JPS5635424A - Manufacture of semiconductor device - Google Patents
Manufacture of semiconductor deviceInfo
- Publication number
- JPS5635424A JPS5635424A JP11040880A JP11040880A JPS5635424A JP S5635424 A JPS5635424 A JP S5635424A JP 11040880 A JP11040880 A JP 11040880A JP 11040880 A JP11040880 A JP 11040880A JP S5635424 A JPS5635424 A JP S5635424A
- Authority
- JP
- Japan
- Prior art keywords
- sio2 film
- trialkyl
- hydroxyalkyl
- aqueous solution
- ammonium hydroxide
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Classifications
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/26—Processing photosensitive materials; Apparatus therefor
- G03F7/30—Imagewise removal using liquid means
- G03F7/32—Liquid compositions therefor, e.g. developers
- G03F7/322—Aqueous alkaline compositions
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Photosensitive Polymer And Photoresist Processing (AREA)
- Exposure Of Semiconductors, Excluding Electron Or Ion Beam Exposure (AREA)
Abstract
PURPOSE:To eliminate contamination and the adsorption of residues to others in photoetching, by using an aqueous solution of trialkyl (hydroxyalkyl) ammonium hydroxide to remove the unexposed portion of positive photosensitive resin. CONSTITUTION:An SiO2 film is coated on an Si substrate. Positive photosensitive resin made as slurry by dissolving it in an organic solvent is provided on the SiO2 film. Heat treatment is then effected at 80 deg.C for about 20min to ensure the adhesion of the resin to the SiO2 film, evaporate the solvent and prevent fog. A photomask is positioned. Exposure is performed by a light source laid in parallel with the surface of the mask. The unexposed portion is removed by an aqueous solution of trialkyl (hydroxyalkyl) ammonium hydroxide. As a result, electric properties are not deteriorated because impurities such as Na, Cu and Ag which need to be badly avoided in the manufacture of a semiconductor are little. Besides, a sharp image line is made available.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP11040880A JPS5635424A (en) | 1980-08-13 | 1980-08-13 | Manufacture of semiconductor device |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP11040880A JPS5635424A (en) | 1980-08-13 | 1980-08-13 | Manufacture of semiconductor device |
Related Parent Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP14072175A Division JPS5264877A (en) | 1975-11-26 | 1975-11-26 | Production of semiconductor device |
Publications (1)
Publication Number | Publication Date |
---|---|
JPS5635424A true JPS5635424A (en) | 1981-04-08 |
Family
ID=14535019
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP11040880A Pending JPS5635424A (en) | 1980-08-13 | 1980-08-13 | Manufacture of semiconductor device |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS5635424A (en) |
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS6249355A (en) * | 1985-08-10 | 1987-03-04 | Nagase Sangyo Kk | Stripping agent composition |
EP0212556A2 (en) * | 1985-08-24 | 1987-03-04 | Hoechst Aktiengesellschaft | Stripping process for lightly hardened photoresist layers |
Citations (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5351971A (en) * | 1976-10-21 | 1978-05-11 | Toshiba Corp | Manufacture for semiconductor |
-
1980
- 1980-08-13 JP JP11040880A patent/JPS5635424A/en active Pending
Patent Citations (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5351971A (en) * | 1976-10-21 | 1978-05-11 | Toshiba Corp | Manufacture for semiconductor |
Cited By (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS6249355A (en) * | 1985-08-10 | 1987-03-04 | Nagase Sangyo Kk | Stripping agent composition |
EP0212556A2 (en) * | 1985-08-24 | 1987-03-04 | Hoechst Aktiengesellschaft | Stripping process for lightly hardened photoresist layers |
JPS6250832A (en) * | 1985-08-24 | 1987-03-05 | ヘキスト・アクチエンゲゼルシヤフト | Stripping of photosetting photoresist layer |
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