JPS5622974A - Test method for integrated circuit - Google Patents

Test method for integrated circuit

Info

Publication number
JPS5622974A
JPS5622974A JP9895879A JP9895879A JPS5622974A JP S5622974 A JPS5622974 A JP S5622974A JP 9895879 A JP9895879 A JP 9895879A JP 9895879 A JP9895879 A JP 9895879A JP S5622974 A JPS5622974 A JP S5622974A
Authority
JP
Japan
Prior art keywords
voltage
value
dut7
generator
circuit
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP9895879A
Other languages
Japanese (ja)
Inventor
Akio Takahashi
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
NEC Corp
Original Assignee
NEC Corp
Nippon Electric Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by NEC Corp, Nippon Electric Co Ltd filed Critical NEC Corp
Priority to JP9895879A priority Critical patent/JPS5622974A/en
Publication of JPS5622974A publication Critical patent/JPS5622974A/en
Pending legal-status Critical Current

Links

Abstract

PURPOSE: To realize an automatic measurement for the integrated circuit having the hysteresis property, by applying the inclined voltage which increases and decreases by the time to the circuit and then obtaining the property via the arithmetic circuit and with the value by which the output voltage crosses the prescribed voltage each.
CONSTITUTION: Voltage generator 5 applies the step voltage to the positive direction from initial value voltage VP set previously at voltage setting part 6 and then applies successively to the input of device DUT7 to be measured. The output of DUT7 is compared with prescribed value V0 through comparator 8, and voltage value V11 of generator 5 and when crossing value V0 is stored in the 1st memory circuit 9. Then the step polarity is turned negative to be applied successively to the input of DUT7. And in the same way, voltage value V12 of generator 5 and when crossing value V0 is stored in the 2nd memory circuit 10. After this, the value is measured at measuring part 12 for V11 and V12 each, and at the same time the difference (V11-V12) is obtained via arithmetic part 11. In such way, an automatic measurement becomes possible.
COPYRIGHT: (C)1981,JPO&Japio
JP9895879A 1979-08-02 1979-08-02 Test method for integrated circuit Pending JPS5622974A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP9895879A JPS5622974A (en) 1979-08-02 1979-08-02 Test method for integrated circuit

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP9895879A JPS5622974A (en) 1979-08-02 1979-08-02 Test method for integrated circuit

Publications (1)

Publication Number Publication Date
JPS5622974A true JPS5622974A (en) 1981-03-04

Family

ID=14233582

Family Applications (1)

Application Number Title Priority Date Filing Date
JP9895879A Pending JPS5622974A (en) 1979-08-02 1979-08-02 Test method for integrated circuit

Country Status (1)

Country Link
JP (1) JPS5622974A (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7035749B2 (en) 2001-11-26 2006-04-25 Koninklijke Philips Electronics, N.V. Test machine for testing an integrated circuit with a comparator

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7035749B2 (en) 2001-11-26 2006-04-25 Koninklijke Philips Electronics, N.V. Test machine for testing an integrated circuit with a comparator

Similar Documents

Publication Publication Date Title
KR950009271A (en) Capacitance Measurement Device
MY105336A (en) Method and system for concurrent electronic component testing and lead verification
ATE16423T1 (en) METHOD AND CIRCUIT FOR MEASURING THE STATE OF CHARGE OF AN ELECTROCHEMICAL GENERATOR DURING OPERATION.
JPS54147881A (en) Standing wave ratio indicator
JPS5585264A (en) Function test evaluation device for integrated circuit
JPS5622974A (en) Test method for integrated circuit
JPS53116412A (en) Checker for semiconductor regulator
JPS5320323A (en) Exposure meter
US3735261A (en) Pulse analyzer
JPS54118520A (en) Device for measuring transformation ratio of transformer for dc measuring instrument
JPS6416978A (en) Testing device for watthour meter
JPS5684570A (en) Testing device for ic
JPS59231459A (en) Testing apparatus
JPS54102987A (en) Test device
JPS55113968A (en) Method of testing integrated circuit
JPS5681455A (en) Generating device for testing voltage
SU387231A1 (en) METHOD FOR DETERMINING EFFORTS
JPS5683045A (en) Wafer probe
SU1083121A1 (en) Combined meter of single pulse amplitude
JPS55125409A (en) Audio output type measuring apparatus
JPS5572218A (en) Programmable current power supply
JPS54153685A (en) High frequency heating device
JPS5587964A (en) Apparatus for testing solid state image sensor
JPS5719679A (en) Measuring circuit for encoder characteristics
GB2011095A (en) Method of temperature measurement