JPS57111781A - Pattern location detecting method - Google Patents

Pattern location detecting method

Info

Publication number
JPS57111781A
JPS57111781A JP55187258A JP18725880A JPS57111781A JP S57111781 A JPS57111781 A JP S57111781A JP 55187258 A JP55187258 A JP 55187258A JP 18725880 A JP18725880 A JP 18725880A JP S57111781 A JPS57111781 A JP S57111781A
Authority
JP
Japan
Prior art keywords
detection
pattern
window
chip
location
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP55187258A
Other languages
English (en)
Other versions
JPH0115910B2 (ja
Inventor
Masahito Nakajima
Tetsuo Hizuka
Yushi Inagaki
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Fujitsu Ltd
Original Assignee
Fujitsu Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Fujitsu Ltd filed Critical Fujitsu Ltd
Priority to JP55187258A priority Critical patent/JPS57111781A/ja
Priority to US06/272,368 priority patent/US4450579A/en
Priority to DE8181302575T priority patent/DE3175773D1/de
Priority to EP81302575A priority patent/EP0041870B1/en
Publication of JPS57111781A publication Critical patent/JPS57111781A/ja
Publication of JPH0115910B2 publication Critical patent/JPH0115910B2/ja
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06V—IMAGE OR VIDEO RECOGNITION OR UNDERSTANDING
    • G06V10/00—Arrangements for image or video recognition or understanding
    • G06V10/20—Image preprocessing
    • G06V10/24—Aligning, centring, orientation detection or correction of the image

Landscapes

  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Multimedia (AREA)
  • Theoretical Computer Science (AREA)
  • Image Input (AREA)
  • Image Processing (AREA)
  • Image Analysis (AREA)
JP55187258A 1980-06-10 1980-12-29 Pattern location detecting method Granted JPS57111781A (en)

Priority Applications (4)

Application Number Priority Date Filing Date Title
JP55187258A JPS57111781A (en) 1980-12-29 1980-12-29 Pattern location detecting method
US06/272,368 US4450579A (en) 1980-06-10 1981-06-10 Recognition method and apparatus
DE8181302575T DE3175773D1 (en) 1980-06-10 1981-06-10 Pattern position recognition apparatus
EP81302575A EP0041870B1 (en) 1980-06-10 1981-06-10 Pattern position recognition apparatus

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP55187258A JPS57111781A (en) 1980-12-29 1980-12-29 Pattern location detecting method

Publications (2)

Publication Number Publication Date
JPS57111781A true JPS57111781A (en) 1982-07-12
JPH0115910B2 JPH0115910B2 (ja) 1989-03-22

Family

ID=16202819

Family Applications (1)

Application Number Title Priority Date Filing Date
JP55187258A Granted JPS57111781A (en) 1980-06-10 1980-12-29 Pattern location detecting method

Country Status (1)

Country Link
JP (1) JPS57111781A (ja)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS59139486A (ja) * 1983-01-28 1984-08-10 Nippon Telegr & Teleph Corp <Ntt> 図形読取装置
JPS615384A (ja) * 1984-06-18 1986-01-11 Omron Tateisi Electronics Co 二次元視覚認識装置
JPS615385A (ja) * 1984-06-18 1986-01-11 Omron Tateisi Electronics Co 二次元視覚認識装置

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5125936A (ja) * 1974-08-28 1976-03-03 Oki Electric Ind Co Ltd
JPS55119782A (en) * 1979-03-09 1980-09-13 Daihen Corp Pattern automatic inspection method

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5125936A (ja) * 1974-08-28 1976-03-03 Oki Electric Ind Co Ltd
JPS55119782A (en) * 1979-03-09 1980-09-13 Daihen Corp Pattern automatic inspection method

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS59139486A (ja) * 1983-01-28 1984-08-10 Nippon Telegr & Teleph Corp <Ntt> 図形読取装置
JPS615384A (ja) * 1984-06-18 1986-01-11 Omron Tateisi Electronics Co 二次元視覚認識装置
JPS615385A (ja) * 1984-06-18 1986-01-11 Omron Tateisi Electronics Co 二次元視覚認識装置
JPH0581949B2 (ja) * 1984-06-18 1993-11-16 Omron Tateisi Electronics Co

Also Published As

Publication number Publication date
JPH0115910B2 (ja) 1989-03-22

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