JPS57138158A - Formation of conductive thin film - Google Patents

Formation of conductive thin film

Info

Publication number
JPS57138158A
JPS57138158A JP2358781A JP2358781A JPS57138158A JP S57138158 A JPS57138158 A JP S57138158A JP 2358781 A JP2358781 A JP 2358781A JP 2358781 A JP2358781 A JP 2358781A JP S57138158 A JPS57138158 A JP S57138158A
Authority
JP
Japan
Prior art keywords
film
laser beam
irradiated
sio2
region
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP2358781A
Other languages
Japanese (ja)
Inventor
Kenichi Oki
Yasushi Okawa
Terunobu Miura
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Fujitsu Ltd
Original Assignee
Fujitsu Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Fujitsu Ltd filed Critical Fujitsu Ltd
Priority to JP2358781A priority Critical patent/JPS57138158A/en
Publication of JPS57138158A publication Critical patent/JPS57138158A/en
Pending legal-status Critical Current

Links

Landscapes

  • Electrodes Of Semiconductors (AREA)
  • Internal Circuitry In Semiconductor Integrated Circuit Devices (AREA)

Abstract

PURPOSE:To enable to form a pattern on the conductive thin film pattern very easily by a method wherein a laser beam is irradiated on the prescribed region of the surface of an insulating oxide in a non-oxidizing atmosphere, and this region is transformed into a conductive substance by adding the constituent element of an oxide. CONSTITUTION:An SiO2 film 2 is formed by oxidating the surface of an Si substrate 1 at a high temperature, and a CO2 laser beam 3 is irradiated on the prescribed region in an H2 atmosphere. At this time, the laser beam is absorbed easily by SiO2, but as it is not absorbed by Si, no effect is given to the substrate. Through these procedures, the film 2 of the section whereon the laser beam was irradiated is heated up, the reduction of SiO2+2H2 Si+2H2 is generated, and the region where the laser beam was irradiated is converted to an Si film 4. As this film 4 is in a polycrystallined state and does not contain active impurities, the film 4 has a high specific resistance. Therefore, when a source and drain regions are formed, impurities are doped and required conductivity is given, and the film suitable for a gate electrode can be obtained.
JP2358781A 1981-02-18 1981-02-18 Formation of conductive thin film Pending JPS57138158A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP2358781A JPS57138158A (en) 1981-02-18 1981-02-18 Formation of conductive thin film

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2358781A JPS57138158A (en) 1981-02-18 1981-02-18 Formation of conductive thin film

Publications (1)

Publication Number Publication Date
JPS57138158A true JPS57138158A (en) 1982-08-26

Family

ID=12114708

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2358781A Pending JPS57138158A (en) 1981-02-18 1981-02-18 Formation of conductive thin film

Country Status (1)

Country Link
JP (1) JPS57138158A (en)

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