translated function image and each second data pair is greater than the fitting degree of the function image and each second data pair before translation.
As shown in fig. 5, the correspondence f between the electronic device and the correction is shown as 0 (T) scaling, rotating and translating in equal proportion to obtain f 1 (f 0 (T)) and will correct the relation f 1 (f 0 And (T)) is used as a temperature measurement calibration result of the infrared temperature measurement device so as to determine the output value of the infrared temperature measurement device at the target temperature. As can be seen from the figure, the correction relation f 1 (f 0 (T)) can reflect the corresponding output value V of the infrared temperature measuring device at any temperature T.
It can be understood that compared with the traditional calibration method, the method is only suitable for temperature measurement of the temperature measuring points in the known temperature measuring range, and when the temperature exceeds the temperature measuring range, the temperature measuring precision is poor. For example, in practical application, the temperature measuring range of the infrared temperature measuring device is required to reach 3000 ℃, but the blackbody can only reach 2000 ℃, so that the temperature measuring precision of 2000-3000 ℃ can be met to a large extent by the method.
Fig. 6 is a schematic diagram showing the relationship among the response curve of the conventional fitting, the response curve corrected by the application and the actual response curve, and as can be seen from fig. 6, the response curve corrected by the application is more attached to the actual response curve of the infrared temperature measuring device, so that the temperature measuring precision of the application outside the calibrated temperature measuring range is higher.
According to the method, from the angle of the working principle of the infrared temperature measuring device, the theoretical output values of the infrared temperature measuring device at different theoretical temperatures are predicted by combining the optical characteristic parameters of the infrared temperature measuring device, and a plurality of first data pairs are obtained, wherein one first data pair comprises one theoretical temperature and a corresponding theoretical output value. According to the first data pairs, the corresponding relation between the theoretical output value and the theoretical temperature is simulated, so that the change trend of the response output of the infrared temperature measuring device in a larger temperature range is predicted. Further, the method obtains actual output values of the infrared temperature measuring device at different calibration temperatures to obtain a plurality of second data pairs, corrects the corresponding relation obtained through simulation according to the second data pairs to obtain a correction relation, and takes the correction relation as a temperature measurement calibration result of the infrared temperature measuring device. The correction relation not only can determine the temperature in the preset temperature range corresponding to the calibration temperature, but also can determine the temperature outside the preset temperature range. Compared with the traditional calibration method, the infrared temperature measuring device can only measure the temperature in the calibration temperature measuring range, and the temperature measuring precision of the temperature outside the calibration temperature measuring range is poorer.
In one design, in order to determine the theoretical output values of the infrared temperature measurement device at different theoretical temperatures, S301 may specifically include:
s3011, determining the target spectral radiation exitance of the black body at the theoretical temperature.
As one possible implementation manner, for any theoretical temperature, the electronic device determines the spectral radiant exitance of the blackbody at the theoretical temperature according to planck's radiant law, and obtains the target spectral radiant exitance.
The spectral radiation emittance means the emittance (radiant power per unit area) of a black body at a certain temperature at a specific wavelength.
Exemplary, spectral radiant emittance M of an ideal blackbody at temperature T λ,T Can be expressed as:
wherein λ is the wavelength in vacuum, c 1 、c 2 A first radiation constant and a second radiation constant, respectively.
S3012, substituting the target spectral radiation emergent degree into a preset theoretical calculation model, calculating a target output value of the infrared temperature measuring device, and taking the target output value as a theoretical output value corresponding to the theoretical temperature.
The theoretical calculation model is pre-established based on optical characteristic parameters of the infrared temperature measuring device, wherein the optical characteristic parameters comprise loss parameters of an optical system of the infrared temperature measuring device to spectrum radiation and response parameters of a detector of the infrared temperature measuring device to the spectrum radiation.
As a possible implementation manner, the electronic device may use a preset theoretical calculation model to simulate the output value of the infrared temperature measurement device for the target spectrum radiation. Specifically, after determining the target spectral radiation emittance of the blackbody at a certain theoretical temperature, the electronic equipment calculates a target output value of the infrared temperature measuring device at the target spectral radiation emittance according to a theoretical calculation model, and takes the target output value as a theoretical output value corresponding to the theoretical temperature.
