JPS55159143A - Metal surface flaw detector - Google Patents
Metal surface flaw detectorInfo
- Publication number
- JPS55159143A JPS55159143A JP6768179A JP6768179A JPS55159143A JP S55159143 A JPS55159143 A JP S55159143A JP 6768179 A JP6768179 A JP 6768179A JP 6768179 A JP6768179 A JP 6768179A JP S55159143 A JPS55159143 A JP S55159143A
- Authority
- JP
- Japan
- Prior art keywords
- specimen
- radiation
- exoelectron
- measuring
- flaw detector
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
- G01N23/22—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material
- G01N23/227—Measuring photoelectric effect, e.g. photoelectron emission microscopy [PEEM]
Landscapes
- Physics & Mathematics (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- General Physics & Mathematics (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Analysing Materials By The Use Of Radiation (AREA)
- Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
Abstract
PURPOSE:To detect the surface flaws of metal products accurately, rapidly and industrially by measuring the radiation quantity of exoelectron. CONSTITUTION:A flaw detector 1 is provided with a vacuum system 2, ultraviolet light radiation system 3, exoelectron measuring system 4, electro-optical system 5, observation system 6 and specimen driving system 7. The specimen 8 is set on a stage 14 in a vacuum vessel 8 which is maintained in a high vacuum state and ultraviolet light is imaged on the specimen by the system 3 to locally excite the specimen surface, by which the spontaneous radiation of exoelectron is accelerated. The intensity of the excoelectron radiated from the flawed portion of the surface is measured in the system 4. The scanning measuring of the specimen surface is accomplished by using the system 7, whereby the measurement of the linear and area distributions of the radiation intensities is done. The results of the measurement are recorded in an XY recorder 42.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP6768179A JPS55159143A (en) | 1979-05-31 | 1979-05-31 | Metal surface flaw detector |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP6768179A JPS55159143A (en) | 1979-05-31 | 1979-05-31 | Metal surface flaw detector |
Publications (1)
Publication Number | Publication Date |
---|---|
JPS55159143A true JPS55159143A (en) | 1980-12-11 |
Family
ID=13351974
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP6768179A Pending JPS55159143A (en) | 1979-05-31 | 1979-05-31 | Metal surface flaw detector |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS55159143A (en) |
Cited By (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS57197454A (en) * | 1981-05-29 | 1982-12-03 | Rigaku Denki Kogyo Kk | X-ray analysing apparatus |
JPH03226952A (en) * | 1990-01-31 | 1991-10-07 | Shimadzu Corp | Exoelectron microscope |
JPH03100351U (en) * | 1990-01-30 | 1991-10-21 |
-
1979
- 1979-05-31 JP JP6768179A patent/JPS55159143A/en active Pending
Cited By (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS57197454A (en) * | 1981-05-29 | 1982-12-03 | Rigaku Denki Kogyo Kk | X-ray analysing apparatus |
JPH03100351U (en) * | 1990-01-30 | 1991-10-21 | ||
JPH03226952A (en) * | 1990-01-31 | 1991-10-07 | Shimadzu Corp | Exoelectron microscope |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
JPS5795056A (en) | Appearance inspecting process | |
DE58906980D1 (en) | Process for operating an optical smoke detector and smoke detector for carrying out the process. | |
JPS5757246A (en) | Detecting and measuring apparatus for flaw | |
ATE89416T1 (en) | APPARATUS AND METHOD FOR DETECTING AND COUNTING FLUORESCENT PARTICLES SUPPORTED ON A SOLID SUPPORT. | |
SE7700667L (en) | PROCEDURE AND DEVICE FOR DETERMINATION OF THE TOTAL PROTEIN CONTENT OR OF INDIVIDUAL AMINO ACIDS | |
DE69034142D1 (en) | METHOD AND DEVICE FOR DETECTING AN OBJECT | |
JPS55159143A (en) | Metal surface flaw detector | |
JPS5759143A (en) | Measuring method for grain size of granular material | |
US4331872A (en) | Method for measurement of distribution of inclusions in a slab by electron beam irradiation | |
GB1454013A (en) | Method and apparatus for testing luminescent materials | |
DE3585533D1 (en) | METHOD AND DEVICE FOR CONDITION ANALYSIS. | |
SU932352A1 (en) | Method of non-destructive testing of article strength | |
JPS56128443A (en) | Grain size measuring method of granulous substance | |
ATE18946T1 (en) | METHOD FOR OPTICAL DETECTION AND/OR MEASURING DEFORMATION AND/OR DISPLACEMENT OF AN OBJECT OR PART OF OBJECT, DEVICE FOR CARRYING OUT THIS METHOD AND APPLICATION OF THE METHOD. | |
JPS567044A (en) | Steel sample analyzer using electron beam | |
JPS54148483A (en) | Automatic detecting method for reference mark of exposure | |
JPS6445047A (en) | Measuring device for cathode luminesence | |
JPS6441836A (en) | Reflected light measuring apparatus | |
JPS56147444A (en) | Measuring method for field strength | |
JPS6418073A (en) | Detecting apparatus for voltage | |
JPS5776439A (en) | Method for measurement of contact angle | |
JPS6441847A (en) | Surface defect detection system for metallic product | |
JPS56130921A (en) | Adjusting method of axis of charged particle beam | |
JPH0124619Y2 (en) | ||
KR100250210B1 (en) | Online defect detecting method of thin metal plate |