JPS5295274A - Coaxial probe for high frequency measurement - Google Patents
Coaxial probe for high frequency measurementInfo
- Publication number
- JPS5295274A JPS5295274A JP1198676A JP1198676A JPS5295274A JP S5295274 A JPS5295274 A JP S5295274A JP 1198676 A JP1198676 A JP 1198676A JP 1198676 A JP1198676 A JP 1198676A JP S5295274 A JPS5295274 A JP S5295274A
- Authority
- JP
- Japan
- Prior art keywords
- high frequency
- frequency measurement
- coaxial probe
- probes
- measurement
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Landscapes
- Measuring Leads Or Probes (AREA)
- Measurement Of Resistance Or Impedance (AREA)
Abstract
PURPOSE: Measurement of high accuracy even at high frequencies which have hitherto been impossible to measure is made possible considerbly reducing the exposure of probes and making possible simultaneous contacting of more than two points in extreme proximity, with more than two probes.
COPYRIGHT: (C)1977,JPO&Japio
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP1198676A JPS5295274A (en) | 1976-02-06 | 1976-02-06 | Coaxial probe for high frequency measurement |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP1198676A JPS5295274A (en) | 1976-02-06 | 1976-02-06 | Coaxial probe for high frequency measurement |
Publications (2)
Publication Number | Publication Date |
---|---|
JPS5295274A true JPS5295274A (en) | 1977-08-10 |
JPS5528025B2 JPS5528025B2 (en) | 1980-07-24 |
Family
ID=11792903
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP1198676A Granted JPS5295274A (en) | 1976-02-06 | 1976-02-06 | Coaxial probe for high frequency measurement |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS5295274A (en) |
Cited By (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5496268U (en) * | 1977-12-20 | 1979-07-07 | ||
JPH02208572A (en) * | 1989-02-07 | 1990-08-20 | Nec Corp | High frequency probe |
JP2013044660A (en) * | 2011-08-25 | 2013-03-04 | Fujitsu Ltd | Electric field probe and electric field measurement device |
JP2015087203A (en) * | 2013-10-30 | 2015-05-07 | 日本電子材料株式会社 | Coaxial probe and a probe card with the same |
JP2016020828A (en) * | 2014-07-14 | 2016-02-04 | 日置電機株式会社 | Probe unit and measurement device |
-
1976
- 1976-02-06 JP JP1198676A patent/JPS5295274A/en active Granted
Cited By (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5496268U (en) * | 1977-12-20 | 1979-07-07 | ||
JPH02208572A (en) * | 1989-02-07 | 1990-08-20 | Nec Corp | High frequency probe |
JP2013044660A (en) * | 2011-08-25 | 2013-03-04 | Fujitsu Ltd | Electric field probe and electric field measurement device |
JP2015087203A (en) * | 2013-10-30 | 2015-05-07 | 日本電子材料株式会社 | Coaxial probe and a probe card with the same |
JP2016020828A (en) * | 2014-07-14 | 2016-02-04 | 日置電機株式会社 | Probe unit and measurement device |
Also Published As
Publication number | Publication date |
---|---|
JPS5528025B2 (en) | 1980-07-24 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
JPS5580061A (en) | Frequency measuring apparatus | |
JPS5434673A (en) | Micro-distance measuring device for scan-type electronic microscope | |
JPS5295274A (en) | Coaxial probe for high frequency measurement | |
JPS5369685A (en) | Temperature measuring apparatus | |
JPS5295182A (en) | Measurement for high frequency characteristics of transistor wafer | |
JPS5378859A (en) | Automatic measuring and testing system | |
JPS5337077A (en) | Probe for tester | |
JPS5322757A (en) | Testing apparatus of electric a ppliances | |
JPS5244673A (en) | Loss angle measuring instrument | |
JPS52154696A (en) | Ph measuring probe | |
JPS53124486A (en) | Temperature measuring apparatus by ultrasonic waves | |
JPS5216177A (en) | Probe card | |
JPS5255570A (en) | Apparatus for displaying multiple phenomena of signals | |
JPS5353265A (en) | Prober | |
JPS52124375A (en) | Measuring apparatus of axle | |
JPS5269393A (en) | Bacteria inspecting device | |
JPS5226879A (en) | Method of measuring phase constants in waveguides | |
JPS5219944A (en) | Pulse width change circuit | |
JPS52135774A (en) | Digital chronograph | |
JPS52155065A (en) | Wafer insepaction method | |
JPS5211075A (en) | Measuring system for surface temperature of running thread | |
JPS51135578A (en) | Continuous meter for high frequency, high stability, high sensitivity resistance capacity measurement and their very fine changes | |
JPS51146896A (en) | Supersonic wave density measuring method | |
JPS51132875A (en) | Measuring signal averaging device | |
JPS5494222A (en) | Input impefance measuring method for facsimile transceiver |