It should be noted that the theoretical calculation model may be established in advance by the electronic device according to the optical characteristic parameters of the infrared temperature measurement device, or may be established by the operation and maintenance personnel based on the optical characteristic parameters of the infrared temperature measurement device and stored in the electronic device in advance. The optical characteristic parameters comprise a loss parameter of an optical system of the infrared temperature measuring device to spectrum radiation and a response parameter of a detector of the infrared temperature measuring device to the spectrum radiation. The loss parameter may reflect a value of the optical system of the infrared temperature measurement device after the optical system loses the spectrum radiation, and the response parameter may reflect a response value of the detector of the infrared temperature measurement device after the optical system converts the spectrum radiation, such as output voltage, output current, and the like.
The optical characteristic parameters may include, for example, a start wavelength, a cut-off wavelength, a spectral transmittance, and a spectral response of the infrared thermometry device.
In some embodiments, the electronic device may perform a fixed integral operation on a product of the spectral transmittance, the spectral response, and the target spectral radiation exitance with the start wavelength as a lower integral limit and the cut-off wavelength as an upper integral limit, so as to obtain a target output value of the infrared temperature measurement device.
The spectral transmittance refers to the light transmission capability of the optical device of the infrared temperature measuring device to the target band, and is generally expressed by percentage, for example, the peak transmittance (Tp) > 90%, which means that the highest value that light can transmit after passing through the filter loss is more than 90%, and the larger the value, the better the light transmission capability is represented. The spectral response may refer to the ability of the infrared temperature measurement device to convert incident light energy of different wavelengths into electrical energy, e.g., the infrared temperature measurement device may convert incident light energy of different wavelengths into a current output.
The preset simulation formula adopted by the electronic device is as follows:
wherein lambda is 1 、λ 2 Respectively the initial wavelength and the final wavelength of the infrared temperature measuring device, tau λ R is the spectral transmittance of the optical system λ For the spectral response of the infrared temperature measuring device, M λ,T The spectral radiant emittance of an ideal blackbody at a temperature T.
It can be understood that the method analyzes from the angle of the detection principle of the infrared temperature measuring device, combines the optical characteristic parameter, the theoretical temperature and the spectral radiation emergent degree of the blackbody at different theoretical temperatures related to the infrared temperature measuring device, substitutes the simulation formula to predict the theoretical output value of the infrared temperature measuring device at different theoretical temperatures, further establishes the corresponding relation between the theoretical output value and the theoretical temperature, and reflects the variation trend of the response output of the infrared temperature measuring device within a larger temperature measuring temperature range according to the corresponding relation. For example, in some scenes, the temperature measuring range of the infrared temperature measuring device is required to reach 3000 ℃, but the blackbody can only reach 2000 ℃, the output value of the infrared temperature measuring device beyond 2000 ℃ can not be calibrated by using the blackbody, and the change trend of the response output of the infrared temperature measuring device in a larger temperature range is predicted according to the corresponding relation between the theoretical output value and the theoretical temperature, which is simulated in the embodiment.
The foregoing description of the solution provided in the embodiments of the present application has been mainly presented in terms of a method. To achieve the above functions, it includes corresponding hardware structures and/or software modules that perform the respective functions. Those of skill in the art will readily appreciate that the elements and algorithm steps of the various examples described in connection with the embodiments disclosed herein may be implemented as hardware or combinations of hardware and computer software. Whether a function is implemented as hardware or computer software driven hardware depends upon the particular application and design constraints imposed on the solution. The technical aim may be to use different methods to implement the described functions for each particular application, but such implementation should not be considered beyond the scope of the present application.
In an exemplary embodiment, the embodiment of the application also provides a temperature measurement calibration device. Fig. 7 is a schematic diagram of a composition of a temperature measurement calibration device according to an embodiment of the present application. As shown in fig. 7, the temperature measurement calibration device includes: an acquisition unit 401 and a processing unit 402.
