JPS57105053A - Integrated circuit which has incorporated testing circuit for fault detecting circuit - Google Patents
Integrated circuit which has incorporated testing circuit for fault detecting circuitInfo
- Publication number
- JPS57105053A JPS57105053A JP55181477A JP18147780A JPS57105053A JP S57105053 A JPS57105053 A JP S57105053A JP 55181477 A JP55181477 A JP 55181477A JP 18147780 A JP18147780 A JP 18147780A JP S57105053 A JPS57105053 A JP S57105053A
- Authority
- JP
- Japan
- Prior art keywords
- circuit
- testing
- circuits
- fault
- detecting
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Classifications
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F11/00—Error detection; Error correction; Monitoring
- G06F11/22—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing
- G06F11/2205—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing using arrangements specific to the hardware being tested
- G06F11/2215—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing using arrangements specific to the hardware being tested to test error correction or detection circuits
Abstract
PURPOSE:To output a lot of test signals by a few input signals, and to raise a testing efficiency, by testing a fault detecting circuit for detecting a fault of a function circuit, by use of a testing circuit constituted of a sequence circuit, and integrating its testing circuit together with the function circuit and the fault detecting circuit. CONSTITUTION:A fault detecting circuit for detecting a fault of an operating circuit 1 is constituted of a parity forecasting circuit 2, parity checking circuits 3, 4, coincidence checking circuits 5, 6, and an OR circuit 7, and a testing circuit for testing the circuits 3-6 is constituted of a 3 bit counter 8 and a decoder 9. By these circuits 3, 4, an actual parity signal is generated from the respective operation results Z0-Z3 and Z4-Z7, coincidence of this generated parity signal and a forecasting parity signal forecast by the circuit 2 is checked and a fault of the circuit 1 is detected. In this way, a test pulse from the decoder 9 is provided to the circuits 3-6, respectively, a lot of test signals are outputted by a few input signals, and a test of the circuits 3-6 is executed efficiently.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP55181477A JPS57105053A (en) | 1980-12-22 | 1980-12-22 | Integrated circuit which has incorporated testing circuit for fault detecting circuit |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP55181477A JPS57105053A (en) | 1980-12-22 | 1980-12-22 | Integrated circuit which has incorporated testing circuit for fault detecting circuit |
Publications (2)
Publication Number | Publication Date |
---|---|
JPS57105053A true JPS57105053A (en) | 1982-06-30 |
JPS6239786B2 JPS6239786B2 (en) | 1987-08-25 |
Family
ID=16101434
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP55181477A Granted JPS57105053A (en) | 1980-12-22 | 1980-12-22 | Integrated circuit which has incorporated testing circuit for fault detecting circuit |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS57105053A (en) |
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS60182222A (en) * | 1984-02-06 | 1985-09-17 | エヌ・ベー・フイリツプス・フルーイランペンフアブリケン | Parity check circuit |
JPS646776A (en) * | 1987-06-29 | 1989-01-11 | Nippon Telegraph & Telephone | Method of testing semiconductor memory |
Families Citing this family (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH0429654Y2 (en) * | 1985-11-30 | 1992-07-17 |
Citations (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS4918403A (en) * | 1972-06-12 | 1974-02-18 | ||
JPS49123549A (en) * | 1973-03-30 | 1974-11-26 | ||
JPS5520555A (en) * | 1978-08-01 | 1980-02-14 | Nippon Telegr & Teleph Corp <Ntt> | Integrated circuit for information process system |
-
1980
- 1980-12-22 JP JP55181477A patent/JPS57105053A/en active Granted
Patent Citations (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS4918403A (en) * | 1972-06-12 | 1974-02-18 | ||
JPS49123549A (en) * | 1973-03-30 | 1974-11-26 | ||
JPS5520555A (en) * | 1978-08-01 | 1980-02-14 | Nippon Telegr & Teleph Corp <Ntt> | Integrated circuit for information process system |
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS60182222A (en) * | 1984-02-06 | 1985-09-17 | エヌ・ベー・フイリツプス・フルーイランペンフアブリケン | Parity check circuit |
JPS646776A (en) * | 1987-06-29 | 1989-01-11 | Nippon Telegraph & Telephone | Method of testing semiconductor memory |
Also Published As
Publication number | Publication date |
---|---|
JPS6239786B2 (en) | 1987-08-25 |
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