JPS57104808A - Shape measuring apparatus - Google Patents

Shape measuring apparatus

Info

Publication number
JPS57104808A
JPS57104808A JP18114280A JP18114280A JPS57104808A JP S57104808 A JPS57104808 A JP S57104808A JP 18114280 A JP18114280 A JP 18114280A JP 18114280 A JP18114280 A JP 18114280A JP S57104808 A JPS57104808 A JP S57104808A
Authority
JP
Japan
Prior art keywords
light
currents
circuits
irradiated
photo detector
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP18114280A
Other languages
English (en)
Japanese (ja)
Other versions
JPS6355641B2 (enrdf_load_stackoverflow
Inventor
Toshio Ichikawa
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Anritsu Corp
Original Assignee
Anritsu Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Anritsu Corp filed Critical Anritsu Corp
Priority to JP18114280A priority Critical patent/JPS57104808A/ja
Publication of JPS57104808A publication Critical patent/JPS57104808A/ja
Publication of JPS6355641B2 publication Critical patent/JPS6355641B2/ja
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/24—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
    • G01B11/25—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures by projecting a pattern, e.g. one or more lines, moiré fringes on the object

Landscapes

  • Engineering & Computer Science (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Length Measuring Devices By Optical Means (AREA)
  • Measurement Of Optical Distance (AREA)
JP18114280A 1980-12-20 1980-12-20 Shape measuring apparatus Granted JPS57104808A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP18114280A JPS57104808A (en) 1980-12-20 1980-12-20 Shape measuring apparatus

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP18114280A JPS57104808A (en) 1980-12-20 1980-12-20 Shape measuring apparatus

Publications (2)

Publication Number Publication Date
JPS57104808A true JPS57104808A (en) 1982-06-30
JPS6355641B2 JPS6355641B2 (enrdf_load_stackoverflow) 1988-11-04

Family

ID=16095617

Family Applications (1)

Application Number Title Priority Date Filing Date
JP18114280A Granted JPS57104808A (en) 1980-12-20 1980-12-20 Shape measuring apparatus

Country Status (1)

Country Link
JP (1) JPS57104808A (enrdf_load_stackoverflow)

Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6184580A (ja) * 1984-10-02 1986-04-30 Yukio Muto 変位量測定器
US4673817A (en) * 1984-05-23 1987-06-16 N.V. Optische Industrie De Oude Delft Measuring system for contactless measuring the distance between a predetermined point of an object surface and a reference level
JPH051904A (ja) * 1990-11-27 1993-01-08 Nkk Corp 光学式形状計
JPH0560532A (ja) * 1990-11-27 1993-03-09 Nkk Corp 光学式形状計
JP2010048662A (ja) * 2008-08-21 2010-03-04 Dainippon Screen Mfg Co Ltd 視覚装置

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5315161A (en) * 1976-07-27 1978-02-10 Nec Corp Moving method for object to specified position by using laser beam

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5315161A (en) * 1976-07-27 1978-02-10 Nec Corp Moving method for object to specified position by using laser beam

Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4673817A (en) * 1984-05-23 1987-06-16 N.V. Optische Industrie De Oude Delft Measuring system for contactless measuring the distance between a predetermined point of an object surface and a reference level
JPS6184580A (ja) * 1984-10-02 1986-04-30 Yukio Muto 変位量測定器
JPH051904A (ja) * 1990-11-27 1993-01-08 Nkk Corp 光学式形状計
JPH0560532A (ja) * 1990-11-27 1993-03-09 Nkk Corp 光学式形状計
JP2010048662A (ja) * 2008-08-21 2010-03-04 Dainippon Screen Mfg Co Ltd 視覚装置

Also Published As

Publication number Publication date
JPS6355641B2 (enrdf_load_stackoverflow) 1988-11-04

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