An obtaining unit 401, configured to obtain theoretical output values of the infrared temperature measurement device at different theoretical temperatures, so as to obtain a plurality of first data pairs; a first data pair comprising a theoretical temperature and a corresponding theoretical output value; a processing unit 402, configured to establish a correspondence between a theoretical output value and a theoretical temperature according to the plurality of first data pairs; the corresponding relation is used for reflecting a theoretical output value corresponding to any theoretical temperature; the obtaining unit 401 is further configured to obtain actual output values of the infrared temperature measurement device at different calibration temperatures, so as to obtain a plurality of second data pairs; a second data pair comprising a calibration temperature and corresponding actual output value; the calibration temperature is the temperature within a preset temperature range; the processing unit 402 is further configured to correct the corresponding relationship according to the plurality of second data pairs, obtain a corrected relationship, and use the corrected relationship as a temperature measurement calibration result of the infrared temperature measurement device; the correction relation is used for determining an output value of the infrared temperature measuring device at the target temperature; the target temperature includes a temperature within a preset temperature range and a temperature outside the preset temperature range.
In a possible implementation manner, the obtaining unit 401 is specifically configured to: for any theoretical temperature, determining the target spectral radiant exitance of the black body at the theoretical temperature; substituting the target spectral radiation emergent degree into a preset theoretical calculation model, calculating a target output value of the infrared temperature measuring device, and taking the target output value as a theoretical output value corresponding to the theoretical temperature; the theoretical calculation model is pre-established based on optical characteristic parameters of the infrared temperature measuring device, wherein the optical characteristic parameters comprise loss parameters of an optical system of the infrared temperature measuring device to spectrum radiation and response parameters of a detector of the infrared temperature measuring device to the spectrum radiation.
In one possible implementation, the optical characteristic parameters include a start wavelength, a cut-off wavelength, a spectral transmittance, and a spectral response of the infrared temperature measurement device; the obtaining unit 401 is specifically configured to: and carrying out fixed integral operation on the product of the spectral transmittance, the spectral response and the target spectral radiation exitance by taking the initial wavelength as an integral lower limit and the cut-off wavelength as an integral upper limit to obtain a target output value of the infrared temperature measuring device.
In a possible implementation manner, the processing unit 402 is specifically configured to: acquiring a plurality of fitting functions, and fitting a plurality of first data pairs based on each fitting function; and taking a fitting function with the fitting degree larger than the preset degree as a corresponding relation.
In a possible implementation manner, the obtaining unit 401 is specifically configured to: for an object to be measured at any calibration temperature, measuring the temperature of the object to be measured by an infrared temperature measuring device, and acquiring an actual output value of the infrared temperature measuring device; and taking the actual temperature of the object to be measured and the actual output value of the infrared temperature measuring device as a second data pair.
In a possible implementation manner, the processing unit 402 is specifically configured to: determining the position relation between each second data pair and the function image of the corresponding relation; according to the position relation, adjusting the function image; the adjusting comprises rotation, translation or scaling, and the fitting degree of the adjusted function image and each second data pair is larger than that of the function image before the adjusting.
It should be noted that the division of the modules in fig. 7 is schematic, and is merely a logic function division, and other division manners may be implemented in practice. For example, two or more functions may also be integrated in one processing module. The integrated modules may be implemented in hardware or in software functional units.
In an exemplary embodiment, a computer readable storage medium is also provided, comprising software instructions which, when run on an electronic device, cause the electronic device to perform any of the methods provided by the above embodiments.
In an exemplary embodiment, the present application also provides a computer program product comprising computer-executable instructions, which, when run on an electronic device, cause the electronic device to perform any of the methods provided by the above embodiments.
In the above embodiments, it may be implemented in whole or in part by software, hardware, firmware, or any combination thereof. When implemented using a software program, it may be implemented in whole or in part in the form of a computer program product. The computer program product includes one or more computer-executable instructions. When the computer-executable instructions are loaded and executed on a computer, the processes or functions in accordance with embodiments of the present application are fully or partially produced. The computer may be a general purpose computer, a special purpose computer, a computer network, or other programmable apparatus. The computer-executable instructions may be stored in or transmitted from one computer-readable storage medium to another, for example, from one website, computer, server, or data center by wired (e.g., coaxial cable, fiber optic, digital subscriber line (digital subscriber line, DSL)) or wireless (e.g., infrared, wireless, microwave, etc.). Computer readable storage media can be any available media that can be accessed by a computer or data electronics including one or more servers, data centers, etc. that can be integrated with the media. The usable medium may be a magnetic medium (e.g., floppy disk, hard disk, magnetic tape), an optical medium (e.g., DVD), or solid state disk (sol id state disk, SSD)), or the like.
