JPS57133599A - Semiconductor memory device - Google Patents

Semiconductor memory device

Info

Publication number
JPS57133599A
JPS57133599A JP2071781A JP2071781A JPS57133599A JP S57133599 A JPS57133599 A JP S57133599A JP 2071781 A JP2071781 A JP 2071781A JP 2071781 A JP2071781 A JP 2071781A JP S57133599 A JPS57133599 A JP S57133599A
Authority
JP
Japan
Prior art keywords
fuses
short
circuit
rows
transistors
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP2071781A
Other languages
English (en)
Japanese (ja)
Other versions
JPS6113320B2 (enrdf_load_stackoverflow
Inventor
Yukio Miyazaki
Mitsugi Takeda
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Mitsubishi Electric Corp
Original Assignee
Mitsubishi Electric Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Mitsubishi Electric Corp filed Critical Mitsubishi Electric Corp
Priority to JP2071781A priority Critical patent/JPS57133599A/ja
Publication of JPS57133599A publication Critical patent/JPS57133599A/ja
Publication of JPS6113320B2 publication Critical patent/JPS6113320B2/ja
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
    • G11C29/04—Detection or location of defective memory elements, e.g. cell constructio details, timing of test signals

Landscapes

  • Techniques For Improving Reliability Of Storages (AREA)
  • Read Only Memory (AREA)
  • Semiconductor Memories (AREA)
  • For Increasing The Reliability Of Semiconductor Memories (AREA)
JP2071781A 1981-02-12 1981-02-12 Semiconductor memory device Granted JPS57133599A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP2071781A JPS57133599A (en) 1981-02-12 1981-02-12 Semiconductor memory device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2071781A JPS57133599A (en) 1981-02-12 1981-02-12 Semiconductor memory device

Publications (2)

Publication Number Publication Date
JPS57133599A true JPS57133599A (en) 1982-08-18
JPS6113320B2 JPS6113320B2 (enrdf_load_stackoverflow) 1986-04-12

Family

ID=12034907

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2071781A Granted JPS57133599A (en) 1981-02-12 1981-02-12 Semiconductor memory device

Country Status (1)

Country Link
JP (1) JPS57133599A (enrdf_load_stackoverflow)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS61230700A (ja) * 1985-04-05 1986-10-14 Nec Corp プログラマブル・リ−ド・オンリ−・メモリ

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5273997A (en) * 1975-12-17 1977-06-21 Toyo Rubber Chem Ind Co Ltd Preparation of soft urethane foams
JPS5466042A (en) * 1977-11-04 1979-05-28 Nec Corp Programable read-only memory

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5273997A (en) * 1975-12-17 1977-06-21 Toyo Rubber Chem Ind Co Ltd Preparation of soft urethane foams
JPS5466042A (en) * 1977-11-04 1979-05-28 Nec Corp Programable read-only memory

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS61230700A (ja) * 1985-04-05 1986-10-14 Nec Corp プログラマブル・リ−ド・オンリ−・メモリ

Also Published As

Publication number Publication date
JPS6113320B2 (enrdf_load_stackoverflow) 1986-04-12

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