JPS6441836A - Reflected light measuring apparatus - Google Patents

Reflected light measuring apparatus

Info

Publication number
JPS6441836A
JPS6441836A JP19801687A JP19801687A JPS6441836A JP S6441836 A JPS6441836 A JP S6441836A JP 19801687 A JP19801687 A JP 19801687A JP 19801687 A JP19801687 A JP 19801687A JP S6441836 A JPS6441836 A JP S6441836A
Authority
JP
Japan
Prior art keywords
light
measured
jig
angle
displacement
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP19801687A
Other languages
Japanese (ja)
Other versions
JPH073388B2 (en
Inventor
Yoshiyuki Tanaka
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Teijin Ltd
Original Assignee
Teijin Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Teijin Ltd filed Critical Teijin Ltd
Priority to JP62198016A priority Critical patent/JPH073388B2/en
Publication of JPS6441836A publication Critical patent/JPS6441836A/en
Publication of JPH073388B2 publication Critical patent/JPH073388B2/en
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/47—Scattering, i.e. diffuse reflection
    • G01N21/4738—Diffuse reflection, e.g. also for testing fluids, fibrous materials
    • G01N21/474—Details of optical heads therefor, e.g. using optical fibres

Abstract

PURPOSE:To detect the presence and the amount of various antibodies and antigens simultaneously, by a method wherein a flat plate to be measured is irradiated with a parallel light beam at a specified angle, the reflected light thereof is received displacing the flat plate being measured to display a measured value corresponding to the displacement of the plate being measured. CONSTITUTION:A parallel light beam is made to irradiate a flat plate (c) to be measured at an angle theta1 of incidence from a light irradiation jig (a) comprising a fiber for lighting. A light receiving jig (b) is provided on an opposed surface of the light irradiation jig (a) and is composed of a fiber for measurement. The light receiving jig (b) receives the reflected light of the light beam radiated at an angle theta1 when reflected at an angle theta2 the same or roughly the same as the angle of incidence. A setting jig (f) is moved vertically and can measure interference light at positions. The displacement of the setting jig (f) is detected by a displacement measuring means and a measured value of the reflected light is displayed correspondingly to the resulting amount of displacement.
JP62198016A 1987-08-10 1987-08-10 Film thickness change measuring device Expired - Lifetime JPH073388B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP62198016A JPH073388B2 (en) 1987-08-10 1987-08-10 Film thickness change measuring device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP62198016A JPH073388B2 (en) 1987-08-10 1987-08-10 Film thickness change measuring device

Publications (2)

Publication Number Publication Date
JPS6441836A true JPS6441836A (en) 1989-02-14
JPH073388B2 JPH073388B2 (en) 1995-01-18

Family

ID=16384112

Family Applications (1)

Application Number Title Priority Date Filing Date
JP62198016A Expired - Lifetime JPH073388B2 (en) 1987-08-10 1987-08-10 Film thickness change measuring device

Country Status (1)

Country Link
JP (1) JPH073388B2 (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN113418498A (en) * 2021-06-23 2021-09-21 中国核动力研究设计院 Panel deformation measuring component, device

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
FR3124251B1 (en) * 2021-06-18 2023-11-03 Safran Aircraft Engines METHOD AND DEVICE FOR DETERMINING THE THICKNESS OF A COATING BY COLORIMETRY

Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS51148015A (en) * 1975-05-27 1976-12-18 Gen Electric Diagnostic apparatus
JPS58122448A (en) * 1982-01-16 1983-07-21 Nippon Denshiyoku Kogyo Kk Varied-angle colorimeter
JPS58195142A (en) * 1982-04-26 1983-11-14 サガクス・インストルメント・アクチエボラ−グ Detection and (or) density measuring method for laminate and chemical substance using said laminate
JPS59160763A (en) * 1973-07-30 1984-09-11 ゼネラル・エレクトリック・カンパニイ Detector for protein

Patent Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS59160763A (en) * 1973-07-30 1984-09-11 ゼネラル・エレクトリック・カンパニイ Detector for protein
JPS51148015A (en) * 1975-05-27 1976-12-18 Gen Electric Diagnostic apparatus
JPS58122448A (en) * 1982-01-16 1983-07-21 Nippon Denshiyoku Kogyo Kk Varied-angle colorimeter
JPS58195142A (en) * 1982-04-26 1983-11-14 サガクス・インストルメント・アクチエボラ−グ Detection and (or) density measuring method for laminate and chemical substance using said laminate

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN113418498A (en) * 2021-06-23 2021-09-21 中国核动力研究设计院 Panel deformation measuring component, device
CN113418498B (en) * 2021-06-23 2023-05-26 中国核动力研究设计院 Plate deformation measuring assembly and device

Also Published As

Publication number Publication date
JPH073388B2 (en) 1995-01-18

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