JPS562523A - Frequency chart for mtf measurement - Google Patents

Frequency chart for mtf measurement

Info

Publication number
JPS562523A
JPS562523A JP7774279A JP7774279A JPS562523A JP S562523 A JPS562523 A JP S562523A JP 7774279 A JP7774279 A JP 7774279A JP 7774279 A JP7774279 A JP 7774279A JP S562523 A JPS562523 A JP S562523A
Authority
JP
Japan
Prior art keywords
pitch
pattern
mtf
measurement
space frequency
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP7774279A
Other languages
English (en)
Japanese (ja)
Other versions
JPS6248178B2 (enrdf_load_stackoverflow
Inventor
Takashi Yokota
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Ricoh Co Ltd
Original Assignee
Ricoh Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Ricoh Co Ltd filed Critical Ricoh Co Ltd
Priority to JP7774279A priority Critical patent/JPS562523A/ja
Publication of JPS562523A publication Critical patent/JPS562523A/ja
Publication of JPS6248178B2 publication Critical patent/JPS6248178B2/ja
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01M—TESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
    • G01M11/00—Testing of optical apparatus; Testing structures by optical methods not otherwise provided for
    • G01M11/02—Testing optical properties
    • G01M11/0292—Testing optical properties of objectives by measuring the optical modulation transfer function

Landscapes

  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
  • Testing, Inspecting, Measuring Of Stereoscopic Televisions And Televisions (AREA)
JP7774279A 1979-06-20 1979-06-20 Frequency chart for mtf measurement Granted JPS562523A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP7774279A JPS562523A (en) 1979-06-20 1979-06-20 Frequency chart for mtf measurement

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP7774279A JPS562523A (en) 1979-06-20 1979-06-20 Frequency chart for mtf measurement

Publications (2)

Publication Number Publication Date
JPS562523A true JPS562523A (en) 1981-01-12
JPS6248178B2 JPS6248178B2 (enrdf_load_stackoverflow) 1987-10-13

Family

ID=13642354

Family Applications (1)

Application Number Title Priority Date Filing Date
JP7774279A Granted JPS562523A (en) 1979-06-20 1979-06-20 Frequency chart for mtf measurement

Country Status (1)

Country Link
JP (1) JPS562523A (enrdf_load_stackoverflow)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2007024889A (ja) * 2005-07-12 2007-02-01 Canon Inc Ｏｔｆ測定システム

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US12056616B2 (en) * 2019-01-30 2024-08-06 Samsung Electronics Co., Ltd. Method for processing image, and apparatus therefor

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2007024889A (ja) * 2005-07-12 2007-02-01 Canon Inc Ｏｔｆ測定システム

Also Published As

Publication number Publication date
JPS6248178B2 (enrdf_load_stackoverflow) 1987-10-13

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