JPS5633844A - Semiconductor device and manufacture therefor - Google Patents
Semiconductor device and manufacture thereforInfo
- Publication number
- JPS5633844A JPS5633844A JP10995879A JP10995879A JPS5633844A JP S5633844 A JPS5633844 A JP S5633844A JP 10995879 A JP10995879 A JP 10995879A JP 10995879 A JP10995879 A JP 10995879A JP S5633844 A JPS5633844 A JP S5633844A
- Authority
- JP
- Japan
- Prior art keywords
- oxide film
- vapor growth
- semiconductor device
- dampproofness
- 9mol
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/02104—Forming layers
- H01L21/02107—Forming insulating materials on a substrate
Landscapes
- Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Manufacturing & Machinery (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Internal Circuitry In Semiconductor Integrated Circuit Devices (AREA)
- Formation Of Insulating Films (AREA)
Abstract
PURPOSE:To improve the dampproofness of the semiconductor device and to extend life by using an oxide film containing specific high density P2O5 as an insulator forming a wiring layer on the oxide film. CONSTITUTION:A high density phosphorus glass layer 6 is formed on a field oxide film, a gate oxide film and a gate electrode which are provided on a silicon substrate 1. After making holes for contact on the layer 6, a vapor growth oxide film 7 (Especially, SiO2) containing P2O5 with 0.4-9mol% is formed. And heat treatment is made at 900-1,000 deg.C to minute the oxide film. After making holes for contact, an aluminum wiring 8 is formed by aluminum evaporation. Finally, the parts except a bonding pad section are covered with a vapor growth oxide film 9 containing P2O5 with 0.4-9mol%. In this way, the dampproofness of a device will be improved and life will also be extended. Especially, P2O5 of the vapor growth oxide film with 1-7mol% density permits full fruit.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP10995879A JPS5633844A (en) | 1979-08-28 | 1979-08-28 | Semiconductor device and manufacture therefor |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP10995879A JPS5633844A (en) | 1979-08-28 | 1979-08-28 | Semiconductor device and manufacture therefor |
Publications (2)
Publication Number | Publication Date |
---|---|
JPS5633844A true JPS5633844A (en) | 1981-04-04 |
JPS6344293B2 JPS6344293B2 (en) | 1988-09-05 |
Family
ID=14523440
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP10995879A Granted JPS5633844A (en) | 1979-08-28 | 1979-08-28 | Semiconductor device and manufacture therefor |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS5633844A (en) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS58119611A (en) * | 1982-01-07 | 1983-07-16 | Mitsubishi Electric Corp | Superconducting coil |
Citations (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5214367A (en) * | 1975-07-25 | 1977-02-03 | Hitachi Ltd | Semiconductor device on which the phosphosilicate glass layer is formed |
JPS52131484A (en) * | 1976-04-28 | 1977-11-04 | Hitachi Ltd | Semiconductor device |
JPS5460558A (en) * | 1977-10-24 | 1979-05-16 | Hitachi Ltd | Electrode forming method |
-
1979
- 1979-08-28 JP JP10995879A patent/JPS5633844A/en active Granted
Patent Citations (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5214367A (en) * | 1975-07-25 | 1977-02-03 | Hitachi Ltd | Semiconductor device on which the phosphosilicate glass layer is formed |
JPS52131484A (en) * | 1976-04-28 | 1977-11-04 | Hitachi Ltd | Semiconductor device |
JPS5460558A (en) * | 1977-10-24 | 1979-05-16 | Hitachi Ltd | Electrode forming method |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS58119611A (en) * | 1982-01-07 | 1983-07-16 | Mitsubishi Electric Corp | Superconducting coil |
Also Published As
Publication number | Publication date |
---|---|
JPS6344293B2 (en) | 1988-09-05 |
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