JPS567047A - Simultaneously measuring crack and inclusion in slab sample using electron beam - Google Patents
Simultaneously measuring crack and inclusion in slab sample using electron beamInfo
- Publication number
- JPS567047A JPS567047A JP8283279A JP8283279A JPS567047A JP S567047 A JPS567047 A JP S567047A JP 8283279 A JP8283279 A JP 8283279A JP 8283279 A JP8283279 A JP 8283279A JP S567047 A JPS567047 A JP S567047A
- Authority
- JP
- Japan
- Prior art keywords
- sample
- electron beam
- crack
- rays
- inclusions
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
- G01N23/22—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material
- G01N23/225—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material using electron or ion
Landscapes
- Physics & Mathematics (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- General Physics & Mathematics (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Analysing Materials By The Use Of Radiation (AREA)
Priority Applications (3)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP8283279A JPS567047A (en) | 1979-06-29 | 1979-06-29 | Simultaneously measuring crack and inclusion in slab sample using electron beam |
| US06/160,573 US4331872A (en) | 1979-06-29 | 1980-06-17 | Method for measurement of distribution of inclusions in a slab by electron beam irradiation |
| DE3024372A DE3024372C2 (de) | 1979-06-29 | 1980-06-27 | Verfahren zur Messung der Verteilung von Einschlüssen in einem Barren durch Elektronenbestrahlung |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP8283279A JPS567047A (en) | 1979-06-29 | 1979-06-29 | Simultaneously measuring crack and inclusion in slab sample using electron beam |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS567047A true JPS567047A (en) | 1981-01-24 |
| JPS647337B2 JPS647337B2 (enrdf_load_stackoverflow) | 1989-02-08 |
Family
ID=13785371
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP8283279A Granted JPS567047A (en) | 1979-06-29 | 1979-06-29 | Simultaneously measuring crack and inclusion in slab sample using electron beam |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS567047A (enrdf_load_stackoverflow) |
-
1979
- 1979-06-29 JP JP8283279A patent/JPS567047A/ja active Granted
Also Published As
| Publication number | Publication date |
|---|---|
| JPS647337B2 (enrdf_load_stackoverflow) | 1989-02-08 |
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