JPS569848A - Automatic test logic unit - Google Patents

Automatic test logic unit

Info

Publication number
JPS569848A
JPS569848A JP8416379A JP8416379A JPS569848A JP S569848 A JPS569848 A JP S569848A JP 8416379 A JP8416379 A JP 8416379A JP 8416379 A JP8416379 A JP 8416379A JP S569848 A JPS569848 A JP S569848A
Authority
JP
Japan
Prior art keywords
circuit
output
logic
signal line
constitution
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP8416379A
Other languages
Japanese (ja)
Inventor
Shigeru Takasaki
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
NEC Corp
Original Assignee
NEC Corp
Nippon Electric Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by NEC Corp, Nippon Electric Co Ltd filed Critical NEC Corp
Priority to JP8416379A priority Critical patent/JPS569848A/en
Publication of JPS569848A publication Critical patent/JPS569848A/en
Pending legal-status Critical Current

Links

Abstract

PURPOSE: To improve the function of diagnosing a fault happening to a unit itself and also to make it possible to find the fault in its early stage even when a logic function increases in scale, by making a diagnosis by dividing a logic circuit on a constant scale into individual small-unit logic circuits.
CONSTITUTION: The logic circuit is divided into small-unit logic circuits 201W204 and memory element groups 101W103 are provided among the logic circuits to remember temporarily outputs of circuits 201W203 in a diagnosis. In the circuit constitution to diagnose circuit 203, the output of ROM301 stored with the correct value of circuit 203 propagates through signal line 503 and the output of element group 103 propagates through signal line 504 and is input to dissidence detecting circuit 401 for comparison, the output of which is output to signal line 801 by way of logic circuit 701. Similaly, in the constitution to diagnose circuit 202, dissidence detecting circuit 402 compares the output of ROM302 to that of element group 102 and sends its output from signal line 801 by way of circuit 701.
COPYRIGHT: (C)1981,JPO&Japio
JP8416379A 1979-07-03 1979-07-03 Automatic test logic unit Pending JPS569848A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP8416379A JPS569848A (en) 1979-07-03 1979-07-03 Automatic test logic unit

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP8416379A JPS569848A (en) 1979-07-03 1979-07-03 Automatic test logic unit

Publications (1)

Publication Number Publication Date
JPS569848A true JPS569848A (en) 1981-01-31

Family

ID=13822819

Family Applications (1)

Application Number Title Priority Date Filing Date
JP8416379A Pending JPS569848A (en) 1979-07-03 1979-07-03 Automatic test logic unit

Country Status (1)

Country Link
JP (1) JPS569848A (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6415834A (en) * 1987-07-10 1989-01-19 Nec Corp Microcomputer

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6415834A (en) * 1987-07-10 1989-01-19 Nec Corp Microcomputer

Similar Documents

Publication Publication Date Title
EP0234038A3 (en) Apparatus for identifying the lru storage unit in a memory
JPS569848A (en) Automatic test logic unit
JPS52138981A (en) Stress indicator
JPS5682953A (en) Fault detecting circuit
JPS5549760A (en) Information processing unit diagnostic system
JPS5637573A (en) Integrated circuit with tracer memory
JPS53118327A (en) Automatic test data generator
JPS5715296A (en) Testing system for storage device
JPS57139815A (en) Fault diagnostic device
JPS55119004A (en) Indicator for operating state of light sensor
JPS57115855A (en) Large scale semiconductor integrated circuit device
JPS55123744A (en) Logic integrated circuit easy to check
JPS57123459A (en) Logic device
JPS5549758A (en) Information processing unit diagnostic system
JPS5639648A (en) Information transmitter
SU1181118A1 (en) Malfunction diagnosis device for pulser
JPS57105053A (en) Integrated circuit which has incorporated testing circuit for fault detecting circuit
JPS55103604A (en) Fault diagnosis system of digital control unit
JPS57201125A (en) Reference point signal checking system for special thread cutting
JPS5484183A (en) Trouble diagnosing method for process controlling apparatus
JPS5495141A (en) Fault detector
JPS55153019A (en) Diagnosing circuit for operation of digital output unit
JPS5693060A (en) Selecting device for linear type ic circuit
JPS5588150A (en) Self-check circuit of input-output part
JPS641974A (en) Self-diagnosing circuit for indicator