Although the present application has been described herein in connection with various embodiments, other variations to the disclosed embodiments can be understood and effected by those skilled in the art in practicing the claimed application, from a review of the figures, the disclosure, and the appended claims. In the claims, the word "comprising" does not exclude other elements or steps, and the "a" or "an" does not exclude a plurality. A single processor or other unit may fulfill the functions of several items recited in the claims. The mere fact that certain measures are recited in mutually different dependent claims does not indicate that a combination of these measures cannot be used to advantage.
Although the present application has been described in connection with specific features and embodiments thereof, it will be apparent that various modifications and combinations can be made without departing from the spirit and scope of the application. Accordingly, the specification and drawings are merely exemplary illustrations of the present application as defined in the appended claims and are considered to cover any and all modifications, variations, combinations, or equivalents that fall within the scope of the present application. It will be apparent to those skilled in the art that various modifications and variations can be made in the present application without departing from the spirit or scope of the application. Thus, if such modifications and variations of the present application fall within the scope of the claims and the equivalents thereof, the present application is intended to cover such modifications and variations.
The foregoing is merely a specific embodiment of the present application, but the protection scope of the present application is not limited thereto, and any changes or substitutions within the technical scope of the present disclosure should be covered in the protection scope of the present application. Therefore, the protection scope of the present application shall be subject to the protection scope of the claims.
Claims (10)
1. The temperature measurement calibration method is characterized by comprising the following steps of:
acquiring theoretical output values of the infrared temperature measuring device at different theoretical temperatures to obtain a plurality of first data pairs; a first data pair comprising a theoretical temperature and a corresponding theoretical output value;
establishing a corresponding relation between a theoretical output value and a theoretical temperature according to the plurality of first data pairs; the corresponding relation is used for reflecting a theoretical output value corresponding to any theoretical temperature;
acquiring actual output values of the infrared temperature measuring device at different calibration temperatures to obtain a plurality of second data pairs; a second data pair comprising a calibration temperature and corresponding actual output value; the calibration temperature is a temperature within a preset temperature range;
correcting the corresponding relation according to the plurality of second data pairs to obtain a corrected relation, and taking the corrected relation as a temperature measurement calibration result of the infrared temperature measurement device; the correction relation is used for determining an output value of the infrared temperature measuring device at the target temperature; the target temperature includes a temperature within the preset temperature range and a temperature outside the preset temperature range.
2. The method of claim 1, wherein the obtaining theoretical output values of the infrared thermometry device at different theoretical temperatures comprises:
for any theoretical temperature, determining the target spectral radiant exitance of the black body at the theoretical temperature;
substituting the target spectral radiation emergent degree into a preset theoretical calculation model, calculating a target output value of the infrared temperature measuring device, and taking the target output value as a theoretical output value corresponding to the theoretical temperature; the theoretical calculation model is pre-established based on optical characteristic parameters of the infrared temperature measuring device, wherein the optical characteristic parameters comprise loss parameters of an optical system of the infrared temperature measuring device to spectrum radiation and response parameters of a detector of the infrared temperature measuring device to the spectrum radiation.
3. The method of claim 2, wherein the optical characteristic parameters include a start wavelength, a cut-off wavelength, a spectral transmittance, a spectral response of the infrared thermometry device; substituting the target spectral radiant exitance into the theoretical calculation model to calculate a target output value of the infrared temperature measuring device, including:
and taking the initial wavelength as an integral lower limit and the cut-off wavelength as an integral upper limit, and performing fixed integral operation on the product of the spectral transmittance, the spectral response and the target spectral radiation emergent degree to obtain a target output value of the infrared temperature measuring device.
4. The method of claim 1, wherein said establishing a correspondence between a theoretical output value and a theoretical temperature based on said plurality of first data pairs comprises:
acquiring a plurality of fitting functions, and fitting the plurality of first data pairs based on each fitting function;
and taking a fitting function with the fitting degree larger than the preset degree as the corresponding relation.
