JPS5694350A - Method for correcting white spot defect of photomask - Google Patents
Method for correcting white spot defect of photomaskInfo
- Publication number
- JPS5694350A JPS5694350A JP17029179A JP17029179A JPS5694350A JP S5694350 A JPS5694350 A JP S5694350A JP 17029179 A JP17029179 A JP 17029179A JP 17029179 A JP17029179 A JP 17029179A JP S5694350 A JPS5694350 A JP S5694350A
- Authority
- JP
- Japan
- Prior art keywords
- photomask
- irradiation
- light quantity
- information
- defects
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 230000007547 defect Effects 0.000 title abstract 5
- 101700004678 SLIT3 Proteins 0.000 abstract 1
- 102100027339 Slit homolog 3 protein Human genes 0.000 abstract 1
- 229910052751 metal Inorganic materials 0.000 abstract 1
- 239000002184 metal Substances 0.000 abstract 1
- 238000003908 quality control method Methods 0.000 abstract 1
- 229910052709 silver Inorganic materials 0.000 abstract 1
- 239000004332 silver Substances 0.000 abstract 1
Classifications
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F1/00—Originals for photomechanical production of textured or patterned surfaces, e.g., masks, photo-masks, reticles; Mask blanks or pellicles therefor; Containers specially adapted therefor; Preparation thereof
- G03F1/68—Preparation processes not covered by groups G03F1/20 - G03F1/50
- G03F1/72—Repair or correction of mask defects
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Length Measuring Devices By Optical Means (AREA)
- Preparing Plates And Mask In Photomechanical Process (AREA)
- Exposure And Positioning Against Photoresist Photosensitive Materials (AREA)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP17029179A JPS5694350A (en) | 1979-12-28 | 1979-12-28 | Method for correcting white spot defect of photomask |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP17029179A JPS5694350A (en) | 1979-12-28 | 1979-12-28 | Method for correcting white spot defect of photomask |
Publications (2)
Publication Number | Publication Date |
---|---|
JPS5694350A true JPS5694350A (en) | 1981-07-30 |
JPS6140103B2 JPS6140103B2 (enrdf_load_stackoverflow) | 1986-09-08 |
Family
ID=15902225
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP17029179A Granted JPS5694350A (en) | 1979-12-28 | 1979-12-28 | Method for correcting white spot defect of photomask |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS5694350A (enrdf_load_stackoverflow) |
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS58138028A (ja) * | 1982-02-12 | 1983-08-16 | Hitachi Ltd | フオトマスクの欠陥修正方法 |
JPS6157805U (enrdf_load_stackoverflow) * | 1984-09-20 | 1986-04-18 |
-
1979
- 1979-12-28 JP JP17029179A patent/JPS5694350A/ja active Granted
Non-Patent Citations (2)
Title |
---|
APPLIED PHSICS LETTERS=1979 * |
APPLIED PHYSICS LETTERS=1975 * |
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS58138028A (ja) * | 1982-02-12 | 1983-08-16 | Hitachi Ltd | フオトマスクの欠陥修正方法 |
JPS6157805U (enrdf_load_stackoverflow) * | 1984-09-20 | 1986-04-18 |
Also Published As
Publication number | Publication date |
---|---|
JPS6140103B2 (enrdf_load_stackoverflow) | 1986-09-08 |
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