JPS6248178B2 - - Google Patents
Info
- Publication number
- JPS6248178B2 JPS6248178B2 JP7774279A JP7774279A JPS6248178B2 JP S6248178 B2 JPS6248178 B2 JP S6248178B2 JP 7774279 A JP7774279 A JP 7774279A JP 7774279 A JP7774279 A JP 7774279A JP S6248178 B2 JPS6248178 B2 JP S6248178B2
- Authority
- JP
- Japan
- Prior art keywords
- pattern
- mtf
- measurement
- solid
- pitch
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
- 238000005259 measurement Methods 0.000 claims description 18
- 238000010606 normalization Methods 0.000 claims description 3
- 238000003384 imaging method Methods 0.000 description 7
- 230000003287 optical effect Effects 0.000 description 6
- 239000007787 solid Substances 0.000 description 6
- 238000010586 diagram Methods 0.000 description 4
- 238000000691 measurement method Methods 0.000 description 4
- 238000000034 method Methods 0.000 description 3
- 238000012360 testing method Methods 0.000 description 2
- 238000009434 installation Methods 0.000 description 1
- 239000011159 matrix material Substances 0.000 description 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01M—TESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
- G01M11/00—Testing of optical apparatus; Testing structures by optical methods not otherwise provided for
- G01M11/02—Testing optical properties
- G01M11/0292—Testing optical properties of objectives by measuring the optical modulation transfer function
Landscapes
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Testing Or Measuring Of Semiconductors Or The Like (AREA)
- Testing, Inspecting, Measuring Of Stereoscopic Televisions And Televisions (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP7774279A JPS562523A (en) | 1979-06-20 | 1979-06-20 | Frequency chart for mtf measurement |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP7774279A JPS562523A (en) | 1979-06-20 | 1979-06-20 | Frequency chart for mtf measurement |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS562523A JPS562523A (en) | 1981-01-12 |
| JPS6248178B2 true JPS6248178B2 (enrdf_load_stackoverflow) | 1987-10-13 |
Family
ID=13642354
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP7774279A Granted JPS562523A (en) | 1979-06-20 | 1979-06-20 | Frequency chart for mtf measurement |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS562523A (enrdf_load_stackoverflow) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| WO2020159241A1 (ko) * | 2019-01-30 | 2020-08-06 | 삼성전자 주식회사 | 이미지를 처리하기 위한 방법 및 그에 따른 장치 |
Families Citing this family (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| AU2005203031A1 (en) * | 2005-07-12 | 2007-02-01 | Canon Kabushiki Kaisha | Optical transfer function measurement system |
-
1979
- 1979-06-20 JP JP7774279A patent/JPS562523A/ja active Granted
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| WO2020159241A1 (ko) * | 2019-01-30 | 2020-08-06 | 삼성전자 주식회사 | 이미지를 처리하기 위한 방법 및 그에 따른 장치 |
Also Published As
| Publication number | Publication date |
|---|---|
| JPS562523A (en) | 1981-01-12 |
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