5. The method of claim 1, wherein the obtaining actual output values of the infrared temperature measurement device at different calibration temperatures comprises:
for an object to be measured at any calibration temperature, measuring the temperature of the object to be measured by the infrared temperature measuring device, and acquiring an actual output value of the infrared temperature measuring device;
and taking the actual temperature of the object to be measured and the actual output value of the infrared temperature measuring device as a second data pair.
6. The method of any of claims 1-5, wherein modifying the correspondence from the plurality of second data pairs comprises:
determining the position relation between each second data pair and the function image of the corresponding relation;
According to the position relation, the function image is adjusted; the adjustment comprises rotation, translation or scaling, and the fitting degree of the adjusted function image and each second data pair is larger than that of the function image before adjustment and each second data pair.
7. The temperature measurement calibration device is characterized by comprising an acquisition unit and a processing unit;
the acquisition unit is used for acquiring theoretical output values of the infrared temperature measuring device at different theoretical temperatures to obtain a plurality of first data pairs; a first data pair comprising a theoretical temperature and a corresponding theoretical output value;
the processing unit is used for establishing a corresponding relation between a theoretical output value and a theoretical temperature according to the plurality of first data pairs; the corresponding relation is used for reflecting a theoretical output value corresponding to any theoretical temperature;
the acquisition unit is also used for acquiring actual output values of the infrared temperature measuring device at different calibration temperatures to obtain a plurality of second data pairs; a second data pair comprising a calibration temperature and corresponding actual output value; the calibration temperature is a temperature within a preset temperature range;
the processing unit is further used for correcting the corresponding relation according to the plurality of second data pairs to obtain a corrected relation, and taking the corrected relation as a temperature measurement calibration result of the infrared temperature measurement device; the correction relation is used for determining an output value of the infrared temperature measuring device at the target temperature; the target temperature includes a temperature within the preset temperature range and a temperature outside the preset temperature range.
8. The apparatus according to claim 7, wherein the acquisition unit is specifically configured to: for any theoretical temperature, determining the target spectral radiant exitance of the black body at the theoretical temperature; substituting the target spectral radiation emergent degree into a preset theoretical calculation model, calculating a target output value of the infrared temperature measuring device, and taking the target output value as a theoretical output value corresponding to the theoretical temperature; the theoretical calculation model is pre-established based on optical characteristic parameters of the infrared temperature measuring device, wherein the optical characteristic parameters comprise loss parameters of an optical system of the infrared temperature measuring device to spectrum radiation and response parameters of a detector of the infrared temperature measuring device to the spectrum radiation;
the optical characteristic parameters comprise the initial wavelength, the cut-off wavelength, the spectral transmittance and the spectral response of the infrared temperature measuring device; the acquisition unit is specifically configured to:
taking the initial wavelength as an integral lower limit and the cut-off wavelength as an integral upper limit, and performing fixed integral operation on the product of the spectral transmittance, the spectral response and the target spectral radiation emergent degree to obtain a target output value of the infrared temperature measuring device;
And the processing unit is specifically configured to:
acquiring a plurality of fitting functions, and fitting the plurality of first data pairs based on each fitting function;
taking a fitting function with the fitting degree larger than a preset degree as the corresponding relation;
and the acquisition unit is specifically configured to:
for an object to be measured at any calibration temperature, measuring the temperature of the object to be measured by the infrared temperature measuring device, and acquiring an actual output value of the infrared temperature measuring device;
taking the actual temperature of the object to be measured and the actual output value of the infrared temperature measuring device as a second data pair;
and the processing unit is specifically configured to:
determining the position relation between each second data pair and the function image of the corresponding relation;
according to the position relation, the function image is adjusted; the adjustment comprises rotation, translation or scaling, and the fitting degree of the adjusted function image and each second data pair is larger than that of the function image before adjustment and each second data pair.
9. An electronic device, comprising: a processor and a memory;
the memory stores instructions executable by the processor;
The processor is configured to, when executing the instructions, cause the electronic device to implement the method of any one of claims 1-6.
10. A computer-readable storage medium, the readable storage medium comprising: a software instruction;
when executed in an electronic device, causes the electronic device to carry out the method according to any one of claims 1-6.
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