JPS57139636A - Radius-of-curvature measuring device - Google Patents

Radius-of-curvature measuring device

Info

Publication number
JPS57139636A
JPS57139636A JP56025072A JP2507281A JPS57139636A JP S57139636 A JPS57139636 A JP S57139636A JP 56025072 A JP56025072 A JP 56025072A JP 2507281 A JP2507281 A JP 2507281A JP S57139636 A JPS57139636 A JP S57139636A
Authority
JP
Japan
Prior art keywords
directions
bright points
pair
symmetrical
projecting
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP56025072A
Other languages
English (en)
Japanese (ja)
Other versions
JPH0346774B2 (enrdf_load_stackoverflow
Inventor
Masao Noda
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Nikon Corp
Original Assignee
Nikon Corp
Nippon Kogaku KK
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Nikon Corp, Nippon Kogaku KK filed Critical Nikon Corp
Priority to JP56025072A priority Critical patent/JPS57139636A/ja
Publication of JPS57139636A publication Critical patent/JPS57139636A/ja
Publication of JPH0346774B2 publication Critical patent/JPH0346774B2/ja
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/24—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
    • G01B11/255—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures for measuring radius of curvature

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Eye Examination Apparatus (AREA)
  • Length Measuring Devices By Optical Means (AREA)
  • Testing Of Optical Devices Or Fibers (AREA)
JP56025072A 1981-02-23 1981-02-23 Radius-of-curvature measuring device Granted JPS57139636A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP56025072A JPS57139636A (en) 1981-02-23 1981-02-23 Radius-of-curvature measuring device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP56025072A JPS57139636A (en) 1981-02-23 1981-02-23 Radius-of-curvature measuring device

Publications (2)

Publication Number Publication Date
JPS57139636A true JPS57139636A (en) 1982-08-28
JPH0346774B2 JPH0346774B2 (enrdf_load_stackoverflow) 1991-07-17

Family

ID=12155717

Family Applications (1)

Application Number Title Priority Date Filing Date
JP56025072A Granted JPS57139636A (en) 1981-02-23 1981-02-23 Radius-of-curvature measuring device

Country Status (1)

Country Link
JP (1) JPS57139636A (enrdf_load_stackoverflow)

Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5975035A (ja) * 1982-10-21 1984-04-27 キヤノン株式会社 角膜形状測定装置
JPS5977827A (ja) * 1982-10-26 1984-05-04 キヤノン株式会社 角膜形状測定装置
JPS59193303A (ja) * 1983-04-18 1984-11-01 Mitsubishi Heavy Ind Ltd 歪計測法
JPS6311130A (ja) * 1986-07-02 1988-01-18 ヴィアイエスエックス，インコーポレイテッド 眼科用治療装置
US5432596A (en) * 1992-06-30 1995-07-11 Nidek Co., Ltd. Lens measurement apparatus providing measurements of multiple lens characteristics

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE102011114251A1 (de) 2011-09-23 2013-03-28 Vossamed Gmbh & Co. Kg Optikanordnung und Verfahren zum Ermitteln der Ausrichtung einer künstlichen Linse

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS517956A (en) * 1974-07-10 1976-01-22 Oki Electric Ind Co Ltd Konkuriitotono tofusonoatsumisokuteihoho oyobi sonosochi
JPS5346755A (en) * 1976-10-09 1978-04-26 Oki Electric Ind Co Ltd Thickness detector of plate form objects

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS517956A (en) * 1974-07-10 1976-01-22 Oki Electric Ind Co Ltd Konkuriitotono tofusonoatsumisokuteihoho oyobi sonosochi
JPS5346755A (en) * 1976-10-09 1978-04-26 Oki Electric Ind Co Ltd Thickness detector of plate form objects

Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5975035A (ja) * 1982-10-21 1984-04-27 キヤノン株式会社 角膜形状測定装置
JPS5977827A (ja) * 1982-10-26 1984-05-04 キヤノン株式会社 角膜形状測定装置
JPS59193303A (ja) * 1983-04-18 1984-11-01 Mitsubishi Heavy Ind Ltd 歪計測法
JPS6311130A (ja) * 1986-07-02 1988-01-18 ヴィアイエスエックス，インコーポレイテッド 眼科用治療装置
US5432596A (en) * 1992-06-30 1995-07-11 Nidek Co., Ltd. Lens measurement apparatus providing measurements of multiple lens characteristics

Also Published As

Publication number Publication date
JPH0346774B2 (enrdf_load_stackoverflow) 1991-07-17

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