JPS5295274A - Coaxial probe for high frequency measurement - Google Patents

Coaxial probe for high frequency measurement

Info

Publication number
JPS5295274A
JPS5295274A JP1198676A JP1198676A JPS5295274A JP S5295274 A JPS5295274 A JP S5295274A JP 1198676 A JP1198676 A JP 1198676A JP 1198676 A JP1198676 A JP 1198676A JP S5295274 A JPS5295274 A JP S5295274A
Authority
JP
Japan
Prior art keywords
high frequency
frequency measurement
coaxial probe
probes
measurement
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP1198676A
Other languages
Japanese (ja)
Other versions
JPS5528025B2 (en
Inventor
Junichi Yoshida
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Nippon Telegraph and Telephone Corp
Original Assignee
Nippon Telegraph and Telephone Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Nippon Telegraph and Telephone Corp filed Critical Nippon Telegraph and Telephone Corp
Priority to JP1198676A priority Critical patent/JPS5295274A/en
Publication of JPS5295274A publication Critical patent/JPS5295274A/en
Publication of JPS5528025B2 publication Critical patent/JPS5528025B2/ja
Granted legal-status Critical Current

Links

Landscapes

  • Measuring Leads Or Probes (AREA)
  • Measurement Of Resistance Or Impedance (AREA)

Abstract

PURPOSE: Measurement of high accuracy even at high frequencies which have hitherto been impossible to measure is made possible considerbly reducing the exposure of probes and making possible simultaneous contacting of more than two points in extreme proximity, with more than two probes.
COPYRIGHT: (C)1977,JPO&Japio
JP1198676A 1976-02-06 1976-02-06 Coaxial probe for high frequency measurement Granted JPS5295274A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP1198676A JPS5295274A (en) 1976-02-06 1976-02-06 Coaxial probe for high frequency measurement

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP1198676A JPS5295274A (en) 1976-02-06 1976-02-06 Coaxial probe for high frequency measurement

Publications (2)

Publication Number Publication Date
JPS5295274A true JPS5295274A (en) 1977-08-10
JPS5528025B2 JPS5528025B2 (en) 1980-07-24

Family

ID=11792903

Family Applications (1)

Application Number Title Priority Date Filing Date
JP1198676A Granted JPS5295274A (en) 1976-02-06 1976-02-06 Coaxial probe for high frequency measurement

Country Status (1)

Country Link
JP (1) JPS5295274A (en)

Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5496268U (en) * 1977-12-20 1979-07-07
JPH02208572A (en) * 1989-02-07 1990-08-20 Nec Corp High frequency probe
JP2013044660A (en) * 2011-08-25 2013-03-04 Fujitsu Ltd Electric field probe and electric field measurement device
JP2015087203A (en) * 2013-10-30 2015-05-07 日本電子材料株式会社 Coaxial probe and a probe card with the same
JP2016020828A (en) * 2014-07-14 2016-02-04 日置電機株式会社 Probe unit and measurement device

Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5496268U (en) * 1977-12-20 1979-07-07
JPH02208572A (en) * 1989-02-07 1990-08-20 Nec Corp High frequency probe
JP2013044660A (en) * 2011-08-25 2013-03-04 Fujitsu Ltd Electric field probe and electric field measurement device
JP2015087203A (en) * 2013-10-30 2015-05-07 日本電子材料株式会社 Coaxial probe and a probe card with the same
JP2016020828A (en) * 2014-07-14 2016-02-04 日置電機株式会社 Probe unit and measurement device

Also Published As

Publication number Publication date
JPS5528025B2 (en) 1980-07-24

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