JPS5671178A - Pattern check method of print substrate - Google Patents

Pattern check method of print substrate

Info

Publication number
JPS5671178A
JPS5671178A JP14642679A JP14642679A JPS5671178A JP S5671178 A JPS5671178 A JP S5671178A JP 14642679 A JP14642679 A JP 14642679A JP 14642679 A JP14642679 A JP 14642679A JP S5671178 A JPS5671178 A JP S5671178A
Authority
JP
Japan
Prior art keywords
holes
print substrates
cameras
gate
circuit
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP14642679A
Other languages
English (en)
Japanese (ja)
Other versions
JPS6125194B2 (OSRAM
Inventor
Yasuhiko Hara
Yukio Uto
Koichi Tsukazaki
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Hitachi Ltd
Original Assignee
Hitachi Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hitachi Ltd filed Critical Hitachi Ltd
Priority to JP14642679A priority Critical patent/JPS5671178A/ja
Publication of JPS5671178A publication Critical patent/JPS5671178A/ja
Publication of JPS6125194B2 publication Critical patent/JPS6125194B2/ja
Granted legal-status Critical Current

Links

Landscapes

  • Length Measuring Devices By Optical Means (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
  • Image Processing (AREA)
  • Image Analysis (AREA)
JP14642679A 1979-11-14 1979-11-14 Pattern check method of print substrate Granted JPS5671178A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP14642679A JPS5671178A (en) 1979-11-14 1979-11-14 Pattern check method of print substrate

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP14642679A JPS5671178A (en) 1979-11-14 1979-11-14 Pattern check method of print substrate

Publications (2)

Publication Number Publication Date
JPS5671178A true JPS5671178A (en) 1981-06-13
JPS6125194B2 JPS6125194B2 (OSRAM) 1986-06-14

Family

ID=15407406

Family Applications (1)

Application Number Title Priority Date Filing Date
JP14642679A Granted JPS5671178A (en) 1979-11-14 1979-11-14 Pattern check method of print substrate

Country Status (1)

Country Link
JP (1) JPS5671178A (OSRAM)

Cited By (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS59195878U (ja) * 1983-06-15 1984-12-26 日立電子株式会社 パタ−ン認識装置
JPS6027500U (ja) * 1983-07-29 1985-02-25 日立電子株式会社 パタ−ン認識装置
JPS6178090A (ja) * 1984-09-26 1986-04-21 三菱電機株式会社 複合型電磁調理器
JPS6247788A (ja) * 1985-08-27 1987-03-02 Shigumatsukusu Kk 物体識別装置
JPS62245388A (ja) * 1986-04-11 1987-10-26 ベルトロニクス、インコ−ポレ−テツド 物体を自動検査し欠陥等を含めて既知／未知部分を識別又は認識する装置および方法
JPS6315374A (ja) * 1986-07-05 1988-01-22 Dainippon Screen Mfg Co Ltd パタ−ンマスキング方法およびその装置
JPH0429041A (ja) * 1990-05-25 1992-01-31 Matsushita Electric Ind Co Ltd 配線パターン検査装置
JPH04355908A (ja) * 1991-07-26 1992-12-09 Nippon Chemicon Corp 電解コンデンサの封口方法
WO2006100780A1 (ja) * 2005-03-24 2006-09-28 Olympus Corporation リペア方法及びその装置
CN103149150A (zh) * 2013-01-31 2013-06-12 厦门大学 一种悬挂式检测台

Cited By (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS59195878U (ja) * 1983-06-15 1984-12-26 日立電子株式会社 パタ−ン認識装置
JPS6027500U (ja) * 1983-07-29 1985-02-25 日立電子株式会社 パタ−ン認識装置
JPS6178090A (ja) * 1984-09-26 1986-04-21 三菱電機株式会社 複合型電磁調理器
JPS6247788A (ja) * 1985-08-27 1987-03-02 Shigumatsukusu Kk 物体識別装置
JPS62245388A (ja) * 1986-04-11 1987-10-26 ベルトロニクス、インコ−ポレ−テツド 物体を自動検査し欠陥等を含めて既知／未知部分を識別又は認識する装置および方法
JPS6315374A (ja) * 1986-07-05 1988-01-22 Dainippon Screen Mfg Co Ltd パタ−ンマスキング方法およびその装置
JPH0429041A (ja) * 1990-05-25 1992-01-31 Matsushita Electric Ind Co Ltd 配線パターン検査装置
JPH04355908A (ja) * 1991-07-26 1992-12-09 Nippon Chemicon Corp 電解コンデンサの封口方法
WO2006100780A1 (ja) * 2005-03-24 2006-09-28 Olympus Corporation リペア方法及びその装置
JP5185617B2 (ja) * 2005-03-24 2013-04-17 オリンパス株式会社 リペア方法及びその装置
CN103149150A (zh) * 2013-01-31 2013-06-12 厦门大学 一种悬挂式检测台

Also Published As

Publication number Publication date
JPS6125194B2 (OSRAM) 1986-06-14

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